Kinetics of small molecule adsorption studied using precision ellipsometry
On the basis of a miniature polarisation modulator, a precision ellipsometry system has been made, enabling real‐time measurement of subnanometre thin layers on reflecting substrates. This system monitored the kinetics of adsorption and desorption of propanol, or ethanol, or methanol on oxidised Si...
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| Veröffentlicht in: | Surface and interface analysis 2019-07, Vol.51 (7), p.697-702 |
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| container_title | Surface and interface analysis |
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| creator | Yakovlev, Nikolai L. Quek, Hou Chin Dąbrowski, Karol M. Birch, William R. |
| description | On the basis of a miniature polarisation modulator, a precision ellipsometry system has been made, enabling real‐time measurement of subnanometre thin layers on reflecting substrates. This system monitored the kinetics of adsorption and desorption of propanol, or ethanol, or methanol on oxidised Si substrates. While adsorption of propanol and ethanol increased the thickness, adsorption of methanol showed surprising kinetics: the thickness first increased, then decreased. To explain this, a model of substitutional (or competitive) adsorption has been used, where the target molecule is adsorbed only when it substitutes another one leaving an adsorption site. The model fits the experimental data quantitatively and can predict processes involving several components on solid surfaces. Precision ellipsometry demonstrated its high analytical potential in investigation of surfaces at molecular level. |
| doi_str_mv | 10.1002/sia.6637 |
| format | Article |
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Precision ellipsometry demonstrated its high analytical potential in investigation of surfaces at molecular level.</description><subject>Adsorption</subject><subject>Ellipsometry</subject><subject>Ethanol</subject><subject>Methanol</subject><subject>Silicon substrates</subject><subject>Solid surfaces</subject><subject>Surface chemistry</subject><subject>Thickness</subject><subject>Thin films</subject><issn>0142-2421</issn><issn>1096-9918</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNotkEtLAzEUhYMoWKvgTwi4cTP15jHJzFKK1kfBja6HmIekZCZj7syi_96Wujpw-DgHPkJuGawYAH_AaFZKCX1GFgxaVbUta87JApjkFZecXZIrxB0ANKJRC_L2Hgc_RYs0B4q9SYn2OXk7J0-Nw1zGKeaB4jS76B2dMQ4_dCzeRjz2PqU4Yu79VPbX5CKYhP7mP5fk6_npc_1SbT82r-vHbWV5y6dKKBCsbYSXwYFm7FsaGQIwG3RjuVJOcy-cEzVoWWtlQHpteMMdc7UPtRJLcnfaHUv-nT1O3S7PZThcdpyLtlZKSzhQ9yfKloxYfOjGEntT9h2D7miqO5jqjqbEH_zfW7c</recordid><startdate>20190701</startdate><enddate>20190701</enddate><creator>Yakovlev, Nikolai L.</creator><creator>Quek, Hou Chin</creator><creator>Dąbrowski, Karol M.</creator><creator>Birch, William R.</creator><general>Wiley Subscription Services, Inc</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0001-8150-9033</orcidid><orcidid>https://orcid.org/0000-0002-5611-9604</orcidid><orcidid>https://orcid.org/0000-0002-6130-9912</orcidid></search><sort><creationdate>20190701</creationdate><title>Kinetics of small molecule adsorption studied using precision ellipsometry</title><author>Yakovlev, Nikolai L. ; Quek, Hou Chin ; Dąbrowski, Karol M. ; Birch, William R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c292t-36031983e4fd0711b4a4ff01cf78c266d72e3dd35074576a04e7a282d1d5ef563</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Adsorption</topic><topic>Ellipsometry</topic><topic>Ethanol</topic><topic>Methanol</topic><topic>Silicon substrates</topic><topic>Solid surfaces</topic><topic>Surface chemistry</topic><topic>Thickness</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yakovlev, Nikolai L.</creatorcontrib><creatorcontrib>Quek, Hou Chin</creatorcontrib><creatorcontrib>Dąbrowski, Karol M.</creatorcontrib><creatorcontrib>Birch, William R.</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Surface and interface analysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yakovlev, Nikolai L.</au><au>Quek, Hou Chin</au><au>Dąbrowski, Karol M.</au><au>Birch, William R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Kinetics of small molecule adsorption studied using precision ellipsometry</atitle><jtitle>Surface and interface analysis</jtitle><date>2019-07-01</date><risdate>2019</risdate><volume>51</volume><issue>7</issue><spage>697</spage><epage>702</epage><pages>697-702</pages><issn>0142-2421</issn><eissn>1096-9918</eissn><abstract>On the basis of a miniature polarisation modulator, a precision ellipsometry system has been made, enabling real‐time measurement of subnanometre thin layers on reflecting substrates. 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| ispartof | Surface and interface analysis, 2019-07, Vol.51 (7), p.697-702 |
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| language | eng |
| recordid | cdi_proquest_journals_2239566740 |
| source | Wiley-Blackwell Journals |
| subjects | Adsorption Ellipsometry Ethanol Methanol Silicon substrates Solid surfaces Surface chemistry Thickness Thin films |
| title | Kinetics of small molecule adsorption studied using precision ellipsometry |
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