Spectral Noise Analysis of a CMOS Imager at Low Temperature for Logarithmic Mode

The most common and useful CMOS high-dynamic-range imager is the one employing the active pixel sensor (APS) operating in the logarithmic mode. Notwithstanding, temporal noise can compromise the quality of the image generated by the focal-plane array. Most of the image-sensor noise models and result...

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Veröffentlicht in:	IEEE transactions on electron devices 2019-06, Vol.66 (6), p.2662-2668
Hauptverfasser:	Teixeira, Aldemir Silva, Cotta, Eduardo Adriano, de Moraes Cruz, Carlos Augusto, Monteiro, Davies William de Lima
Format:	Artikel
Sprache:	eng
Schlagworte:	Active pixel sensor (APS) Active pixel sensors Circuits CMOS CMOS image sensor (CIS) CMOS technology freezeout temperature high dynamic range (HDR) Image quality Low temperature Luminous intensity Noise Noise intensity Optical imaging Optical sensors Pixels power spectrum density Semiconductor doping Sensor arrays Sensors Spikes Temperature distribution Temperature sensors temporal spectrum noise Thermal energy Thermal noise White noise
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