Relationships among resonant frequency changes on a coated quartz crystal microbalanace, thickness changes, and resistance responses of polymer-carbon black composite chemiresistors

The relationships among frequency changes on a filmcoated quartz crystal microbalance, thickness changes, and dc resistance changes have been investigated for carbon black-insulating polymer composite vapor detectors. Quartz crystal microbalance (QCM) measurements and ellipsometry measurements have been performed simultaneously on polymer films that do not contain carbon black filler to relate the QCM frequency change and the ellipsometrically determined thickness change to the analyte concentration in the vapor phase.