Structural, Optical and Sensing Behavior of Neodymium-Doped Vanadium Pentoxide Thin Films
In this study, nanocrystals of vanadium pentoxide (V 2 O 5 ) thin films were manufactured by chemical spray pyrolysis technique. A precursor solution of 0.05 M VCl 5 was prepared using distilled water. Neodymium (Nd)-doped vanadium oxide films were fabricated, increasing the neodymium chloride by ra...
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| Veröffentlicht in: | Iranian journal of science and technology. Transaction A, Science Science, 2018-12, Vol.42 (4), p.2375-2386 |
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| container_title | Iranian journal of science and technology. Transaction A, Science |
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| creator | Ali, Iftikhar M. Rzaij, Jamal M. Abbas, Qayes A. Ibrahim, Isam M. Alatta, Hassan J. |
| description | In this study, nanocrystals of vanadium pentoxide (V
2
O
5
) thin films were manufactured by chemical spray pyrolysis technique. A precursor solution of 0.05 M VCl
5
was prepared using distilled water. Neodymium (Nd)-doped vanadium oxide films were fabricated, increasing the neodymium chloride by ratios of 0, 3, 5, 7 and 9% in separate solutions. These precursor solutions have been utilized to grow films of undoped V
2
O
5
and doped with Nd on the p-type Si (111) porous silicon (PS) and glass substrates at temperatures of 250 °C. The structural, optical, electrical and gas sensing properties were studied. The analysis of the structural and optical properties of the thin films shows the effect of doping rates on the characteristics of vanadium oxide. The X-ray diffraction investigation resulted in a polycrystalline nature of the orthorhombic structure with the preferred direction of (010) with nano-grain sizes. Atomic force microscopy (AFM) was used to characterize the morphological properties of the films. Undoped V
2
O
5
and doped V
2
O
5
with various concentrations of Nd films directly allowed the transition of the band gap. The sensitivity of NO
2
and H
2
gases for various doping ratios of Nd at different operating temperatures was measured. |
| doi_str_mv | 10.1007/s40995-018-0553-5 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2136862781</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2136862781</sourcerecordid><originalsourceid>FETCH-LOGICAL-c316t-7e17287f645d209c0285dcc2a13bc7a953b3e3567d8502302973854bdf16de6c3</originalsourceid><addsrcrecordid>eNp1kEtLAzEUhYMoWGp_gLuAW6N5TJKZpVarQrFCq-AqZJJMG5mXyYzYf--UEVy5ulw459x7PgDOCb4iGMvrmOAs4wiTFGHOGeJHYEKZSBBJSXYMJgTTFAkqxSmYxehzzAgRkiZiAt7XXehN1wddXsJV23mjS6hrC9eujr7ewlu301--CbAp4LNr7L7yfYXumtZZ-KZrbYcVvri6a769dXCz8zVc-LKKZ-Ck0GV0s985Ba-L-838ES1XD0_zmyUyjIgOSUckTWUhEm4pzszwKrfGUE1YbqTOOMuZY1xIm3JMGaaZZClPclsQYZ0wbAouxtw2NJ-9i536aPpQDycVJUykQ--UDCoyqkxoYgyuUG3wlQ57RbA6QFQjRDVAVAeIig8eOnrioK23Lvwl_2_6Adquc1k</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2136862781</pqid></control><display><type>article</type><title>Structural, Optical and Sensing Behavior of Neodymium-Doped Vanadium Pentoxide Thin Films</title><source>Alma/SFX Local Collection</source><creator>Ali, Iftikhar M. ; Rzaij, Jamal M. ; Abbas, Qayes A. ; Ibrahim, Isam M. ; Alatta, Hassan J.</creator><creatorcontrib>Ali, Iftikhar M. ; Rzaij, Jamal M. ; Abbas, Qayes A. ; Ibrahim, Isam M. ; Alatta, Hassan J.</creatorcontrib><description>In this study, nanocrystals of vanadium pentoxide (V
2
O
5
) thin films were manufactured by chemical spray pyrolysis technique. A precursor solution of 0.05 M VCl
5
