The Effects of Inter-Symbol Interference in Dynamic Element Matching DACs
Dynamic element matching (DEM) is often applied to multi-bit DACs to avoid nonlinear distortion that would otherwise result from inevitable mismatches among nominally identical circuit elements. Unfortunately, for such a DEM DAC to fully achieve this objective its constituent 1-bit DACs must be free...
Gespeichert in:
| Veröffentlicht in: | IEEE transactions on circuits and systems. I, Regular papers Regular papers, 2017-01, Vol.64 (1), p.14-23 |
|---|---|
| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 23 |
|---|---|
| container_issue | 1 |
| container_start_page | 14 |
| container_title | IEEE transactions on circuits and systems. I, Regular papers |
| container_volume | 64 |
| creator | Remple, Jason Galton, Ian |
| description | Dynamic element matching (DEM) is often applied to multi-bit DACs to avoid nonlinear distortion that would otherwise result from inevitable mismatches among nominally identical circuit elements. Unfortunately, for such a DEM DAC to fully achieve this objective its constituent 1-bit DACs must be free of inter-symbol interference (ISI), i.e., the error from each 1-bit DAC must not depend on prior samples of the DAC's input sequence. This paper provides the first quantitative general analysis of the effects of ISI on the continuous-time outputs of DEM DACs. The analysis provides some surprising insights such as the conclusion that for certain types of DEM the only nonlinear distortion caused by ISI is second-order distortion. The paper also presents a digital pre-distortion technique that cancels the second-order distortion in the DEM DAC's first Nyquist band if information about the 1-bit DAC mismatches is available. |
| doi_str_mv | 10.1109/TCSI.2016.2601026 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_journals_2174472068</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>7585022</ieee_id><sourcerecordid>2174472068</sourcerecordid><originalsourceid>FETCH-LOGICAL-c336t-dd7faef377ba99e45142f4123e557dfd5c0967d94a0201c029e8be2db80320133</originalsourceid><addsrcrecordid>eNo9kMtOwzAQRS0EEqXwAYiNJdYpYzuOnWWVFohUxKJlbSXOmKZqkmKHRf-eRKlYzUP3zuMQ8shgwRikL7tsmy84sGTBE2DAkysyY1LqCDQk12Mep5EWXN-SuxAOADwFwWYk3-2Rrp1D2wfaOZq3Pfpoe27K7jgVDj22Fmnd0tW5LZra0vURG2x7-lH0dl-333S1zMI9uXHFMeDDJc7J1-t6l71Hm8-3PFtuIitE0kdVpVyBTihVFmmKsWQxdzHjAqVUlaukhTRRVRoXMLxjhztRl8irUoMYGkLMyfM09-S7n18MvTl0v74dVhrOVBwrDokeVGxSWd-F4NGZk6-bwp8NAzMSMyMxMxIzF2KD52ny1Ij4r1dSS-Bc_AGBZWVf</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2174472068</pqid></control><display><type>article</type><title>The Effects of Inter-Symbol Interference in Dynamic Element Matching DACs</title><source>IEEE Electronic Library (IEL)</source><creator>Remple, Jason ; Galton, Ian</creator><creatorcontrib>Remple, Jason ; Galton, Ian</creatorcontrib><description>Dynamic element matching (DEM) is often applied to multi-bit DACs to avoid nonlinear distortion that would otherwise result from inevitable mismatches among nominally identical circuit elements. Unfortunately, for such a DEM DAC to fully achieve this objective its constituent 1-bit DACs must be free of inter-symbol interference (ISI), i.e., the error from each 1-bit DAC must not depend on prior samples of the DAC's input sequence. This paper provides the first quantitative general analysis of the effects of ISI on the continuous-time outputs of DEM DACs. The analysis provides some surprising insights such as the conclusion that for certain types of DEM the only nonlinear distortion caused by ISI is second-order distortion. The paper also presents a digital pre-distortion technique that cancels the second-order distortion in the DEM DAC's first Nyquist band if information about the 1-bit DAC mismatches is available.</description><identifier>ISSN: 1549-8328</identifier><identifier>EISSN: 1558-0806</identifier><identifier>DOI: 10.1109/TCSI.2016.2601026</identifier><identifier>CODEN: ITCSCH</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Clocks ; DAC ; DEM ; Digital to analog converters ; Distortion ; Interference ; ISI ; Matching ; Mathematical model ; Nonlinear distortion ; Optical signal processing ; Transient analysis</subject><ispartof>IEEE transactions on circuits and systems. I, Regular papers, 2017-01, Vol.64 (1), p.14-23</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2017</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c336t-dd7faef377ba99e45142f4123e557dfd5c0967d94a0201c029e8be2db80320133</citedby><cites>FETCH-LOGICAL-c336t-dd7faef377ba99e45142f4123e557dfd5c0967d94a0201c029e8be2db80320133</cites><orcidid>0000-0003-4790-5483</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/7585022$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/7585022$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Remple, Jason</creatorcontrib><creatorcontrib>Galton, Ian</creatorcontrib><title>The Effects of Inter-Symbol Interference in Dynamic Element Matching DACs</title><title>IEEE transactions on circuits and systems. I, Regular papers</title><addtitle>TCSI</addtitle><description>Dynamic element matching (DEM) is often applied to multi-bit DACs to avoid nonlinear distortion that would otherwise result from inevitable mismatches among nominally identical circuit elements. Unfortunately, for such a DEM DAC to fully achieve this objective its constituent 1-bit DACs must be free of inter-symbol interference (ISI), i.e., the error from each 1-bit DAC must not depend on prior samples of the DAC's input sequence. This paper provides the first quantitative general analysis of the effects of ISI on the continuous-time outputs of DEM DACs. The analysis provides some surprising insights such as the conclusion that for certain types of DEM the only nonlinear distortion caused by ISI is second-order distortion. The paper also presents a digital pre-distortion technique that cancels the second-order distortion in the DEM DAC's first Nyquist band if information about the 1-bit DAC mismatches is available.