Inspection of Mura Image Quality by Using Frequency Analysis for Electronic Displays

A novel image quality inspection method that detects low contrast “mura” (non-uniform regions) has been developed by analyzing the Fourier spectrum of the images. The inspection images are transformed to Fourier frequency space, and the power spectrum is filtered using CSF(Contrast Sensitivity Funct...

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Veröffentlicht in:	Journal of the Japan Society for Precision Engineering 2017/03/05, Vol.83(3), pp.258-262
Hauptverfasser:	ISHIGURO, Kazuyuki, ASANO, Toshio, KONDOH, Takahiro, LIU, Wei
Format:	Artikel
Sprache:	eng ; jpn
Schlagworte:	CSF display Fourier spectrum Frequency analysis Histograms Image contrast Image detection Image quality Inspection mura Sensitivity
Online-Zugang:	Volltext
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