Temperature-Controlled Depth Profiling of Poly(methyl methacrylate) Using Cluster Secondary Ion Mass Spectrometry. 1. Investigation of Depth Profile Characteristics

Secondary ion mass spectrometry employing an SF5 + polyatomic primary ion source was used to depth profile poly(methyl methacrylate) (PMMA) at a series of temperatures ranging from −75 °C to 125 °C, where the primary glass transition for PMMA occurs at 105 °C. The depth profile characteristics (e.g....

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Veröffentlicht in:	Analytical chemistry (Washington) 2007-02, Vol.79 (3), p.828-836
Hauptverfasser:	Mahoney, Christine M, Fahey, Albert J, Gillen, Greg
Format:	Artikel
Sprache:	eng
Schlagworte:	Analytical chemistry Chemistry Exact sciences and technology Mass spectrometry Organic chemicals Temperature
Online-Zugang:	Volltext
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