Structural, optical and charge density analysis of Al doped ZnO Materials
The hexagonal structured Zn 1−x Al x O (x = 0.00, 0.04, 0.06, 0.08 and 0.10) materials was synthesized by co-precipitation method. Structural, morphological and photoluminescence properties of Al doped ZnO powders were investigated by powder X-ray diffraction, scanning electron microscopy and photol...
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| Veröffentlicht in: | Journal of materials science. Materials in electronics 2019-02, Vol.30 (3), p.2966-2974 |
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| container_title | Journal of materials science. Materials in electronics |
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| creator | Sivaganesh, D. Saravanakumar, S. Sivakumar, V. Ali, K. S. Syed Akapo, Esther Alemayehu, Ezra Rajajeyaganthan, R. Saravanan, R. |
| description | The hexagonal structured Zn
1−x
Al
x
O (x = 0.00, 0.04, 0.06, 0.08 and 0.10) materials was synthesized by co-precipitation method. Structural, morphological and photoluminescence properties of Al doped ZnO powders were investigated by powder X-ray diffraction, scanning electron microscopy and photoluminescence characterizations, respectively. Structural analysis was done by Rietveld refinement technique. The spherical shaped morphology was observed in ZnO:Al powders. The bonding features were analyzed by using electron density distribution studies and the photoluminescence properties of Zn
1−x
Al
x
O (x = 0.00, 0.04, 0.06, 0.08 and 0.10) was also revealed. |
| doi_str_mv | 10.1007/s10854-018-00574-5 |
| format | Article |
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1−x
Al
x
O (x = 0.00, 0.04, 0.06, 0.08 and 0.10) materials was synthesized by co-precipitation method. Structural, morphological and photoluminescence properties of Al doped ZnO powders were investigated by powder X-ray diffraction, scanning electron microscopy and photoluminescence characterizations, respectively. Structural analysis was done by Rietveld refinement technique. The spherical shaped morphology was observed in ZnO:Al powders. The bonding features were analyzed by using electron density distribution studies and the photoluminescence properties of Zn
1−x
Al
x
O (x = 0.00, 0.04, 0.06, 0.08 and 0.10) was also revealed.</description><identifier>ISSN: 0957-4522</identifier><identifier>EISSN: 1573-482X</identifier><identifier>DOI: 10.1007/s10854-018-00574-5</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Caustic soda ; Characterization and Evaluation of Materials ; Charge density ; Chemistry and Materials Science ; Density distribution ; Electron density ; Electronics ; Materials Science ; Morphology ; Nitrates ; Optical and Electronic Materials ; Photoluminescence ; Scanning electron microscopy ; Sodium ; Structural analysis ; X ray powder diffraction ; X-ray diffraction ; Zinc oxide ; Zinc oxides</subject><ispartof>Journal of materials science. Materials in electronics, 2019-02, Vol.30 (3), p.2966-2974</ispartof><rights>Springer Science+Business Media, LLC, part of Springer Nature 2019</rights><rights>Journal of Materials Science: Materials in Electronics is a copyright of Springer, (2019). All Rights Reserved.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c319t-3cd6b6009436dbc6b267c765f2c98e882437c4c4d2c4bc844e75ce12849fafd03</citedby><cites>FETCH-LOGICAL-c319t-3cd6b6009436dbc6b267c765f2c98e882437c4c4d2c4bc844e75ce12849fafd03</cites><orcidid>0000-0003-1406-9589</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10854-018-00574-5$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10854-018-00574-5$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27901,27902,41464,42533,51294</link.rule.ids></links><search><creatorcontrib>Sivaganesh, D.</creatorcontrib><creatorcontrib>Saravanakumar, S.</creatorcontrib><creatorcontrib>Sivakumar, V.</creatorcontrib><creatorcontrib>Ali, K. S. Syed</creatorcontrib><creatorcontrib>Akapo, Esther</creatorcontrib><creatorcontrib>Alemayehu, Ezra</creatorcontrib><creatorcontrib>Rajajeyaganthan, R.</creatorcontrib><creatorcontrib>Saravanan, R.</creatorcontrib><title>Structural, optical and charge density analysis of Al doped ZnO Materials</title><title>Journal of materials science. Materials in electronics</title><addtitle>J Mater Sci: Mater Electron</addtitle><description>The hexagonal structured Zn
1−x
Al
x
O (x = 0.00, 0.04, 0.06, 0.08 and 0.10) materials was synthesized by co-precipitation method. Structural, morphological and photoluminescence properties of Al doped ZnO powders were investigated by powder X-ray diffraction, scanning electron microscopy and photoluminescence characterizations, respectively. Structural analysis was done by Rietveld refinement technique. The spherical shaped morphology was observed in ZnO:Al powders. The bonding features were analyzed by using electron density distribution studies and the photoluminescence properties of Zn
1−x
Al
x
