A rule-based approach to multiple statistical test analysis of binary data

Computer-Integrated Manufacturing (CIM) and related techniques provide more data faster and more often than was poss/ible in the past. Also, high-quality manufacturing requires methods capable of detecting process changes even when the process is producing in the defects per million range. Past rese...

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Veröffentlicht in:	IIE transactions 1996-03, Vol.28 (3), p.203-213
Hauptverfasser:	MOLNAU, WADE E., BERT KEATS, J.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences CIM Exact sciences and technology Manufacturing Mathematical models Operational research and scientific management Operational research. Management science Operations research Process controls Reliability theory. Replacement problems Studies
Online-Zugang:	Volltext
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