was prepared using distilled water. Neodymium (Nd)-doped vanadium oxide films were fabricated, increasing the neodymium chloride by ratios of 0, 3, 5, 7 and 9% in separate solutions. These precursor solutions have been utilized to grow films of undoped V
2
O
5
and doped with Nd on the p-type Si (111) porous silicon (PS) and glass substrates at temperatures of 250 °C. The structural, optical, electrical and gas sensing properties were studied. The analysis of the structural and optical properties of the thin films shows the effect of doping rates on the characteristics of vanadium oxide. The X-ray diffraction investigation resulted in a polycrystalline nature of the orthorhombic structure with the preferred direction of (010) with nano-grain sizes. Atomic force microscopy (AFM) was used to characterize the morphological properties of the films. Undoped V
2
O
5
and doped V
2
O
5
with various concentrations of Nd films directly allowed the transition of the band gap. The sensitivity of NO
2
and H
2
gases for various doping ratios of Nd at different operating temperatures was measured.</description><identifier>ISSN: 1028-6276</identifier><identifier>EISSN: 2364-1819</identifier><identifier>DOI: 10.1007/s40995-018-0553-5</identifier><language>eng</language><publisher>Cham: Springer International Publishing</publisher><subject>Atomic force microscopy ; Chemistry/Food Science ; Distilled water ; Doping ; Earth Sciences ; Electrons ; Engineering ; Gas sensors ; Gases ; Glass substrates ; Grain ; Investigations ; Life Sciences ; Materials Science ; Metal oxides ; Microscopy ; Neodymium ; Operating temperature ; Optical properties ; Organic chemistry ; Oxide coatings ; Physics ; Porous silicon ; Precursors ; Pyrolysis ; Radiation ; Research Paper ; Sensors ; Silicon substrates ; Silicon wafers ; Spray pyrolysis ; Studies ; Temperature ; Thin films ; Vanadium ; Vanadium oxides ; Vanadium pentoxide ; X-ray diffraction</subject><ispartof>Iranian journal of science and technology. Transaction A, Science, 2018-12, Vol.42 (4), p.2375-2386</ispartof><rights>Shiraz University 2018</rights><rights>Copyright Springer Science & Business Media 2018</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c316t-7e17287f645d209c0285dcc2a13bc7a953b3e3567d8502302973854bdf16de6c3</citedby><cites>FETCH-LOGICAL-c316t-7e17287f645d209c0285dcc2a13bc7a953b3e3567d8502302973854bdf16de6c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,777,781,27905,27906</link.rule.ids></links><search><creatorcontrib>Ali, Iftikhar M.</creatorcontrib><creatorcontrib>Rzaij, Jamal M.</creatorcontrib><creatorcontrib>Abbas, Qayes A.</creatorcontrib><creatorcontrib>Ibrahim, Isam M.</creatorcontrib><creatorcontrib>Alatta, Hassan J.</creatorcontrib><title>Structural, Optical and Sensing Behavior of Neodymium-Doped Vanadium Pentoxide Thin Films</title><title>Iranian journal of science and technology. Transaction A, Science</title><addtitle>Iran J Sci Technol Trans Sci</addtitle><description>In this study, nanocrystals of vanadium pentoxide (V
2
O
5
) thin films were manufactured by chemical spray pyrolysis technique. A precursor solution of 0.05 M VCl
5
was prepared using distilled water. Neodymium (Nd)-doped vanadium oxide films were fabricated, increasing the neodymium chloride by ratios of 0, 3, 5, 7 and 9% in separate solutions. These precursor solutions have been utilized to grow films of undoped V
2
O
5
and doped with Nd on the p-type Si (111) porous silicon (PS) and glass substrates at temperatures of 250 °C. The structural, optical, electrical and gas sensing properties were studied. The analysis of the structural and optical properties of the thin films shows the effect of doping rates on the characteristics of vanadium oxide. The X-ray diffraction investigation resulted in a polycrystalline nature of the orthorhombic structure with the preferred direction of (010) with nano-grain sizes. Atomic force microscopy (AFM) was used to characterize the morphological properties of the films. Undoped V