O (x = 0.00, 0.04, 0.06, 0.08 and 0.10) was also revealed.</description><subject>Caustic soda</subject><subject>Characterization and Evaluation of Materials</subject><subject>Charge density</subject><subject>Chemistry and Materials Science</subject><subject>Density distribution</subject><subject>Electron density</subject><subject>Electronics</subject><subject>Materials Science</subject><subject>Morphology</subject><subject>Nitrates</subject><subject>Optical and Electronic Materials</subject><subject>Photoluminescence</subject><subject>Scanning electron microscopy</subject><subject>Sodium</subject><subject>Structural analysis</subject><subject>X ray powder diffraction</subject><subject>X-ray diffraction</subject><subject>Zinc oxide</subject><subject>Zinc oxides</subject><issn>0957-4522</issn><issn>1573-482X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><sourceid>BENPR</sourceid><recordid>eNp9kM1KxDAYRYMoOI6-gKuAW6P5T7ocBn8GRmahgrgJaZKOHWpbk3Yxb2_GCu5cXfi45_JxALgk-IZgrG4TwVpwhIlGGAvFkTgCMyIUQ1zTt2Mww4VQiAtKT8FZSjuMseRMz8DqeYijG8Zom2vY9UPtbANt66H7sHEboA9tqod9Ptlmn-oEuwouGui7Pnj43m7gkx1CrG2TzsFJlSNc_OYcvN7fvSwf0XrzsFou1sgxUgyIOS9LiXHBmfSlkyWVyikpKuoKHbSmnCnHHffU8dJpzoMSLhCqeVHZymM2B1fTbh-7rzGkwey6Meb3kqFE5jVKmcgtOrVc7FKKoTJ9rD9t3BuCzUGZmZSZrMz8KDMHiE1QyuV2G-Lf9D_UNxVpbgA</recordid><startdate>20190201</startdate><enddate>20190201</enddate><creator>Sivaganesh, D.</creator><creator>Saravanakumar, S.</creator><creator>Sivakumar, V.</creator><creator>Ali, K. 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Syed ; Akapo, Esther ; Alemayehu, Ezra ; Rajajeyaganthan, R. ; Saravanan, R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c319t-3cd6b6009436dbc6b267c765f2c98e882437c4c4d2c4bc844e75ce12849fafd03</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Caustic soda</topic><topic>Characterization and Evaluation of Materials</topic><topic>Charge density</topic><topic>Chemistry and Materials Science</topic><topic>Density distribution</topic><topic>Electron density</topic><topic>Electronics</topic><topic>Materials Science</topic><topic>Morphology</topic><topic>Nitrates</topic><topic>Optical and Electronic Materials</topic><topic>Photoluminescence</topic><topic>Scanning electron microscopy</topic><topic>Sodium</topic><topic>Structural analysis</topic><topic>X ray powder diffraction</topic><topic>X-ray diffraction</topic><topic>Zinc oxide</topic><topic>Zinc oxides</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Sivaganesh, D.</creatorcontrib><creatorcontrib>Saravanakumar, S.</creatorcontrib><creatorcontrib>Sivakumar, V.</creatorcontrib><creatorcontrib>Ali, K. 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Syed</creatorcontrib><creatorcontrib>Akapo, Esther</creatorcontrib><creatorcontrib>Alemayehu, Ezra</creatorcontrib><creatorcontrib>Rajajeyaganthan, R.</creatorcontrib><creatorcontrib>Saravanan, R.</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection (ProQuest)</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>Materials Science Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>DELNET Engineering & Technology Collection</collection><jtitle>Journal of materials science. Materials in electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Sivaganesh, D.</au><au>Saravanakumar, S.</au><au>Sivakumar, V.</au><au>Ali, K. S. Syed</au><au>Akapo, Esther</au><au>Alemayehu, Ezra</au><au>Rajajeyaganthan, R.</au><au>Saravanan, R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Structural, optical and charge density analysis of Al doped ZnO Materials</atitle><jtitle>Journal of materials science. Materials in electronics</jtitle><stitle>J Mater Sci: Mater Electron</stitle><date>2019-02-01</date><risdate>2019</risdate><volume>30</volume><issue>3</issue><spage>2966</spage><epage>2974</epage><pages>2966-2974</pages><issn>0957-4522</issn><eissn>1573-482X</eissn><abstract>The hexagonal structured Zn
1−x
Al
x
O (x = 0.00, 0.04, 0.06, 0.08 and 0.10) materials was synthesized by co-precipitation method. Structural, morphological and photoluminescence properties of Al doped ZnO powders were investigated by powder X-ray diffraction, scanning electron microscopy and photoluminescence characterizations, respectively. Structural analysis was done by Rietveld refinement technique. The spherical shaped morphology was observed in ZnO:Al powders. The bonding features were analyzed by using electron density distribution studies and the photoluminescence properties of Zn
1−x
Al
x
O (x = 0.00, 0.04, 0.06, 0.08 and 0.10) was also revealed.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10854-018-00574-5</doi><tpages>9</tpages><orcidid>https://orcid.org/0000-0003-1406-9589</orcidid></addata></record> |
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| ispartof | Journal of materials science. Materials in electronics, 2019-02, Vol.30 (3), p.2966-2974 |
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| language | eng |
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| subjects | Caustic soda Characterization and Evaluation of Materials Charge density Chemistry and Materials Science Density distribution Electron density Electronics Materials Science Morphology Nitrates Optical and Electronic Materials Photoluminescence Scanning electron microscopy Sodium Structural analysis X ray powder diffraction X-ray diffraction Zinc oxide Zinc oxides |
| title | Structural, optical and charge density analysis of Al doped ZnO Materials |
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