Accurate chemical analysis of oxygenated graphene-based materials using X-ray photoelectron spectroscopy

A simple, fast and general protocol for quantitative analysis of X-ray photoelectron spectroscopy (XPS) data provides accurate estimations of chemical species in graphene and related materials (GRMs). XPS data are commonly used to estimate the quality of and defects in graphene and graphene oxide (G...

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Veröffentlicht in:	Carbon (New York) 2019-03, Vol.143, p.268-275
Hauptverfasser:	Kovtun, Alessandro, Jones, Derek, Dell’Elce, Simone, Treossi, Emanuele, Liscio, Andrea, Palermo, Vincenzo
Format:	Artikel
Sprache:	eng
Schlagworte:	C 1s Carbonyls Chemical analysis Chemicals Defects Functional groups Graphene Graphite Organic chemistry Oxidation degree Oxygen Photoelectrons Quantitative analysis Spectrum analysis Speculation Substrates Thickness X ray photoelectron spectroscopy XPS
Online-Zugang:	Volltext
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