Quantitative Approach for Thickness and Conductivity Measurement of Monolayer Coating by Dual-Frequency Eddy Current Technique

A new approach is proposed to measure the coating material's thickness and its conductivity simultaneously by using the eddy current technique. The proposed approach can be used for a coating material with unknown or inhomogeneous conductivity. This is achieved by exploring an inverse algorithm...

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Veröffentlicht in:	IEEE transactions on instrumentation and measurement 2017-07, Vol.66 (7), p.1874-1882
Hauptverfasser:	Yu, Yating, Zhang, Dejun, Lai, Chao, Tian, Guiyun
Format:	Artikel
Sprache:	eng
Schlagworte:	Algorithms Coating Coating conductivity coating thickness Coatings Conductivity Conductivity measurement dual-frequency eddy current (EC) technique Eddy currents Error analysis Flux density Frequency measurement Magnetic flux Metals monolayer structure Protective coatings quantitative measurement Substrates Thickness measurement
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container_title	IEEE transactions on instrumentation and measurement
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creator	Yu, Yating Zhang, Dejun Lai, Chao Tian, Guiyun
description	A new approach is proposed to measure the coating material's thickness and its conductivity simultaneously by using the eddy current technique. The proposed approach can be used for a coating material with unknown or inhomogeneous conductivity. This is achieved by exploring an inverse algorithm to investigate the relationship between the thickness and the perpendicular component of the magnetic flux density for different coating conductivities. The measured average relative error is less than 10%, which makes the monitoring of the coating thickness possible under variation of the conductivity due to the applied loads and the manufacturing process.
doi_str_mv	10.1109/TIM.2017.2669843
format	Article
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subjects	Algorithms Coating Coating conductivity coating thickness Coatings Conductivity Conductivity measurement dual-frequency eddy current (EC) technique Eddy currents Error analysis Flux density Frequency measurement Magnetic flux Metals monolayer structure Protective coatings quantitative measurement Substrates Thickness measurement
title	Quantitative Approach for Thickness and Conductivity Measurement of Monolayer Coating by Dual-Frequency Eddy Current Technique
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