PEEM and Micro-UPS Studies of Cleaved and Exfoliated Molybdenum Disulfide Surfaces
Thin films of molybdenum disulfide (MoS2) are generally exfoliated from a mineral crystal. Impurities and contaminants of mineral origin may spoil the expected functions of MoS2 thin- film devices because they have a strong influence on the properties of the exfoliated films. The effects of surface...
Gespeichert in:
| Veröffentlicht in: | E-journal of surface science and nanotechnology 2017/11/11, Vol.15, pp.115-120 |
|---|---|
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 120 |
|---|---|
| container_issue | |
| container_start_page | 115 |
| container_title | E-journal of surface science and nanotechnology |
| container_volume | 15 |
| creator | Kadowaki, Ryo Sano, Naoki Abukawa, Tadashi |
| description | Thin films of molybdenum disulfide (MoS2) are generally exfoliated from a mineral crystal. Impurities and contaminants of mineral origin may spoil the expected functions of MoS2 thin- film devices because they have a strong influence on the properties of the exfoliated films. The effects of surface contaminants on cleaved or exfoliated MoS2 surfaces were investigated using photoemission electron microscopy and selected-area ultraviolet photoelectron spectroscopy under several exfoliation conditions. The chemical composition and crystallinity of surfaces were also investigated using Auger electron spectroscopy and electron diffraction. The bulk crystal included a limited number of contaminated interfaces, at which the crystal was easily cleaved. Therefore, repeated exfoliations are required to expose a clean surface for exfoliated films. Annealing at ca. 400°C in a vacuum was effective to reduce contamination of the cleaved MoS2 surface. [DOI: 10.1380/ejssnt.2017.115] |
| doi_str_mv | 10.1380/ejssnt.2017.115 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2231816111</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2231816111</sourcerecordid><originalsourceid>FETCH-LOGICAL-c4495-d98c5c08aa5f26111ee2dcb3f3318e976942915dd639a403d2e84d0a038067bb3</originalsourceid><addsrcrecordid>eNpNkEtPwzAQhC0EEqVw5hqJc1pvnOcNVMJDakVF6dly7DUkShOwE0T_PQ6Biovtlb-Z1Qwhl0BnwFI6x8rappsFFJIZQHREJsDC1Kcsg-N_71NyZm1FKUtYEk_I8zrPV55olLcqpWn97XrjbbpelWi9VnuLGsUnqh8g_9JtXYrOjau23hcKm37n3Za2r3Wp0Nv0RguJ9pycaFFbvPi9p2R7l78sHvzl0_3j4mbpyzDMIl9lqYwkTYWIdBADAGKgZME0Y5BilsRZGGQQKRWzTISUqQDTUFFBXdg4KQo2JVej77tpP3q0Ha_a3jRuJQ8C5wGDqaPmI-XSWWtQ83dT7oTZc6B8KI6PxfGhOO6Kc4rrUVHZTrzigRemK2WNfzxEnA6Hkxy-5JswHBv2DdkDeEU</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2231816111</pqid></control><display><type>article</type><title>PEEM and Micro-UPS Studies of Cleaved and Exfoliated Molybdenum Disulfide Surfaces</title><source>J-STAGE Free</source><source>DOAJ Directory of Open Access Journals</source><source>EZB-FREE-00999 freely available EZB journals</source><source>Free Full-Text Journals in Chemistry</source><creator>Kadowaki, Ryo ; Sano, Naoki ; Abukawa, Tadashi</creator><creatorcontrib>Kadowaki, Ryo ; Sano, Naoki ; Abukawa, Tadashi</creatorcontrib><description>Thin films of molybdenum disulfide (MoS2) are generally exfoliated from a mineral crystal. Impurities and contaminants of mineral origin may spoil the expected functions of MoS2 thin- film devices because they have a strong influence on the properties of the exfoliated films. The effects of surface contaminants on cleaved or exfoliated MoS2 surfaces were investigated using photoemission electron microscopy and selected-area ultraviolet photoelectron spectroscopy under several exfoliation conditions. The chemical composition and crystallinity of surfaces were also investigated using Auger electron spectroscopy and electron diffraction. The bulk crystal included a limited number of contaminated interfaces, at which the crystal was easily cleaved. Therefore, repeated exfoliations are required to expose a clean surface for exfoliated films. Annealing at ca. 400°C in a vacuum was effective to reduce contamination of the cleaved MoS2 surface. [DOI: 10.1380/ejssnt.2017.115]</description><identifier>ISSN: 