Growth and Characterization of Tin Sulphide Nanostructured Thin Film by Chemical Bath Deposition for Near-Infrared Photodetector Application
This study involves synthesizing of nanostructured tin sulphide (SnS) thin film on a glass substrate by chemical bath deposition technique. SnS film was prepared using non-toxic trisodium citrate (TSC) as a complex agent. The structural and morphological characteristics of the film were characterize...
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| Veröffentlicht in: | Solid state phenomena 2019-04, Vol.290, p.220-224 |
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| creator | Mahdi, Mohamed S. Ahmed, Naser Mahmoud Hmood, Arshad Ibrahim, Kamarulazizi Azzez, Shrook A. |
| description | This study involves synthesizing of nanostructured tin sulphide (SnS) thin film on a glass substrate by chemical bath deposition technique. SnS film was prepared using non-toxic trisodium citrate (TSC) as a complex agent. The structural and morphological characteristics of the film were characterized by using X-ray diffraction (XRD), optical field emission scanning electron microscopy (FESEM). The XRD pattern confirmed an orthorhombic structure. The FESEM image revealed nanoflakes of the as-prepared SnS thin film. Moreover, near-infrared (NIR) metal semiconductor metal photodetector, which exhibited good photoresponse characteristics under (750 nm) light illumination was fabricated. The photoresponse characteristics also were investigated at different illumination power densities. The photodetector revealed excellent reproducibility and stability characteristics. |
| doi_str_mv | 10.4028/www.scientific.net/SSP.290.220 |
| format | Article |
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SnS film was prepared using non-toxic trisodium citrate (TSC) as a complex agent. The structural and morphological characteristics of the film were characterized by using X-ray diffraction (XRD), optical field emission scanning electron microscopy (FESEM). The XRD pattern confirmed an orthorhombic structure. The FESEM image revealed nanoflakes of the as-prepared SnS thin film. Moreover, near-infrared (NIR) metal semiconductor metal photodetector, which exhibited good photoresponse characteristics under (750 nm) light illumination was fabricated. The photoresponse characteristics also were investigated at different illumination power densities. 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The photodetector revealed excellent reproducibility and stability characteristics.</description><subject>Deposition</subject><subject>Diffraction patterns</subject><subject>Field emission microscopy</subject><subject>Glass substrates</subject><subject>Illumination</subject><subject>Light</subject><subject>Nanostructure</subject><subject>Organic chemistry</subject><subject>Photometers</subject><subject>Reproducibility</subject><subject>Scanning electron microscopy</subject><subject>Sodium citrate</subject><subject>Thin films</subject><subject>Titanium nitride</subject><subject>X-ray diffraction</subject><issn>1012-0394</issn><issn>1662-9779</issn><issn>1662-9779</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><sourceid>BENPR</sourceid><recordid>eNqNkd1q3DAQRk1poWmadxAEemdHkteWfROabJsfCElgt9diVhphBa_kSDJL-gx96Gi7gdzmSoL5vjMMpyh-MFotKO_OdrtdFZVFl6yxqnKYzlarx4r3tOKcfiqOWNvyshei_5z_lPGS1v3ia_EtxidKa9ax7qj4dx38Lg0EnCbLAQKohMH-hWS9I96QtXVkNY_TYDWSe3A-pjCrNAfUZD3k4ZUdt2Tzksu4tQpGcgkZ9wsnH-1_iPGB3COE8taZAPve4-CT15hQpTy7mKYxF_fZ78UXA2PEk7f3uPhz9Xu9vCnvHq5vlxd3peKC0VIrZtre1IuO9xp5vWmRgjZcAChVt7URokOtoWsauqEgGKjGNHqDDYNeoKiPi9MDdwr-ecaY5JOfg8srJeesqRcta5qcOj-kVPAxBjRyCnYL4UUyKvcGZDYg3w3IbEBmAzIbyByaAT8PgBTAxXzu8L7ng4hXWuObjw</recordid><startdate>20190401</startdate><enddate>20190401</enddate><creator>Mahdi, Mohamed S.</creator><creator>Ahmed, Naser Mahmoud</creator><creator>Hmood, Arshad</creator><creator>Ibrahim, Kamarulazizi</creator><creator>Azzez, Shrook A.