2
O
5
and doped V
2
O
5
with various concentrations of Nd films directly allowed the transition of the band gap. The sensitivity of NO
2
and H
2
gases for various doping ratios of Nd at different operating temperatures was measured.</description><subject>Atomic force microscopy</subject><subject>Chemistry/Food Science</subject><subject>Distilled water</subject><subject>Doping</subject><subject>Earth Sciences</subject><subject>Electrons</subject><subject>Engineering</subject><subject>Gas sensors</subject><subject>Gases</subject><subject>Glass substrates</subject><subject>Grain</subject><subject>Investigations</subject><subject>Life Sciences</subject><subject>Materials Science</subject><subject>Metal oxides</subject><subject>Microscopy</subject><subject>Neodymium</subject><subject>Operating temperature</subject><subject>Optical properties</subject><subject>Organic chemistry</subject><subject>Oxide coatings</subject><subject>Physics</subject><subject>Porous silicon</subject><subject>Precursors</subject><subject>Pyrolysis</subject><subject>Radiation</subject><subject>Research Paper</subject><subject>Sensors</subject><subject>Silicon substrates</subject><subject>Silicon wafers</subject><subject>Spray pyrolysis</subject><subject>Studies</subject><subject>Temperature</subject><subject>Thin films</subject><subject>Vanadium</subject><subject>Vanadium oxides</subject><subject>Vanadium pentoxide</subject><subject>X-ray diffraction</subject><issn>1028-6276</issn><issn>2364-1819</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><sourceid>8G5</sourceid><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><sourceid>GUQSH</sourceid><sourceid>M2O</sourceid><recordid>eNp1kEtLAzEUhYMoWGp_gLuAW6N5TJKZpVarQrFCq-AqZJJMG5mXyYzYf--UEVy5ulw459x7PgDOCb4iGMvrmOAs4wiTFGHOGeJHYEKZSBBJSXYMJgTTFAkqxSmYxehzzAgRkiZiAt7XXehN1wddXsJV23mjS6hrC9eujr7ewlu301--CbAp4LNr7L7yfYXumtZZ-KZrbYcVvri6a769dXCz8zVc-LKKZ-Ck0GV0s985Ba-L-838ES1XD0_zmyUyjIgOSUckTWUhEm4pzszwKrfGUE1YbqTOOMuZY1xIm3JMGaaZZClPclsQYZ0wbAouxtw2NJ-9i536aPpQDycVJUykQ--UDCoyqkxoYgyuUG3wlQ57RbA6QFQjRDVAVAeIig8eOnrioK23Lvwl_2_6Adquc1k</recordid><startdate>20181201</startdate><enddate>20181201</enddate><creator>Ali, Iftikhar M.</creator><creator>Rzaij, Jamal 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Optical and Sensing Behavior of Neodymium-Doped Vanadium Pentoxide Thin Films</title><author>Ali, Iftikhar M. ; Rzaij, Jamal M. ; Abbas, Qayes A. ; Ibrahim, Isam M. ; Alatta, Hassan J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c316t-7e17287f645d209c0285dcc2a13bc7a953b3e3567d8502302973854bdf16de6c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Atomic force microscopy</topic><topic>Chemistry/Food Science</topic><topic>Distilled water</topic><topic>Doping</topic><topic>Earth Sciences</topic><topic>Electrons</topic><topic>Engineering</topic><topic>Gas sensors</topic><topic>Gases</topic><topic>Glass substrates</topic><topic>Grain</topic><topic>Investigations</topic><topic>Life Sciences</topic><topic>Materials Science</topic><topic>Metal oxides</topic><topic>Microscopy</topic><topic>Neodymium</topic><topic>Operating temperature</topic><topic>Optical properties</topic><topic>Organic chemistry</topic><topic>Oxide coatings</topic><topic>Physics</topic><topic>Porous silicon</topic><topic>Precursors</topic><topic>Pyrolysis</topic><topic>Radiation</topic><topic>Research Paper</topic><topic>Sensors</topic><topic>Silicon substrates</topic><topic>Silicon wafers</topic><topic>Spray pyrolysis</topic><topic>Studies</topic><topic>Temperature</topic><topic>Thin films</topic><topic>Vanadium</topic><topic>Vanadium oxides</topic><topic>Vanadium pentoxide</topic><topic>X-ray diffraction</topic><toplevel>online_resources</toplevel><creatorcontrib>Ali, Iftikhar M.