[Formula Omitted]-Band Complex Permittivity Measurements at High Temperature Using Free-Space Methods

Free-space measurement techniques can be contactless and are able to accommodate large, flat sheets of dielectric material, making them useful for characterization of high-temperature, millimeter-wave, window and radome candidate materials. As part of the present work, a high-temperature, W-band (75...

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Veröffentlicht in:	IEEE transactions on components, packaging, and manufacturing technology (2011) packaging, and manufacturing technology (2011), 2019-01, Vol.9 (6), p.1011
Hauptverfasser:	Hilario, Martin S, Hoff, Brad W, Benmaan Jawdat, Lanagan, Michael T, Cohick, Zane W, Dynys, Frederick W, Mackey, Jonathan A, Gaone, Joseph M
Format:	Artikel
Sprache:	eng
Schlagworte:	Alumina Aluminum oxide Boron nitride Complex permittivity Dielectric properties High temperature Materials selection Measurement methods Measurement techniques Millimeter waves Polyvinyl chloride Radomes Silicon nitride Silicon substrates Zirconium oxides
Online-Zugang:	Volltext
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