1348-0391</identifier><identifier>EISSN: 1348-0391</identifier><identifier>DOI: 10.1380/ejssnt.2017.115</identifier><language>eng</language><publisher>Tokyo: The Japan Society of Vacuum and Surface Science</publisher><subject>Chemical composition ; Contaminants ; Crystals ; Electron diffraction ; Electrons ; Exfoliation ; Layered materials ; Molybdenum ; Molybdenum disulfide ; Organic chemistry ; Photoelectric emission ; Photoelectrons ; Photoemission ; Photoemission electron microscopy (PEEM) ; Spectrum analysis ; Thin films ; Work function</subject><ispartof>e-Journal of Surface Science and Nanotechnology, 2017/11/11, Vol.15, pp.115-120</ispartof><rights>2017 The Surface Science Society of Japan</rights><rights>Copyright Japan Science and Technology Agency 2017</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4495-d98c5c08aa5f26111ee2dcb3f3318e976942915dd639a403d2e84d0a038067bb3</citedby><cites>FETCH-LOGICAL-c4495-d98c5c08aa5f26111ee2dcb3f3318e976942915dd639a403d2e84d0a038067bb3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,860,1877,27901,27902</link.rule.ids></links><search><creatorcontrib>Kadowaki, Ryo</creatorcontrib><creatorcontrib>Sano, Naoki</creatorcontrib><creatorcontrib>Abukawa, Tadashi</creatorcontrib><title>PEEM and Micro-UPS Studies of Cleaved and Exfoliated Molybdenum Disulfide Surfaces</title><title>E-journal of surface science and nanotechnology</title><addtitle>e-J. Surf. Sci. Nanotechnol.</addtitle><description>Thin films of molybdenum disulfide (MoS2) are generally exfoliated from a mineral crystal. Impurities and contaminants of mineral origin may spoil the expected functions of MoS2 thin- film devices because they have a strong influence on the properties of the exfoliated films. The effects of surface contaminants on cleaved or exfoliated MoS2 surfaces were investigated using photoemission electron microscopy and selected-area ultraviolet photoelectron spectroscopy under several exfoliation conditions. The chemical composition and crystallinity of surfaces were also investigated using Auger electron spectroscopy and electron diffraction. The bulk crystal included a limited number of contaminated interfaces, at which the crystal was easily cleaved. Therefore, repeated exfoliations are required to expose a clean surface for exfoliated films. Annealing at ca. 400°C in a vacuum was effective to reduce contamination of the cleaved MoS2 surface. [DOI: 10.1380/ejssnt.2017.115]</description><subject>Chemical composition</subject><subject>Contaminants</subject><subject>Crystals</subject><subject>Electron diffraction</subject><subject>Electrons</subject><subject>Exfoliation</subject><subject>Layered materials</subject><subject>Molybdenum</subject><subject>Molybdenum disulfide</subject><subject>Organic chemistry</subject><subject>Photoelectric emission</subject><subject>Photoelectrons</subject><subject>Photoemission</subject><subject>Photoemission electron microscopy (PEEM)</subject><subject>Spectrum analysis</subject><subject>Thin films</subject><subject>Work function</subject><issn>1348-0391</issn><issn>1348-0391</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><recordid>eNpNkEtPwzAQhC0EEqVw5hqJc1pvnOcNVMJDakVF6dly7DUkShOwE0T_PQ6Biovtlb-Z1Qwhl0BnwFI6x8rappsFFJIZQHREJsDC1Kcsg-N_71NyZm1FKUtYEk_I8zrPV55olLcqpWn97XrjbbpelWi9VnuLGsUnqh8g_9JtXYrOjau23hcKm37n3Za2r3Wp0Nv0RguJ9pycaFFbvPi9p2R7l78sHvzl0_3j4mbpyzDMIl9lqYwkTYWIdBADAGKgZME0Y5BilsRZGGQQKRWzTISUqQDTUFFBXdg4KQo2JVej77tpP3q0Ha_a3jRuJQ8C5wGDqaPmI-XSWWtQ83dT7oTZc6B8KI6PxfGhOO6Kc4rrUVHZTrzigRemK2WNfzxEnA6Hkxy-5JswHBv2DdkDeEU</recordid><startdate>20170101</startdate><enddate>20170101</enddate><creator>Kadowaki, Ryo</creator><creator>Sano, Naoki</creator><creator>Abukawa, Tadashi</creator><general>The Japan Society of Vacuum and Surface Science</general><general>Japan Science and Technology Agency</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20170101</creationdate><title>PEEM and Micro-UPS Studies of Cleaved and Exfoliated Molybdenum Disulfide Surfaces</title><author>Kadowaki, Ryo ; Sano, Naoki ; Abukawa, Tadashi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4495-d98c5c08aa5f26111ee2dcb3f3318e976942915dd639a403d2e84d0a038067bb3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Chemical composition</topic><topic>Contaminants</topic><topic>Crystals</topic><topic>Electron diffraction</topic><topic>Electrons</topic><topic>Exfoliation</topic><topic>Layered materials</topic><topic>Molybdenum</topic><topic>Molybdenum disulfide</topic><topic>Organic chemistry</topic><topic>Photoelectric emission</topic><topic>Photoelectrons</topic><topic>Photoemission</topic><topic>Photoemission electron microscopy (PEEM)</topic><topic>Spectrum analysis</topic><topic>Thin films</topic><topic>Work function</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kadowaki, Ryo</creatorcontrib><creatorcontrib>Sano, Naoki</creatorcontrib><creatorcontrib>Abukawa, Tadashi</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>E-journal of surface science and nanotechnology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kadowaki, Ryo</au><au>Sano, Naoki</au><au>Abukawa, Tadashi</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>PEEM and Micro-UPS Studies of Cleaved and Exfoliated Molybdenum Disulfide Surfaces</atitle><jtitle>E-journal of surface science and nanotechnology</jtitle><addtitle>e-J. Surf. Sci. Nanotechnol.</addtitle><date>2017-01-01</date><risdate>2017</risdate><volume>15</volume><spage>115</spage><epage>120</epage><pages>115-120</pages><issn>1348-0391</issn><eissn>1348-0391</eissn><abstract>Thin films of molybdenum disulfide (MoS2) are generally exfoliated from a mineral crystal. Impurities and contaminants of mineral origin may spoil the expected functions of MoS2 thin- film devices because they have a strong influence on the properties of the exfoliated films. The effects of surface contaminants on cleaved or exfoliated MoS2 surfaces were investigated using photoemission electron microscopy and selected-area ultraviolet photoelectron spectroscopy under several exfoliation conditions. The chemical composition and crystallinity of surfaces were also investigated using Auger electron spectroscopy and electron diffraction. The bulk crystal included a limited number of contaminated interfaces, at which the crystal was easily cleaved. Therefore, repeated exfoliations are required to expose a clean surface for exfoliated films. Annealing at ca. 400°C in a vacuum was effective to reduce contamination of the cleaved MoS2 surface. [DOI: 10.1380/ejssnt.2017.115]</abstract><cop>Tokyo</cop><pub>The Japan Society of Vacuum and Surface Science</pub><doi>10.1380/ejssnt.2017.115</doi><tpages>6</tpages><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 1348-0391 |
| ispartof | e-Journal of Surface Science and Nanotechnology, 2017/11/11, Vol.15, pp.115-120 |
| issn | 1348-0391 1348-0391 |
| language | eng |
| recordid | cdi_proquest_journals_2231816111 |
| source | J-STAGE Free; DOAJ Directory of Open Access Journals; EZB-FREE-00999 freely available EZB journals; Free Full-Text Journals in Chemistry |
| subjects | Chemical composition Contaminants Crystals Electron diffraction Electrons Exfoliation Layered materials Molybdenum Molybdenum disulfide Organic chemistry Photoelectric emission Photoelectrons Photoemission Photoemission electron microscopy (PEEM) Spectrum analysis Thin films Work function |
| title | PEEM and Micro-UPS Studies of Cleaved and Exfoliated Molybdenum Disulfide Surfaces |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-04T21%3A34%3A05IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=PEEM%20and%20Micro-UPS%20Studies%20of%20Cleaved%20and%20Exfoliated%20Molybdenum%20Disulfide%20Surfaces&rft.jtitle=E-journal%20of%20surface%20science%20and%20nanotechnology&rft.au=Kadowaki,%20Ryo&rft.date=2017-01-01&rft.volume=15&rft.spage=115&rft.epage=120&rft.pages=115-120&rft.issn=1348-0391&rft.eissn=1348-0391&rft_id=info:doi/10.1380/ejssnt.2017.115&rft_dat=%3Cproquest_cross%3E2231816111%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2231816111&rft_id=info:pmid/&rfr_iscdi=true |