Composition dependence study of thermally evaporated nanocrystalline ZnTe thin films

Composition dependent structural and morphological study of nanocrystalline Zn x Te 100−x (0, 5, 20, 30, 40, 50) thin films has been performed. The effect of annealing on these properties is also investigated. Nanocrystalline alloys and thin films of ZnTe were prepared using conventional melt quench...

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Veröffentlicht in:	Journal of materials science. Materials in electronics 2019-02, Vol.30 (4), p.3504-3510
Hauptverfasser:	Singh, Harinder, Singh, Manmeet, Singh, Jagtar, Bansod, Babankumar S., Singh, Tejbir, Thakur, Anup, Wani, M. F., Sharma, Jeewan
Format:	Artikel
Sprache:	eng
Schlagworte:	Annealing Atomic force microscopes Atomic force microscopy Characterization and Evaluation of Materials Chemistry and Materials Science Composition Cracks Dependence Field emission microscopy Materials Science Microscopes Nanocrystals Optical and Electronic Materials Pinholes Raman spectra Raman spectroscopy Scanning electron microscopy Spectrum analysis Thin films Zinc tellurides
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