Comparing the atomic structures of binary MO2-SiO2(M=Ti, Zr or Hf) xerogels

The incorporation of transition-metal oxides into silica can give materials with useful optical, electronic or catalytic properties. For example, ZrO2-SiO2 and HfO2-SiO2 materials are of interest due to their high dielectric constants. Here we present a comparison of extended X-ray absorption fine s...

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Veröffentlicht in:Journal of sol-gel science and technology 2003, Vol.26 (1-3), p.161-164
Hauptverfasser: MOUNTJOY, G, HOLLAND, M. A, GUNAWIDJAJA, P, WALLIDGE, G. W, PICKUP, D. M, NEWPORT, R. J, SMITH, M. E
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container_end_page 164
container_issue 1-3
container_start_page 161
container_title Journal of sol-gel science and technology
container_volume 26
creator MOUNTJOY, G
HOLLAND, M. A
GUNAWIDJAJA, P
WALLIDGE, G. W
PICKUP, D. M
NEWPORT, R. J
SMITH, M. E
description The incorporation of transition-metal oxides into silica can give materials with useful optical, electronic or catalytic properties. For example, ZrO2-SiO2 and HfO2-SiO2 materials are of interest due to their high dielectric constants. Here we present a comparison of extended X-ray absorption fine structure and small-angle X-ray scattering results for acid-catalysed binary (MO2)x(SiO2)1 − x (M = Ti, Zr or Hf) xerogels, with x up to 0.4 and heat treatments up to 750°C. Detailed observations for TiO2-SiO2 and ZrO2-SiO2 xerogels provide a basis for interpretation of new results for HfO2-SiO2 xerogels. At low concentrations metal atoms are homogeneously incorporated into the silica network. Ti adopts coordinations of 4 or 6, and Zr and Hf both adopt higher coordination of 6 or 7 (the larger coordinations being due to ambient moisture). At higher concentrations, phase separation of metal oxide occurs. Such regions become clearly separated from the silica network for TiO2, but remain very finely mixed with silica network for ZrO2 and HfO2.
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fullrecord <record><control><sourceid>proquest_pasca</sourceid><recordid>TN_cdi_proquest_journals_2259582472</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2259582472</sourcerecordid><originalsourceid>FETCH-LOGICAL-c257t-6d30e690b90a7a45a5dcd4c3fc0c68636ecf9340a075736ce8972342dd5ab9cd3</originalsourceid><addsrcrecordid>eNotj81LwzAYh4MoWKdnrwERFKy--W6EHcZQJ27s4Lx4KWmazoytmUkL-t9bcKfn8vvgQeiSwD0Byh4mjwNAKc4IEE6PUEaEYjkvuDxGGWha5KBAnaKzlDYAIDhRGXqbht3eRN-ucfflsOnCzlucutjbro8u4dDgyrcm_uLFkubvfklvFuOVv8OfEYeIZ80t_nExrN02naOTxmyTuzhwhD6en1bTWT5fvrxOJ_PcUqG6XNYMnNRQaTDKcGFEbWtuWWPBykIy6WyjGQcDahCQ1hVaUcZpXQtTaVuzEbr6393H8N271JWb0Md2uCwpFVoUlA-FEbo-pEyyZttE01qfyn30u8GmJFzwAoCzP15XWd0</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2259582472</pqid></control><display><type>article</type><title>Comparing the atomic structures of binary MO2-SiO2(M=Ti, Zr or Hf) xerogels</title><source>SpringerLink Journals</source><creator>MOUNTJOY, G ; HOLLAND, M. A ; GUNAWIDJAJA, P ; WALLIDGE, G. W ; PICKUP, D. M ; NEWPORT, R. J ; SMITH, M. E</creator><creatorcontrib>MOUNTJOY, G ; HOLLAND, M. A ; GUNAWIDJAJA, P ; WALLIDGE, G. W ; PICKUP, D. M ; NEWPORT, R. J ; SMITH, M. E</creatorcontrib><description>The incorporation of transition-metal oxides into silica can give materials with useful optical, electronic or catalytic properties. For example, ZrO2-SiO2 and HfO2-SiO2 materials are of interest due to their high dielectric constants. Here we present a comparison of extended X-ray absorption fine structure and small-angle X-ray scattering results for acid-catalysed binary (MO2)x(SiO2)1 − x (M = Ti, Zr or Hf) xerogels, with x up to 0.4 and heat treatments up to 750°C. Detailed observations for TiO2-SiO2 and ZrO2-SiO2 xerogels provide a basis for interpretation of new results for HfO2-SiO2 xerogels. At low concentrations metal atoms are homogeneously incorporated into the silica network. Ti adopts coordinations of 4 or 6, and Zr and Hf both adopt higher coordination of 6 or 7 (the larger coordinations being due to ambient moisture). At higher concentrations, phase separation of metal oxide occurs. Such regions become clearly separated from the silica network for TiO2, but remain very finely mixed with silica network for ZrO2 and HfO2.