Correlation of structural and optical properties in as-prepared and annealed Bi^sub 2^Se^sub 3^ thin films
Bi2Se3 bulk alloys were synthesized using a standard mono-temperature melting process and used as source materials to deposit thin films on non-conductive super cleaned glass substrates by a vacuum thermal evaporation technique. Both bulk and thin-film samples were polycrystalline as confirmed by X-...
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Veröffentlicht in: | Journal of materials processing technology 2019-02, Vol.264, p.76 |
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description | Bi2Se3 bulk alloys were synthesized using a standard mono-temperature melting process and used as source materials to deposit thin films on non-conductive super cleaned glass substrates by a vacuum thermal evaporation technique. Both bulk and thin-film samples were polycrystalline as confirmed by X-ray diffraction patterns. The film samples were subjected to the annealing process in air atmosphere at 250 and 300 ℃ for 3 h, aiming to boost the optical properties, in particular, to enhance the light transmission. The surface roughness, morphology and granular structure were investigated by atomic force microscope and scanning/transmission electron microscopes. The correlation between structural changes due to annealing and optical properties was observed. For a higher annealing temperature of 300 ℃, the coefficient of transmittance increased reaching 80–90% in the IR range. Consequently, the absorption coefficient greatly decreased by annealing, especially for low photon energies. The optical band gap corresponds to the direct transition and increased notably by annealing from 1.51 to 1.83 eV. The spectra of optical parameters including the refraction index, coefficient of extinction and complex-valued dielectric function were deduced from the transmittance/reflection measurements to evaluate the effect of annealing. The energy loss functions were also estimated demonstrating that the volume and surface energy losses are of the same order. |
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Both bulk and thin-film samples were polycrystalline as confirmed by X-ray diffraction patterns. The film samples were subjected to the annealing process in air atmosphere at 250 and 300 ℃ for 3 h, aiming to boost the optical properties, in particular, to enhance the light transmission. The surface roughness, morphology and granular structure were investigated by atomic force microscope and scanning/transmission electron microscopes. The correlation between structural changes due to annealing and optical properties was observed. For a higher annealing temperature of 300 ℃, the coefficient of transmittance increased reaching 80–90% in the IR range. Consequently, the absorption coefficient greatly decreased by annealing, especially for low photon energies. The optical band gap corresponds to the direct transition and increased notably by annealing from 1.51 to 1.83 eV. The spectra of optical parameters including the refraction index, coefficient of extinction and complex-valued dielectric function were deduced from the transmittance/reflection measurements to evaluate the effect of annealing. The energy loss functions were also estimated demonstrating that the volume and surface energy losses are of the same order.</description><identifier>ISSN: 0924-0136</identifier><identifier>EISSN: 1873-4774</identifier><language>eng</language><publisher>Amsterdam: Elsevier BV</publisher><subject>Absorptivity ; Alloys ; Annealing ; Atomic force microscopy ; Correlation analysis ; Diffraction patterns ; Energy dissipation ; Glass substrates ; Light transmission ; Microscopes ; Morphology ; Optical properties ; Photonic band gaps ; Scanning electron microscopy ; Surface energy ; Surface roughness ; Thin films ; Transmittance ; Vacuum thermal evaporation ; X ray spectra ; X-ray diffraction</subject><ispartof>Journal of materials processing technology, 2019-02, Vol.264, p.76</ispartof><rights>Copyright Elsevier BV Feb 2019</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784</link.rule.ids></links><search><creatorcontrib>Adam, AM</creatorcontrib><creatorcontrib>Lilov, E</creatorcontrib><creatorcontrib>Ibrahim, EMM</creatorcontrib><creatorcontrib>Petkov, P</creatorcontrib><creatorcontrib>Panina, LV</creatorcontrib><creatorcontrib>Darwish, MA</creatorcontrib><title>Correlation of structural and optical properties in as-prepared and annealed Bi^sub 2^Se^sub 3^ thin films</title><title>Journal of materials processing technology</title><description>Bi2Se3 bulk alloys were synthesized using a standard mono-temperature melting process and used as source materials to deposit thin films on non-conductive super cleaned glass substrates by a vacuum thermal evaporation technique. Both bulk and thin-film samples were polycrystalline as confirmed by X-ray diffraction patterns. The film samples were subjected to the annealing process in air atmosphere at 250 and 300 ℃ for 3 h, aiming to boost the optical properties, in particular, to enhance the light transmission. The surface roughness, morphology and granular structure were investigated by atomic force microscope and scanning/transmission electron microscopes. The correlation between structural changes due to annealing and optical properties was observed. For a higher annealing temperature of 300 ℃, the coefficient of transmittance increased reaching 80–90% in the IR range. Consequently, the absorption coefficient greatly decreased by annealing, especially for low photon energies. The optical band gap corresponds to the direct transition and increased notably by annealing from 1.51 to 1.83 eV. The spectra of optical parameters including the refraction index, coefficient of extinction and complex-valued dielectric function were deduced from the transmittance/reflection measurements to evaluate the effect of annealing. The energy loss functions were also estimated demonstrating that the volume and surface energy losses are of the same order.