Effect of low hole mobility on the efficiency droop of AlGaN nanowire deep ultraviolet light emitting diodes
Compared to the extensive studies on the efficiency droop of InGaN visible light emitting diodes (LEDs), the efficiency droop of AlGaN deep ultraviolet (UV) LEDs is much less studied. In this context, we discuss the efficiency droop of AlGaN ternary nanowire deep UV LEDs. The device active region co...
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Veröffentlicht in: | Applied physics letters 2019-03, Vol.114 (10) |
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creator | Hai, X. Rashid, R. T. Sadaf, S. M. Mi, Z. Zhao, S. |
description | Compared to the extensive studies on the efficiency droop of InGaN visible light emitting diodes (LEDs), the efficiency droop of AlGaN deep ultraviolet (UV) LEDs is much less studied. In this context, we discuss the efficiency droop of AlGaN ternary nanowire deep UV LEDs. The device active region consisted of AlGaN double heterojunctions, which were grown by molecular beam epitaxy on silicon substrates. Through detailed analysis of the device optical characteristics under both continuous-wave and pulsed operations, as well as of the electrical characteristics from 293 K to 77 K, it is suggested that the efficiency droop is largely rooted in the low hole mobility, due to the dominant Mg impurity band conduction at room temperature in highly p-doped AlGaN alloys. |
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T. ; Sadaf, S. M. ; Mi, Z. ; Zhao, S.</creator><creatorcontrib>Hai, X. ; Rashid, R. T. ; Sadaf, S. M. ; Mi, Z. ; Zhao, S.</creatorcontrib><description>Compared to the extensive studies on the efficiency droop of InGaN visible light emitting diodes (LEDs), the efficiency droop of AlGaN deep ultraviolet (UV) LEDs is much less studied. In this context, we discuss the efficiency droop of AlGaN ternary nanowire deep UV LEDs. The device active region consisted of AlGaN double heterojunctions, which were grown by molecular beam epitaxy on silicon substrates. Through detailed analysis of the device optical characteristics under both continuous-wave and pulsed operations, as well as of the electrical characteristics from 293 K to 77 K, it is suggested that the efficiency droop is largely rooted in the low hole mobility, due to the dominant Mg impurity band conduction at room temperature in highly p-doped AlGaN alloys.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.5091517</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Aluminum gallium nitrides ; Applied physics ; Conduction bands ; Conduction heating ; Continuous radiation ; Efficiency ; Epitaxial growth ; Heterojunctions ; Hole mobility ; Light emitting diodes ; Molecular beam epitaxy ; Nanowires ; Optical properties ; Organic light emitting diodes ; Silicon substrates ; Ultraviolet radiation</subject><ispartof>Applied physics letters, 2019-03, Vol.114 (10)</ispartof><rights>Author(s)</rights><rights>2019 Author(s). 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M.</creatorcontrib><creatorcontrib>Mi, Z.</creatorcontrib><creatorcontrib>Zhao, S.</creatorcontrib><title>Effect of low hole mobility on the efficiency droop of AlGaN nanowire deep ultraviolet light emitting diodes</title><title>Applied physics letters</title><description>Compared to the extensive studies on the efficiency droop of InGaN visible light emitting diodes (LEDs), the efficiency droop of AlGaN deep ultraviolet (UV) LEDs is much less studied. In this context, we discuss the efficiency droop of AlGaN ternary nanowire deep UV LEDs. The device active region consisted of AlGaN double heterojunctions, which were grown by molecular beam epitaxy on silicon substrates. Through detailed analysis of the device optical characteristics under both continuous-wave and pulsed operations, as well as of the electrical characteristics from 293 K to 77 K, it is suggested that the efficiency droop is largely rooted in the low hole mobility, due to the dominant Mg impurity band conduction at room temperature in highly p-doped AlGaN alloys.</description><subject>Aluminum gallium nitrides</subject><subject>Applied physics</subject><subject>Conduction bands</subject><subject>Conduction heating</subject><subject>Continuous radiation</subject><subject>Efficiency</subject><subject>Epitaxial growth</subject><subject>Heterojunctions</subject><subject>Hole mobility</subject><subject>Light emitting diodes</subject><subject>Molecular beam epitaxy</subject><subject>Nanowires</subject><subject>Optical properties</subject><subject>Organic light emitting diodes</subject><subject>Silicon substrates</subject><subject>Ultraviolet radiation</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNp90E1LAzEQBuAgCtbqwX8Q8KSwNbPpfh1L0SoUveg5ZJNJm5Ju1mza0n_vlhY9CJ6GgYd3mJeQW2AjYDl_hFHGKsigOCMDYEWRcIDynAwYYzzJqwwuyVXXrfo1SzkfEPdkDKpIvaHO7-jSO6RrX1tn4576hsYlUjTGKouN2lMdvG8PeOJm8o02svE7G5BqxJZuXAxya_uISJ1dLCPFtY3RNguqrdfYXZMLI12HN6c5JJ_PTx_Tl2T-PnudTuaJ4hWPiRpnCtJcyXQsIVWSgYKigFqZMlV5T3KsSwRUPK210qZgvK61gaLMmKrNmA_J3TG3Df5rg10UK78JTX9SpFD1rbCy_35I7o9KBd91AY1og13LsBfAxKFMAeJUZm8fjrZTNspoffODtz78QtFq8x_-m_wNx2GDyg</recordid><startdate>20190311</startdate><enddate>20190311</enddate><creator>Hai, X.</creator><creator>Rashid, R. 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T.</creatorcontrib><creatorcontrib>Sadaf, S. M.</creatorcontrib><creatorcontrib>Mi, Z.</creatorcontrib><creatorcontrib>Zhao, S.</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hai, X.</au><au>Rashid, R. T.</au><au>Sadaf, S. 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Through detailed analysis of the device optical characteristics under both continuous-wave and pulsed operations, as well as of the electrical characteristics from 293 K to 77 K, it is suggested that the efficiency droop is largely rooted in the low hole mobility, due to the dominant Mg impurity band conduction at room temperature in highly p-doped AlGaN alloys.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/1.5091517</doi><tpages>5</tpages><orcidid>https://orcid.org/0000-0002-0277-040X</orcidid><orcidid>https://orcid.org/0000-0001-9494-7390</orcidid><orcidid>https://orcid.org/0000-0003-1787-6052</orcidid></addata></record> |
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subjects | Aluminum gallium nitrides Applied physics Conduction bands Conduction heating Continuous radiation Efficiency Epitaxial growth Heterojunctions Hole mobility Light emitting diodes Molecular beam epitaxy Nanowires Optical properties Organic light emitting diodes Silicon substrates Ultraviolet radiation |
title | Effect of low hole mobility on the efficiency droop of AlGaN nanowire deep ultraviolet light emitting diodes |
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