Phase Transformation in Se75Te13In12 Chalcogenide Thin Films
In the present research work Se 75 Te 13 In 12 chalcogenide glass has been prepared by melt quenching technique. The non-isothermal Differential Scanning Calorimetry (DSC) measurement of synthesized alloy has been executed at constant heating rate of 25 K/min. The glass transition temperature ( T g...
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| Veröffentlicht in: | Glass physics and chemistry 2019-03, Vol.45 (2), p.111-118 |
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| container_title | Glass physics and chemistry |
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| creator | Srivastava, A. Tiwari, S. N. Lal, J. K. Khan, Shamshad A. |
| description | In the present research work Se
75
Te
13
In
12
chalcogenide glass has been prepared by melt quenching technique. The non-isothermal Differential Scanning Calorimetry (DSC) measurement of synthesized alloy has been executed at constant heating rate of 25 K/min. The glass transition temperature (
T
g
), crystallization temperature (
T
c
) and melting temperature (
T
m
) are found to be 349, 376 and 533 K, respectively. Thin films of 400 nm thickness of Se
75
Te
13
In
12
alloy were prepared by thermal evaporation technique. To study the phase transformation, the thermal annealing was done at two different temperatures 353 and 363 K for 2 h in a vacuum furnace under a vacuum of 10
–3
Torr. Optical measurements were done for as-prepared and annealed films. The optical band gap is found to decrease with increasing annealing temperature. The transformed phases of as grown and thermally annealed films were analyzed by High Resolution X-ray diffraction (HRXRD) and Field Emission Scanning Electron Microscope (FESEM). |
| doi_str_mv | 10.1134/S1087659619020111 |
| format | Article |
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75
Te
13
In
12
chalcogenide glass has been prepared by melt quenching technique. The non-isothermal Differential Scanning Calorimetry (DSC) measurement of synthesized alloy has been executed at constant heating rate of 25 K/min. The glass transition temperature (
T
g
), crystallization temperature (
T
c
) and melting temperature (
T
m
) are found to be 349, 376 and 533 K, respectively. Thin films of 400 nm thickness of Se
75
Te
13
In
12
alloy were prepared by thermal evaporation technique. To study the phase transformation, the thermal annealing was done at two different temperatures 353 and 363 K for 2 h in a vacuum furnace under a vacuum of 10
–3
Torr. Optical measurements were done for as-prepared and annealed films. The optical band gap is found to decrease with increasing annealing temperature. The transformed phases of as grown and thermally annealed films were analyzed by High Resolution X-ray diffraction (HRXRD) and Field Emission Scanning Electron Microscope (FESEM).</description><identifier>ISSN: 1087-6596</identifier><identifier>EISSN: 1608-313X</identifier><identifier>DOI: 10.1134/S1087659619020111</identifier><language>eng</language><publisher>Moscow: Pleiades Publishing</publisher><subject>Annealing ; Ceramics ; Chalcogenides ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Composites ; Crystallization ; Emission analysis ; Field emission microscopy ; Glass ; Glass transition temperature ; Heating rate ; Materials Science ; Melt temperature ; Natural Materials ; Optical measurement ; Phase transitions ; Physical Chemistry ; Temperature ; Thermal transformations ; Thickness ; Thin films ; Vacuum furnaces ; X-ray diffraction</subject><ispartof>Glass physics and chemistry, 2019-03, Vol.45 (2), p.111-118</ispartof><rights>Pleiades Publishing, Ltd. 2019</rights><rights>Pleiades Publishing, Ltd. 2019.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c316t-7bc143798338ac7ab531259962ed2b9e60b558319a64dd2bc518c3eed70507f43</citedby><cites>FETCH-LOGICAL-c316t-7bc143798338ac7ab531259962ed2b9e60b558319a64dd2bc518c3eed70507f43</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1134/S1087659619020111$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1134/S1087659619020111$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,41488,42557,51319</link.rule.ids></links><search><creatorcontrib>Srivastava, A.</creatorcontrib><creatorcontrib>Tiwari, S. N.</creatorcontrib><creatorcontrib>Lal, J. K.</creatorcontrib><creatorcontrib>Khan, Shamshad A.</creatorcontrib><title>Phase Transformation in Se75Te13In12 Chalcogenide Thin Films</title><title>Glass physics and chemistry</title><addtitle>Glass Phys Chem</addtitle><description>In the present research work Se
75
Te
13
In
12
chalcogenide glass has been prepared by melt quenching technique. The non-isothermal Differential Scanning Calorimetry (DSC) measurement of synthesized alloy has been executed at constant heating rate of 25 K/min. The glass transition temperature (
T
g
), crystallization temperature (
T
c
) and melting temperature (
T
m
) are found to be 349, 376 and 533 K, respectively. Thin films of 400 nm thickness of Se
75
Te
13
In
12
alloy were prepared by thermal evaporation technique. To study the phase transformation, the thermal annealing was done at two different temperatures 353 and 363 K for 2 h in a vacuum furnace under a vacuum of 10
–3