</description><identifier>ISSN: 0928-0707</identifier><identifier>EISSN: 1573-4846</identifier><identifier>DOI: 10.1023/A:1020774310142</identifier><language>eng</language><publisher>Heidelberg: Springer</publisher><subject>Catalysis ; Chemistry ; Colloidal gels. Colloidal sols ; Colloidal state and disperse state ; Exact sciences and technology ; Fine structure ; General and physical chemistry ; Hafnium oxide ; Low concentrations ; Optical properties ; Phase separation ; Silicon dioxide ; Small angle X ray scattering ; Titanium ; Titanium dioxide ; Transition metal oxides ; Transition metals ; X ray absorption ; Xerogels ; Zirconium dioxide</subject><ispartof>Journal of sol-gel science and technology, 2003, Vol.26 (1-3), p.161-164</ispartof><rights>2003 INIST-CNRS</rights><rights>Journal of Sol-Gel Science and Technology is a copyright of Springer, (2003). All Rights Reserved.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c257t-6d30e690b90a7a45a5dcd4c3fc0c68636ecf9340a075736ce8972342dd5ab9cd3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,310,314,776,780,785,786,4036,4037,23909,23910,25118,27901,27902</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=14548004$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>MOUNTJOY, G</creatorcontrib><creatorcontrib>HOLLAND, M. A</creatorcontrib><creatorcontrib>GUNAWIDJAJA, P</creatorcontrib><creatorcontrib>WALLIDGE, G. W</creatorcontrib><creatorcontrib>PICKUP, D. M</creatorcontrib><creatorcontrib>NEWPORT, R. J</creatorcontrib><creatorcontrib>SMITH, M. E</creatorcontrib><title>Comparing the atomic structures of binary MO2-SiO2(M=Ti, Zr or Hf) xerogels</title><title>Journal of sol-gel science and technology</title><description>The incorporation of transition-metal oxides into silica can give materials with useful optical, electronic or catalytic properties. For example, ZrO2-SiO2 and HfO2-SiO2 materials are of interest due to their high dielectric constants. Here we present a comparison of extended X-ray absorption fine structure and small-angle X-ray scattering results for acid-catalysed binary (MO2)x(SiO2)1 − x (M = Ti, Zr or Hf) xerogels, with x up to 0.4 and heat treatments up to 750°C. Detailed observations for TiO2-SiO2 and ZrO2-SiO2 xerogels provide a basis for interpretation of new results for HfO2-SiO2 xerogels. At low concentrations metal atoms are homogeneously incorporated into the silica network. Ti adopts coordinations of 4 or 6, and Zr and Hf both adopt higher coordination of 6 or 7 (the larger coordinations being due to ambient moisture). At higher concentrations, phase separation of metal oxide occurs. Such regions become clearly separated from the silica network for TiO2, but remain very finely mixed with silica network for ZrO2 and HfO2.</description><subject>Catalysis</subject><subject>Chemistry</subject><subject>Colloidal gels. Colloidal sols</subject><subject>Colloidal state and disperse state</subject><subject>Exact sciences and technology</subject><subject>Fine structure</subject><subject>General and physical chemistry</subject><subject>Hafnium oxide</subject><subject>Low concentrations</subject><subject>Optical properties</subject><subject>Phase separation</subject><subject>Silicon dioxide</subject><subject>Small angle X ray scattering</subject><subject>Titanium</subject><subject>Titanium dioxide</subject><subject>Transition metal oxides</subject><subject>Transition metals</subject><subject>X ray absorption</subject><subject>Xerogels</subject><subject>Zirconium dioxide</subject><issn>0928-0707</issn><issn>1573-4846</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><sourceid>BENPR</sourceid><recordid>eNotj81LwzAYh4MoWKdnrwERFKy--W6EHcZQJ27s4Lx4KWmazoytmUkL-t9bcKfn8vvgQeiSwD0Byh4mjwNAKc4IEE6PUEaEYjkvuDxGGWha5KBAnaKzlDYAIDhRGXqbht3eRN-ucfflsOnCzlucutjbro8u4dDgyrcm_uLFkubvfklvFuOVv8OfEYeIZ80t_nExrN02naOTxmyTuzhwhD6en1bTWT5fvrxOJ_PcUqG6XNYMnNRQaTDKcGFEbWtuWWPBykIy6WyjGQcDahCQ1hVaUcZpXQtTaVuzEbr6393H8N271JWb0Md2uCwpFVoUlA-FEbo-pEyyZttE01qfyn30u8GmJFzwAoCzP15XWd0</recordid><startdate>2003</startdate><enddate>2003</enddate><creator>MOUNTJOY, G</creator><creator>HOLLAND, M. A</creator><creator>GUNAWIDJAJA, P</creator><creator>WALLIDGE, G. W</creator><creator>PICKUP, D. M</creator><creator>NEWPORT, R. J</creator><creator>SMITH, M. E</creator><general>Springer</general><general>Springer Nature B.V</general><scope>IQODW</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>L6V</scope><scope>M7S</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope></search><sort><creationdate>2003</creationdate><title>Comparing the atomic structures of binary MO2-SiO2(M=Ti, Zr or Hf) xerogels</title><author>MOUNTJOY, G ; HOLLAND, M. A ; GUNAWIDJAJA, P ; WALLIDGE, G. W ; PICKUP, D. M ; NEWPORT, R. J ; SMITH, M. E</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c257t-6d30e690b90a7a45a5dcd4c3fc0c68636ecf9340a075736ce8972342dd5ab9cd3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2003</creationdate><topic>Catalysis</topic><topic>Chemistry</topic><topic>Colloidal gels. Colloidal sols</topic><topic>Colloidal state and disperse state</topic><topic>Exact sciences and technology</topic><topic>Fine structure</topic><topic>General and physical chemistry</topic><topic>Hafnium oxide</topic><topic>Low concentrations</topic><topic>Optical properties</topic><topic>Phase separation</topic><topic>Silicon dioxide</topic><topic>Small angle X ray scattering</topic><topic>Titanium</topic><topic>Titanium dioxide</topic><topic>Transition metal oxides</topic><topic>Transition metals</topic><topic>X ray absorption</topic><topic>Xerogels</topic><topic>Zirconium dioxide</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>MOUNTJOY, G</creatorcontrib><creatorcontrib>HOLLAND, M. A</creatorcontrib><creatorcontrib>GUNAWIDJAJA, P</creatorcontrib><creatorcontrib>WALLIDGE, G. W</creatorcontrib><creatorcontrib>PICKUP, D. M</creatorcontrib><creatorcontrib>NEWPORT, R. J</creatorcontrib><creatorcontrib>SMITH, M. E</creatorcontrib><collection>Pascal-Francis</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>SciTech Premium Collection</collection><collection>Materials Science Database</collection><collection>ProQuest Engineering Collection</collection><collection>Engineering Database</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><jtitle>Journal of sol-gel science and technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>MOUNTJOY, G</au><au>HOLLAND, M. A</au><au>GUNAWIDJAJA, P</au><au>WALLIDGE, G. W</au><au>PICKUP, D. M</au><au>NEWPORT, R. J</au><au>SMITH, M. E</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Comparing the atomic structures of binary MO2-SiO2(M=Ti, Zr or Hf) xerogels</atitle><jtitle>Journal of sol-gel science and technology</jtitle><date>2003</date><risdate>2003</risdate><volume>26</volume><issue>1-3</issue><spage>161</spage><epage>164</epage><pages>161-164</pages><issn>0928-0707</issn><eissn>1573-4846</eissn><abstract>The incorporation of transition-metal oxides into silica can give materials with useful optical, electronic or catalytic properties. For example, ZrO2-SiO2 and HfO2-SiO2 materials are of interest due to their high dielectric constants. Here we present a comparison of extended X-ray absorption fine structure and small-angle X-ray scattering results for acid-catalysed binary (MO2)x(SiO2)1 − x (M = Ti, Zr or Hf) xerogels, with x up to 0.4 and heat treatments up to 750°C. Detailed observations for TiO2-SiO2 and ZrO2-SiO2 xerogels provide a basis for interpretation of new results for HfO2-SiO2 xerogels. At low concentrations metal atoms are homogeneously incorporated into the silica network. Ti adopts coordinations of 4 or 6, and Zr and Hf both adopt higher coordination of 6 or 7 (the larger coordinations being due to ambient moisture). At higher concentrations, phase separation of metal oxide occurs. Such regions become clearly separated from the silica network for TiO2, but remain very finely mixed with silica network for ZrO2 and HfO2.</abstract><cop>Heidelberg</cop><pub>Springer</pub><doi>10.1023/A:1020774310142</doi><tpages>4</tpages></addata></record>
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subjects Catalysis
Chemistry
Colloidal gels. Colloidal sols
Colloidal state and disperse state
Exact sciences and technology
Fine structure
General and physical chemistry
Hafnium oxide
Low concentrations
Optical properties
Phase separation
Silicon dioxide
Small angle X ray scattering
Titanium
Titanium dioxide
Transition metal oxides
Transition metals
X ray absorption
Xerogels
Zirconium dioxide
title Comparing the atomic structures of binary MO2-SiO2(M=Ti, Zr or Hf) xerogels
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-29T05%3A06%3A05IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_pasca&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Comparing%20the%20atomic%20structures%20of%20binary%20MO2-SiO2(M=Ti,%20Zr%20or%20Hf)%20xerogels&rft.jtitle=Journal%20of%20sol-gel%20science%20and%20technology&rft.au=MOUNTJOY,%20G&rft.date=2003&rft.volume=26&rft.issue=1-3&rft.spage=161&rft.epage=164&rft.pages=161-164&rft.issn=0928-0707&rft.eissn=1573-4846&rft_id=info:doi/10.1023/A:1020774310142&rft_dat=%3Cproquest_pasca%3E2259582472%3C/proquest_pasca%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2259582472&rft_id=info:pmid/&rfr_iscdi=true