Measurement and Analysis of Statistical IC Operation Errors in a Memory Module Due to System-Level ESD Noise

Voltage noise and operation errors in an integrated circuit (IC) due to electrostatic discharge (ESD) events were measured, validated, and analyzed in this paper. A simplified structure of a laptop personal computer and an IC with a D-type flip-flop were designed and manufactured for the experimenta...

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Veröffentlicht in:	IEEE transactions on electromagnetic compatibility 2019-02, Vol.61 (1), p.29-39
Hauptverfasser:	Park, Myungjoon, Park, Junsik, Choi, Joungcheul, Kim, Jinwoo, Jeong, Seonghoon, Seung, Manho, Lee, Seokkiu, Kim, Jingook
Format:	Artikel
Sprache:	eng
Schlagworte:	Computer memory Computer simulation Conduction noise Decoupling decoupling capacitor (de-cap) dual in-line memory module (DIMM) electrostatic discharge (ESD) Electrostatic discharges error ratio Failure flip-flop Generators Integrated circuit modeling Integrated circuits Noise measurement Personal computers Portable computers shielding soft failure Static electricity Voltage measurement Waveforms
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