Structural, optical and Schottky diode properties of Cu2ZnSnS4 thin films grown by two-stage method

CZTS thin film was prepared by a two-stage process comprising sputter deposition of metallic Cu, Zn, and Sn layers followed annealing treatment of the metallic precursors in a sulfur atmosphere at 560 °C for 3 min. The CZTS thin film was investigated in the way of structural, optical and electrical...

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Veröffentlicht in:	Journal of materials science. Materials in electronics 2019-06, Vol.30 (11), p.10435-10442
Hauptverfasser:	Atasoy, Y., Olgar, M. A., Bacaksiz, E.
Format:	Artikel
Sprache:	eng
Schlagworte:	Characterization and Evaluation of Materials Chemistry and Materials Science Copper Copper zinc tin sulfide Electrical properties Materials Science Molybdenum Optical and Electronic Materials Optical properties Raman spectra Schottky diodes Temperature dependence Thin films Tin Zinc
Online-Zugang:	Volltext
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