On board electronic devices safety provided by DICE-based Muller C-elements
Space radiation interacting with electronic components of on-board computing or navigation unit can bring to it's malfunction. Using error tolerant electronic components is a key factor ensuring safety of Space missions. The Muller C-element is one of the main part of the asynchronous circuits...
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| Veröffentlicht in: | Acta astronautica 2018-09, Vol.150, p.28-32 |
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| container_title | Acta astronautica |
| container_volume | 150 |
| creator | Danilov, I.A. Gorbunov, M.S. Shnaider, A.I. Balbekov, A.O. Rogatkin, Y.B. Bobkov, S.G. |
| description | Space radiation interacting with electronic components of on-board computing or navigation unit can bring to it's malfunction. Using error tolerant electronic components is a key factor ensuring safety of Space missions. The Muller C-element is one of the main part of the asynchronous circuits and also can be found in synchronous ones. Being sequential by its nature, it is vulnerable to single event upsets. We propose three CMOS circuit implementations of a soft error tolerant Muller C-element, whose tolerance is achieved by using of the well-known DICE-principle and is proved by SPICE simulations. |
| doi_str_mv | 10.1016/j.actaastro.2018.01.019 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2135604451</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0094576518300316</els_id><sourcerecordid>2135604451</sourcerecordid><originalsourceid>FETCH-LOGICAL-c343t-f058b337d6aec54f06970e8bc73847cf1239006bc8da80e68143549ae1b75a1b3</originalsourceid><addsrcrecordid>eNqFkN9LwzAQx4MoOKd_gwGfOy9N0qSPo84fONmLPockvUJL186kG-y_N2Piq3BwHHy_37v7EHLPYMGAFY_dwvrJ2jiFcZED0wtgqcoLMmNalVkOHC7JDKAUmVSFvCY3MXYAoHJdzsj7ZqButKGm2KNPGUPraY2H1mOk0TY4HekujIe2xpq6I316q1aZszFNH_u-x0CrLDm3OEzxllw1to9499vn5Ot59Vm9ZuvNy1u1XGeeCz5lDUjtOFd1YdFL0UBRKkDtvOJaKN-wnJcAhfO6thqw0ExwKUqLzClpmeNz8nDOTYd97zFOphv3YUgrTc64LEAIyZJKnVU-jDEGbMwutFsbjoaBOZEznfkjZ07kDLBUZXIuz05MTxxaDCb6FgePdRsSI1OP7b8ZPwSrek8</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2135604451</pqid></control><display><type>article</type><title>On board electronic devices safety provided by DICE-based Muller C-elements</title><source>Elsevier ScienceDirect Journals</source><creator>Danilov, I.A. ; Gorbunov, M.S. ; Shnaider, A.I. ; Balbekov, A.O. ; Rogatkin, Y.B. ; Bobkov, S.G.</creator><creatorcontrib>Danilov, I.A. ; Gorbunov, M.S. ; Shnaider, A.I. ; Balbekov, A.O. ; Rogatkin, Y.B. ; Bobkov, S.G.</creatorcontrib><description>Space radiation interacting with electronic components of on-board computing or navigation unit can bring to it's malfunction. Using error tolerant electronic components is a key factor ensuring safety of Space missions. The Muller C-element is one of the main part of the asynchronous circuits and also can be found in synchronous ones. Being sequential by its nature, it is vulnerable to single event upsets. We propose three CMOS circuit implementations of a soft error tolerant Muller C-element, whose tolerance is achieved by using of the well-known DICE-principle and is proved by SPICE simulations.