</creator><general>Trans Tech Publications Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope></search><sort><creationdate>20190401</creationdate><title>Growth and Characterization of Tin Sulphide Nanostructured Thin Film by Chemical Bath Deposition for Near-Infrared Photodetector Application</title><author>Mahdi, Mohamed S. ; Ahmed, Naser Mahmoud ; Hmood, Arshad ; Ibrahim, Kamarulazizi ; Azzez, Shrook A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2710-dc1f69f34829de23b6e0adf27aacc363f778edda8550b0a71ac5f5dbe51a97e73</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Deposition</topic><topic>Diffraction patterns</topic><topic>Field emission microscopy</topic><topic>Glass substrates</topic><topic>Illumination</topic><topic>Light</topic><topic>Nanostructure</topic><topic>Organic chemistry</topic><topic>Photometers</topic><topic>Reproducibility</topic><topic>Scanning electron microscopy</topic><topic>Sodium citrate</topic><topic>Thin films</topic><topic>Titanium nitride</topic><topic>X-ray diffraction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Mahdi, Mohamed S.</creatorcontrib><creatorcontrib>Ahmed, Naser Mahmoud</creatorcontrib><creatorcontrib>Hmood, Arshad</creatorcontrib><creatorcontrib>Ibrahim, Kamarulazizi</creatorcontrib><creatorcontrib>Azzez, Shrook A.</creatorcontrib><collection>CrossRef</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>SciTech Premium Collection</collection><collection>Materials Science Database</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><jtitle>Solid state phenomena</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Mahdi, Mohamed S.</au><au>Ahmed, Naser Mahmoud</au><au>Hmood, Arshad</au><au>Ibrahim, Kamarulazizi</au><au>Azzez, Shrook A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Growth and Characterization of Tin Sulphide Nanostructured Thin Film by Chemical Bath Deposition for Near-Infrared Photodetector Application</atitle><jtitle>Solid state phenomena</jtitle><date>2019-04-01</date><risdate>2019</risdate><volume>290</volume><spage>220</spage><epage>224</epage><pages>220-224</pages><issn>1012-0394</issn><issn>1662-9779</issn><eissn>1662-9779</eissn><abstract>This study involves synthesizing of nanostructured tin sulphide (SnS) thin film on a glass substrate by chemical bath deposition technique. SnS film was prepared using non-toxic trisodium citrate (TSC) as a complex agent. The structural and morphological characteristics of the film were characterized by using X-ray diffraction (XRD), optical field emission scanning electron microscopy (FESEM). The XRD pattern confirmed an orthorhombic structure. The FESEM image revealed nanoflakes of the as-prepared SnS thin film. Moreover, near-infrared (NIR) metal semiconductor metal photodetector, which exhibited good photoresponse characteristics under (750 nm) light illumination was fabricated. The photoresponse characteristics also were investigated at different illumination power densities. The photodetector revealed excellent reproducibility and stability characteristics.</abstract><cop>Zurich</cop><pub>Trans Tech Publications Ltd</pub><doi>10.4028/www.scientific.net/SSP.290.220</doi><tpages>5</tpages></addata></record> |
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| ispartof | Solid state phenomena, 2019-04, Vol.290, p.220-224 |
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| language | eng |
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| subjects | Deposition Diffraction patterns Field emission microscopy Glass substrates Illumination Light Nanostructure Organic chemistry Photometers Reproducibility Scanning electron microscopy Sodium citrate Thin films Titanium nitride X-ray diffraction |
| title | Growth and Characterization of Tin Sulphide Nanostructured Thin Film by Chemical Bath Deposition for Near-Infrared Photodetector Application |
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