</creatorcontrib><creatorcontrib>Rzaij, Jamal M.</creatorcontrib><creatorcontrib>Abbas, Qayes A.</creatorcontrib><creatorcontrib>Ibrahim, Isam M.</creatorcontrib><creatorcontrib>Alatta, Hassan J.</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & 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Transaction A, Science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ali, Iftikhar M.</au><au>Rzaij, Jamal M.</au><au>Abbas, Qayes A.</au><au>Ibrahim, Isam M.</au><au>Alatta, Hassan J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Structural, Optical and Sensing Behavior of Neodymium-Doped Vanadium Pentoxide Thin Films</atitle><jtitle>Iranian journal of science and technology. Transaction A, Science</jtitle><stitle>Iran J Sci Technol Trans Sci</stitle><date>2018-12-01</date><risdate>2018</risdate><volume>42</volume><issue>4</issue><spage>2375</spage><epage>2386</epage><pages>2375-2386</pages><issn>1028-6276</issn><eissn>2364-1819</eissn><abstract>In this study, nanocrystals of vanadium pentoxide (V
2
O
5
) thin films were manufactured by chemical spray pyrolysis technique. A precursor solution of 0.05 M VCl
5
was prepared using distilled water. Neodymium (Nd)-doped vanadium oxide films were fabricated, increasing the neodymium chloride by ratios of 0, 3, 5, 7 and 9% in separate solutions. These precursor solutions have been utilized to grow films of undoped V
2
O
5
and doped with Nd on the p-type Si (111) porous silicon (PS) and glass substrates at temperatures of 250 °C. The structural, optical, electrical and gas sensing properties were studied. The analysis of the structural and optical properties of the thin films shows the effect of doping rates on the characteristics of vanadium oxide. The X-ray diffraction investigation resulted in a polycrystalline nature of the orthorhombic structure with the preferred direction of (010) with nano-grain sizes. Atomic force microscopy (AFM) was used to characterize the morphological properties of the films. Undoped V
2
O
5
and doped V
2
O
5
with various concentrations of Nd films directly allowed the transition of the band gap. The sensitivity of NO
2
and H
2
gases for various doping ratios of Nd at different operating temperatures was measured.</abstract><cop>Cham</cop><pub>Springer International Publishing</pub><doi>10.1007/s40995-018-0553-5</doi><tpages>12</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 1028-6276 |
| ispartof | Iranian journal of science and technology. Transaction A, Science, 2018-12, Vol.42 (4), p.2375-2386 |
| issn | 1028-6276 2364-1819 |
| language | eng |
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| source | Alma/SFX Local Collection |
| subjects | Atomic force microscopy Chemistry/Food Science Distilled water Doping Earth Sciences Electrons Engineering Gas sensors Gases Glass substrates Grain Investigations Life Sciences Materials Science Metal oxides Microscopy Neodymium Operating temperature Optical properties Organic chemistry Oxide coatings Physics Porous silicon Precursors Pyrolysis Radiation Research Paper Sensors Silicon substrates Silicon wafers Spray pyrolysis Studies Temperature Thin films Vanadium Vanadium oxides Vanadium pentoxide X-ray diffraction |
| title | Structural, Optical and Sensing Behavior of Neodymium-Doped Vanadium Pentoxide Thin Films |
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