</description><subject>Absorptivity</subject><subject>Alloys</subject><subject>Annealing</subject><subject>Atomic force microscopy</subject><subject>Correlation analysis</subject><subject>Diffraction patterns</subject><subject>Energy dissipation</subject><subject>Glass substrates</subject><subject>Light transmission</subject><subject>Microscopes</subject><subject>Morphology</subject><subject>Optical properties</subject><subject>Photonic band gaps</subject><subject>Scanning electron microscopy</subject><subject>Surface energy</subject><subject>Surface roughness</subject><subject>Thin films</subject><subject>Transmittance</subject><subject>Vacuum thermal evaporation</subject><subject>X ray spectra</subject><subject>X-ray diffraction</subject><issn>0924-0136</issn><issn>1873-4774</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNqNTksKwjAUDKJg_dwh4LqQNtXWrUVxr-tK1FdMiUl8L7m_oXgAVzPDfJgJy4qmlnlV19WUZWJfVrko5G7OFkSDEEUtmiZjQ-sQwaigneWu5xQwPkJEZbiyT-580I_EPToPGDQQ15Yryj2CVwjPMaWsBWWSOOiO4p2X3QVGIjseXqnQa_OmFZv1yhCsf7hkm9Px2p7TlvtEoHAbXESbrFuZjm4LWVZb-V_qCyxbSY0</recordid><startdate>20190201</startdate><enddate>20190201</enddate><creator>Adam, AM</creator><creator>Lilov, E</creator><creator>Ibrahim, EMM</creator><creator>Petkov, P</creator><creator>Panina, LV</creator><creator>Darwish, MA</creator><general>Elsevier BV</general><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>H8D</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20190201</creationdate><title>Correlation of structural and optical properties in as-prepared and annealed Bi^sub 2^Se^sub 3^ thin films</title><author>Adam, AM ; Lilov, E ; Ibrahim, EMM ; Petkov, P ; Panina, LV ; Darwish, MA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-proquest_journals_21365132453</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Absorptivity</topic><topic>Alloys</topic><topic>Annealing</topic><topic>Atomic force microscopy</topic><topic>Correlation analysis</topic><topic>Diffraction patterns</topic><topic>Energy dissipation</topic><topic>Glass substrates</topic><topic>Light transmission</topic><topic>Microscopes</topic><topic>Morphology</topic><topic>Optical properties</topic><topic>Photonic band gaps</topic><topic>Scanning electron microscopy</topic><topic>Surface energy</topic><topic>Surface roughness</topic><topic>Thin films</topic><topic>Transmittance</topic><topic>Vacuum thermal evaporation</topic><topic>X ray spectra</topic><topic>X-ray diffraction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Adam, AM</creatorcontrib><creatorcontrib>Lilov, E</creatorcontrib><creatorcontrib>Ibrahim, EMM</creatorcontrib><creatorcontrib>Petkov, P</creatorcontrib><creatorcontrib>Panina, LV</creatorcontrib><creatorcontrib>Darwish, MA</creatorcontrib><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of materials processing technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Adam, AM</au><au>Lilov, E</au><au>Ibrahim, EMM</au><au>Petkov, P</au><au>Panina, LV</au><au>Darwish, MA</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Correlation of structural and optical properties in as-prepared and annealed Bi^sub 2^Se^sub 3^ thin films</atitle><jtitle>Journal of materials processing technology</jtitle><date>2019-02-01</date><risdate>2019</risdate><volume>264</volume><spage>76</spage><pages>76-</pages><issn>0924-0136</issn><eissn>1873-4774</eissn><abstract>Bi2Se3 bulk alloys were synthesized using a standard mono-temperature melting process and used as source materials to deposit thin films on non-conductive super cleaned glass substrates by a vacuum thermal evaporation technique. Both bulk and thin-film samples were polycrystalline as confirmed by X-ray diffraction patterns. The film samples were subjected to the annealing process in air atmosphere at 250 and 300 ℃ for 3 h, aiming to boost the optical properties, in particular, to enhance the light transmission. The surface roughness, morphology and granular structure were investigated by atomic force microscope and scanning/transmission electron microscopes. The correlation between structural changes due to annealing and optical properties was observed. For a higher annealing temperature of 300 ℃, the coefficient of transmittance increased reaching 80–90% in the IR range. Consequently, the absorption coefficient greatly decreased by annealing, especially for low photon energies. The optical band gap corresponds to the direct transition and increased notably by annealing from 1.51 to 1.83 eV. The spectra of optical parameters including the refraction index, coefficient of extinction and complex-valued dielectric function were deduced from the transmittance/reflection measurements to evaluate the effect of annealing. The energy loss functions were also estimated demonstrating that the volume and surface energy losses are of the same order.</abstract><cop>Amsterdam</cop><pub>Elsevier BV</pub></addata></record> |
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subjects | Absorptivity Alloys Annealing Atomic force microscopy Correlation analysis Diffraction patterns Energy dissipation Glass substrates Light transmission Microscopes Morphology Optical properties Photonic band gaps Scanning electron microscopy Surface energy Surface roughness Thin films Transmittance Vacuum thermal evaporation X ray spectra X-ray diffraction |
title | Correlation of structural and optical properties in as-prepared and annealed Bi^sub 2^Se^sub 3^ thin films |
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