Method to Extract System-Independent Material Properties From Dual-Energy X-Ray CT

In 2016, we published a method for processing dual-energy computed tomography (DECT) data called system-independent rho-e/Z-e ( \rho _{\mathrm {e}}/Z_{\mathrm {e}} ) or SIRZ. Using data from multiple DECT systems and spectra, SIRZ estimated the electron density \rho _{\mathrm {e}} and effective atomic number Z_{\mathrm {e}} (based on published X-ray cross sections), for a set of known specimens. However, the decomposition process required complex spectral modeling of the DECT system, which made SIRZ difficult to implement and automate. This paper describes the subsequent work on "SIRZ-2" to simplify the spectral modeling, automate the process, and improve its range and versatility. The SIRZ-2 basis functions are more accurate for the X-ray energy range (