Straightforward Measurement Method of Common Source Inductance for Fast Switching Semiconductor Devices Mounted on Board

Recent progress of widebandgap semiconductor switching devices enabled extremely high-frequency operation of power converters owing to their ultrafast switching capability. Fast switching may cause large switching noise at the common source inductance, which may increase the switching loss and lead...

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Veröffentlicht in:	IEEE transactions on industrial electronics (1982) 2017-10, Vol.64 (10), p.8258-8267
Hauptverfasser:	Umetani, Kazuhiro, Aikawa, Kyota, Hiraki, Eiji
Format:	Artikel
Sprache:	eng
Schlagworte:	Common source inductance Inductance Inductance measurement Logic gates Power converters Semiconductor device measurement Semiconductor devices semiconductor package Signal generators stray inductance Switches Switching Voltage measurement Wiring
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