</description><identifier>ISSN: 0094-5765</identifier><identifier>EISSN: 1879-2030</identifier><identifier>DOI: 10.1016/j.actaastro.2018.01.019</identifier><language>eng</language><publisher>Elmsford: Elsevier Ltd</publisher><subject>Asynchronous circuits ; C-element ; CMOS ; Computer simulation ; Dual interlocked cell ; Electronic components ; Electronic devices ; Extraterrestrial radiation ; Flight simulation ; Navigation ; Navigation systems ; Radiation ; Radiation hardening by design ; Safety ; Single event upset ; Single event upsets ; Soft error ; Space exploration ; Space missions</subject><ispartof>Acta astronautica, 2018-09, Vol.150, p.28-32</ispartof><rights>2018 IAA</rights><rights>Copyright Elsevier BV Sep 2018</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c343t-f058b337d6aec54f06970e8bc73847cf1239006bc8da80e68143549ae1b75a1b3</citedby><cites>FETCH-LOGICAL-c343t-f058b337d6aec54f06970e8bc73847cf1239006bc8da80e68143549ae1b75a1b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S0094576518300316$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3537,27901,27902,65306</link.rule.ids></links><search><creatorcontrib>Danilov, I.A.</creatorcontrib><creatorcontrib>Gorbunov, M.S.</creatorcontrib><creatorcontrib>Shnaider, A.I.</creatorcontrib><creatorcontrib>Balbekov, A.O.</creatorcontrib><creatorcontrib>Rogatkin, Y.B.</creatorcontrib><creatorcontrib>Bobkov, S.G.</creatorcontrib><title>On board electronic devices safety provided by DICE-based Muller C-elements</title><title>Acta astronautica</title><description>Space radiation interacting with electronic components of on-board computing or navigation unit can bring to it's malfunction. Using error tolerant electronic components is a key factor ensuring safety of Space missions. The Muller C-element is one of the main part of the asynchronous circuits and also can be found in synchronous ones. Being sequential by its nature, it is vulnerable to single event upsets. We propose three CMOS circuit implementations of a soft error tolerant Muller C-element, whose tolerance is achieved by using of the well-known DICE-principle and is proved by SPICE simulations.</description><subject>Asynchronous circuits</subject><subject>C-element</subject><subject>CMOS</subject><subject>Computer simulation</subject><subject>Dual interlocked cell</subject><subject>Electronic components</subject><subject>Electronic devices</subject><subject>Extraterrestrial radiation</subject><subject>Flight simulation</subject><subject>Navigation</subject><subject>Navigation systems</subject><subject>Radiation</subject><subject>Radiation hardening by design</subject><subject>Safety</subject><subject>Single event upset</subject><subject>Single event upsets</subject><subject>Soft error</subject><subject>Space exploration</subject><subject>Space missions</subject><issn>0094-5765</issn><issn>1879-2030</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><recordid>eNqFkN9LwzAQx4MoOKd_gwGfOy9N0qSPo84fONmLPockvUJL186kG-y_N2Piq3BwHHy_37v7EHLPYMGAFY_dwvrJ2jiFcZED0wtgqcoLMmNalVkOHC7JDKAUmVSFvCY3MXYAoHJdzsj7ZqButKGm2KNPGUPraY2H1mOk0TY4HekujIe2xpq6I316q1aZszFNH_u-x0CrLDm3OEzxllw1to9499vn5Ot59Vm9ZuvNy1u1XGeeCz5lDUjtOFd1YdFL0UBRKkDtvOJaKN-wnJcAhfO6thqw0ExwKUqLzClpmeNz8nDOTYd97zFOphv3YUgrTc64LEAIyZJKnVU-jDEGbMwutFsbjoaBOZEznfkjZ07kDLBUZXIuz05MTxxaDCb6FgePdRsSI1OP7b8ZPwSrek8</recordid><startdate>201809</startdate><enddate>201809</enddate><creator>Danilov, I.A.</creator><creator>Gorbunov, M.S.</creator><creator>Shnaider, A.I.</creator><creator>Balbekov, A.O.</creator><creator>Rogatkin, Y.B.</creator><creator>Bobkov, S.G.</creator><general>Elsevier Ltd</general><general>Elsevier BV</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7TB</scope><scope>7TG</scope><scope>8FD</scope><scope>FR3</scope><scope>H8D</scope><scope>KL.