Generation Methodology for Good-Enough Approximate Modules of ATMR

Approximate triple modular redundancy (ATMR) is sought for logic masking of soft errors while effectuating lower area overhead than conventional TMR through the introduction of approximate modules. However, the use of approximate modules instigates reduced fault coverage in ATMR. In this work, we ta...

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Veröffentlicht in:	Journal of electronic testing 2018-12, Vol.34 (6), p.651-665
Hauptverfasser:	Hassan, Abdus Sami, Arifeen, Tooba, Moradian, Hossein, Lee, Jeong-A
Format:	Artikel
Sprache:	eng
Schlagworte:	CAE) and Design Circuits and Systems Clustering Computer-Aided Engineering (CAD Electrical Engineering Engineering Fault detection Heuristic methods Masking Modules Optimization techniques Reduction Redundancy Soft errors
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