Electromigration Mechanism of Indium-44Tin-6Zinc Alloy

In-Sn alloys have great potential in high-power semiconductor packaging, but their applications are constrained by electromigration. The electromigration mechanism of a In-44Sn-6Zn alloy was studied with the current density at a direct current of 1.0 × 10 3 A/cm 2 . The results indicated that the al...

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Veröffentlicht in:	Journal of electronic materials 2019-10, Vol.48 (10), p.6849-6856
Hauptverfasser:	Wang, Jingze, Mao, Dongxin, Meng, Guizhi, Shi, Lei, Chen, Hongtao, Xia, Ruihan, Li, Manning
Format:	Artikel
Sprache:	eng
Schlagworte:	Alloys Anodes Beta phase Cathodes Characterization and Evaluation of Materials Chemical precipitation Chemistry and Materials Science Direct current Electromigration Electronics and Microelectronics Gamma phase Indium Instrumentation Materials Science Microhardness Optical and Electronic Materials Phase separation Solid solutions Solid State Physics Spinodal decomposition Tin Tin base alloys Transformations Unit cell Wind forces Zinc
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