</description><subject>Clocks</subject><subject>DAC</subject><subject>DEM</subject><subject>Digital to analog converters</subject><subject>Distortion</subject><subject>Interference</subject><subject>ISI</subject><subject>Matching</subject><subject>Mathematical model</subject><subject>Nonlinear distortion</subject><subject>Optical signal processing</subject><subject>Transient analysis</subject><issn>1549-8328</issn><issn>1558-0806</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kMtOwzAQRS0EEqXwAYiNJdYpYzuOnWWVFohUxKJlbSXOmKZqkmKHRf-eRKlYzUP3zuMQ8shgwRikL7tsmy84sGTBE2DAkysyY1LqCDQk12Mep5EWXN-SuxAOADwFwWYk3-2Rrp1D2wfaOZq3Pfpoe27K7jgVDj22Fmnd0tW5LZra0vURG2x7-lH0dl-333S1zMI9uXHFMeDDJc7J1-t6l71Hm8-3PFtuIitE0kdVpVyBTihVFmmKsWQxdzHjAqVUlaukhTRRVRoXMLxjhztRl8irUoMYGkLMyfM09-S7n18MvTl0v74dVhrOVBwrDokeVGxSWd-F4NGZk6-bwp8NAzMSMyMxMxIzF2KD52ny1Ij4r1dSS-Bc_AGBZWVf</recordid><startdate>201701</startdate><enddate>201701</enddate><creator>Remple, Jason</creator><creator>Galton, Ian</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0003-4790-5483</orcidid></search><sort><creationdate>201701</creationdate><title>The Effects of Inter-Symbol Interference in Dynamic Element Matching DACs</title><author>Remple, Jason ; Galton, Ian</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c336t-dd7faef377ba99e45142f4123e557dfd5c0967d94a0201c029e8be2db80320133</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Clocks</topic><topic>DAC</topic><topic>DEM</topic><topic>Digital to analog converters</topic><topic>Distortion</topic><topic>Interference</topic><topic>ISI</topic><topic>Matching</topic><topic>Mathematical model</topic><topic>Nonlinear distortion</topic><topic>Optical signal processing</topic><topic>Transient analysis</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Remple, Jason</creatorcontrib><creatorcontrib>Galton, Ian</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on circuits and systems. I, Regular papers</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Remple, Jason</au><au>Galton, Ian</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The Effects of Inter-Symbol Interference in Dynamic Element Matching DACs</atitle><jtitle>IEEE transactions on circuits and systems. I, Regular papers</jtitle><stitle>TCSI</stitle><date>2017-01</date><risdate>2017</risdate><volume>64</volume><issue>1</issue><spage>14</spage><epage>23</epage><pages>14-23</pages><issn>1549-8328</issn><eissn>1558-0806</eissn><coden>ITCSCH</coden><abstract>Dynamic element matching (DEM) is often applied to multi-bit DACs to avoid nonlinear distortion that would otherwise result from inevitable mismatches among nominally identical circuit elements. Unfortunately, for such a DEM DAC to fully achieve this objective its constituent 1-bit DACs must be free of inter-symbol interference (ISI), i.e., the error from each 1-bit DAC must not depend on prior samples of the DAC's input sequence. This paper provides the first quantitative general analysis of the effects of ISI on the continuous-time outputs of DEM DACs. The analysis provides some surprising insights such as the conclusion that for certain types of DEM the only nonlinear distortion caused by ISI is second-order distortion. The paper also presents a digital pre-distortion technique that cancels the second-order distortion in the DEM DAC's first Nyquist band if information about the 1-bit DAC mismatches is available.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TCSI.2016.2601026</doi><tpages>10</tpages><orcidid>https://orcid.org/0000-0003-4790-5483</orcidid><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 1549-8328 |
| ispartof | IEEE transactions on circuits and systems. I, Regular papers, 2017-01, Vol.64 (1), p.14-23 |
| issn | 1549-8328 1558-0806 |
| language | eng |
| recordid | cdi_proquest_journals_2174472068 |
| source | IEEE Electronic Library (IEL) |
| subjects | Clocks DAC DEM Digital to analog converters Distortion Interference ISI Matching Mathematical model Nonlinear distortion Optical signal processing Transient analysis |
| title | The Effects of Inter-Symbol Interference in Dynamic Element Matching DACs |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T00%3A21%3A34IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=The%20Effects%20of%20Inter-Symbol%20Interference%20in%20Dynamic%20Element%20Matching%20DACs&rft.jtitle=IEEE%20transactions%20on%20circuits%20and%20systems.%20I,%20Regular%20papers&rft.au=Remple,%20Jason&rft.date=2017-01&rft.volume=64&rft.issue=1&rft.spage=14&rft.epage=23&rft.pages=14-23&rft.issn=1549-8328&rft.eissn=1558-0806&rft.coden=ITCSCH&rft_id=info:doi/10.1109/TCSI.2016.2601026&rft_dat=%3Cproquest_RIE%3E2174472068%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2174472068&rft_id=info:pmid/&rft_ieee_id=7585022&rfr_iscdi=true |