</scope><scope>L7M</scope></search><sort><creationdate>201809</creationdate><title>On board electronic devices safety provided by DICE-based Muller C-elements</title><author>Danilov, I.A. ; Gorbunov, M.S. ; Shnaider, A.I. ; Balbekov, A.O. ; Rogatkin, Y.B. ; Bobkov, S.G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c343t-f058b337d6aec54f06970e8bc73847cf1239006bc8da80e68143549ae1b75a1b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Asynchronous circuits</topic><topic>C-element</topic><topic>CMOS</topic><topic>Computer simulation</topic><topic>Dual interlocked cell</topic><topic>Electronic components</topic><topic>Electronic devices</topic><topic>Extraterrestrial radiation</topic><topic>Flight simulation</topic><topic>Navigation</topic><topic>Navigation systems</topic><topic>Radiation</topic><topic>Radiation hardening by design</topic><topic>Safety</topic><topic>Single event upset</topic><topic>Single event upsets</topic><topic>Soft error</topic><topic>Space exploration</topic><topic>Space missions</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Danilov, I.A.</creatorcontrib><creatorcontrib>Gorbunov, M.S.</creatorcontrib><creatorcontrib>Shnaider, A.I.</creatorcontrib><creatorcontrib>Balbekov, A.O.</creatorcontrib><creatorcontrib>Rogatkin, Y.B.</creatorcontrib><creatorcontrib>Bobkov, S.G.</creatorcontrib><collection>CrossRef</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Meteorological & Geoastrophysical Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><collection>Meteorological & Geoastrophysical Abstracts - Academic</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Acta astronautica</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Danilov, I.A.</au><au>Gorbunov, M.S.</au><au>Shnaider, A.I.</au><au>Balbekov, A.O.</au><au>Rogatkin, Y.B.</au><au>Bobkov, S.G.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>On board electronic devices safety provided by DICE-based Muller C-elements</atitle><jtitle>Acta astronautica</jtitle><date>2018-09</date><risdate>2018</risdate><volume>150</volume><spage>28</spage><epage>32</epage><pages>28-32</pages><issn>0094-5765</issn><eissn>1879-2030</eissn><abstract>Space radiation interacting with electronic components of on-board computing or navigation unit can bring to it's malfunction. Using error tolerant electronic components is a key factor ensuring safety of Space missions. The Muller C-element is one of the main part of the asynchronous circuits and also can be found in synchronous ones. Being sequential by its nature, it is vulnerable to single event upsets. We propose three CMOS circuit implementations of a soft error tolerant Muller C-element, whose tolerance is achieved by using of the well-known DICE-principle and is proved by SPICE simulations.</abstract><cop>Elmsford</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.actaastro.2018.01.019</doi><tpages>5</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0094-5765 |
| ispartof | Acta astronautica, 2018-09, Vol.150, p.28-32 |
| issn | 0094-5765 1879-2030 |
| language | eng |
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| source | Elsevier ScienceDirect Journals |
| subjects | Asynchronous circuits C-element CMOS Computer simulation Dual interlocked cell Electronic components Electronic devices Extraterrestrial radiation Flight simulation Navigation Navigation systems Radiation Radiation hardening by design Safety Single event upset Single event upsets Soft error Space exploration Space missions |
| title | On board electronic devices safety provided by DICE-based Muller C-elements |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-08T06%3A00%3A59IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=On%20board%20electronic%20devices%20safety%20provided%20by%20DICE-based%20Muller%20C-elements&rft.jtitle=Acta%20astronautica&rft.au=Danilov,%20I.A.&rft.date=2018-09&rft.volume=150&rft.spage=28&rft.epage=32&rft.pages=28-32&rft.issn=0094-5765&rft.eissn=1879-2030&rft_id=info:doi/10.1016/j.actaastro.2018.01.019&rft_dat=%3Cproquest_cross%3E2135604451%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2135604451&rft_id=info:pmid/&rft_els_id=S0094576518300316&rfr_iscdi=true |