Torr. Optical measurements were done for as-prepared and annealed films. The optical band gap is found to decrease with increasing annealing temperature. The transformed phases of as grown and thermally annealed films were analyzed by High Resolution X-ray diffraction (HRXRD) and Field Emission Scanning Electron Microscope (FESEM).</description><subject>Annealing</subject><subject>Ceramics</subject><subject>Chalcogenides</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Composites</subject><subject>Crystallization</subject><subject>Emission analysis</subject><subject>Field emission microscopy</subject><subject>Glass</subject><subject>Glass transition temperature</subject><subject>Heating rate</subject><subject>Materials Science</subject><subject>Melt temperature</subject><subject>Natural Materials</subject><subject>Optical measurement</subject><subject>Phase transitions</subject><subject>Physical Chemistry</subject><subject>Temperature</subject><subject>Thermal transformations</subject><subject>Thickness</subject><subject>Thin films</subject><subject>Vacuum furnaces</subject><subject>X-ray diffraction</subject><issn>1087-6596</issn><issn>1608-313X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNp1kE9Lw0AQxRdRsFY_gLeA5-jObvYfeJFia6Gg0AjewmazaVKSTd1ND357t0TwIJ5mmPd7M8xD6BbwPQDNHraApeBMcVCYYAA4QzPgWKYU6Md57KOcnvRLdBXCHmOshMhm6PGt0cEmudcu1IPv9dgOLmldsrWC5Rbo2gFJFo3uzLCzrq0i20R52XZ9uEYXte6Cvfmpc_S-fM4XL-nmdbVePG1SQ4GPqSgNZFQoSanURuiSUSBMKU5sRUplOS4ZkxSU5lkVJ4aBNNTaSmCGRZ3RObqb9h788Hm0YSz2w9G7eLIghCjC4qcQKZgo44cQvK2Lg2977b8KwMUppOJPSNFDJk-IrNtZ_7v5f9M3kcVllg</recordid><startdate>20190301</startdate><enddate>20190301</enddate><creator>Srivastava, A.</creator><creator>Tiwari, S. N.</creator><creator>Lal, J. K.</creator><creator>Khan, Shamshad A.</creator><general>Pleiades Publishing</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7QQ</scope><scope>7SR</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>20190301</creationdate><title>Phase Transformation in Se75Te13In12 Chalcogenide Thin Films</title><author>Srivastava, A. ; Tiwari, S. N. ; Lal, J. K. ; Khan, Shamshad A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c316t-7bc143798338ac7ab531259962ed2b9e60b558319a64dd2bc518c3eed70507f43</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Annealing</topic><topic>Ceramics</topic><topic>Chalcogenides</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Composites</topic><topic>Crystallization</topic><topic>Emission analysis</topic><topic>Field emission microscopy</topic><topic>Glass</topic><topic>Glass transition temperature</topic><topic>Heating rate</topic><topic>Materials Science</topic><topic>Melt temperature</topic><topic>Natural Materials</topic><topic>Optical measurement</topic><topic>Phase transitions</topic><topic>Physical Chemistry</topic><topic>Temperature</topic><topic>Thermal transformations</topic><topic>Thickness</topic><topic>Thin films</topic><topic>Vacuum furnaces</topic><topic>X-ray diffraction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Srivastava, A.</creatorcontrib><creatorcontrib>Tiwari, S. N.</creatorcontrib><creatorcontrib>Lal, J. K.</creatorcontrib><creatorcontrib>Khan, Shamshad A.</creatorcontrib><collection>CrossRef</collection><collection>Ceramic Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Glass physics and chemistry</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Srivastava, A.</au><au>Tiwari, S. N.</au><au>Lal, J. K.</au><au>Khan, Shamshad A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Phase Transformation in Se75Te13In12 Chalcogenide Thin Films</atitle><jtitle>Glass physics and chemistry</jtitle><stitle>Glass Phys Chem</stitle><date>2019-03-01</date><risdate>2019</risdate><volume>45</volume><issue>2</issue><spage>111</spage><epage>118</epage><pages>111-118</pages><issn>1087-6596</issn><eissn>1608-313X</eissn><abstract>In the present research work Se
75
Te
13
In
12
chalcogenide glass has been prepared by melt quenching technique. The non-isothermal Differential Scanning Calorimetry (DSC) measurement of synthesized alloy has been executed at constant heating rate of 25 K/min. The glass transition temperature (
T
g
), crystallization temperature (
T
c
) and melting temperature (
T
m
) are found to be 349, 376 and 533 K, respectively. Thin films of 400 nm thickness of Se
75
Te
13
In
12
alloy were prepared by thermal evaporation technique. To study the phase transformation, the thermal annealing was done at two different temperatures 353 and 363 K for 2 h in a vacuum furnace under a vacuum of 10
–3
Torr. Optical measurements were done for as-prepared and annealed films. The optical band gap is found to decrease with increasing annealing temperature. The transformed phases of as grown and thermally annealed films were analyzed by High Resolution X-ray diffraction (HRXRD) and Field Emission Scanning Electron Microscope (FESEM).</abstract><cop>Moscow</cop><pub>Pleiades Publishing</pub><doi>10.1134/S1087659619020111</doi><tpages>8</tpages></addata></record> |
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| source | SpringerNature Journals |
| subjects | Annealing Ceramics Chalcogenides Characterization and Evaluation of Materials Chemistry and Materials Science Composites Crystallization Emission analysis Field emission microscopy Glass Glass transition temperature Heating rate Materials Science Melt temperature Natural Materials Optical measurement Phase transitions Physical Chemistry Temperature Thermal transformations Thickness Thin films Vacuum furnaces X-ray diffraction |
| title | Phase Transformation in Se75Te13In12 Chalcogenide Thin Films |
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