Terahertz techniques for solar cell imaging

Terahertz techniques for solar cell imaging

Rapid development in fabrication of solar cells requires innovations in characterization of the layers. Particular attention deserves structural imperfections which cannot be directly investigated by optical methods in a visible range. In this paper, we present two terahertz (THz) imaging approaches...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Minkevičius, L, Suzanovičienė, R, Molis, G, Krotkus, A, Balakauskas, S, Venckevičius, R, Kašalynas, I, Šimkienė, I, Valušis, G, Tamošiūnas, V
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Continuous radiation
Imaging
Optics
Photovoltaic cells
Solar cells
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 376
container_issue 1
container_start_page
container_title
container_volume 1566
creator Minkevičius, L
Suzanovičienė, R
Molis, G
Krotkus, A
Balakauskas, S
Venckevičius, R
Kašalynas, I
Šimkienė, I
Valušis, G
Tamošiūnas, V
description Rapid development in fabrication of solar cells requires innovations in characterization of the layers. Particular attention deserves structural imperfections which cannot be directly investigated by optical methods in a visible range. In this paper, we present two terahertz (THz) imaging approaches - Terahertz-Time Domain spectroscopy (THz-TDS)-based and continuous wave (CW) -based THz imaging - which can successfully serve as powerful experimental tool for versatile characterization of the solar cells.
doi_str_mv 10.1063/1.4848442
format Conference Proceeding
fullrecord <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_journals_2127768706</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2127768706</sourcerecordid><originalsourceid>FETCH-LOGICAL-p183t-4314783e0ac705a1467c0a4e6baec363425d0cbb24cbb67990b47ebce9a54fc23</originalsourceid><addsrcrecordid>eNotj09LAzEUxIMouFYPfoMFj5L6krzk7R6l-A8KXlrorSTxbbtl3a3J9uKnd0UZmLn9ZkaIWwVzBc48qDlWk1CfiUJZqyQ55c5FAVCj1Gg2l-Iq5wOAromqQtyvOPk9p_G7HDnu-_brxLlshlTmofOpjNx1Zfvpd22_uxYXje8y3_znTKyfn1aLV7l8f3lbPC7lUVVmlGgUUmUYfCSwXqGjCB7ZBc_ROIPafkAMQeNkjuoaAhKHyLW32ERtZuLuj3tMw--ccXsYTqmfKrdaaSJX0XT1B7tjQnE</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype><pqid>2127768706</pqid></control><display><type>conference_proceeding</type><title>Terahertz techniques for solar cell imaging</title><source>AIP Journals Complete</source><creator>Minkevičius, L ; Suzanovičienė, R ; Molis, G ; Krotkus, A ; Balakauskas, S ; Venckevičius, R ; Kašalynas, I ; Šimkienė, I ; Valušis, G ; Tamošiūnas, V</creator><creatorcontrib>Minkevičius, L ; Suzanovičienė, R ; Molis, G ; Krotkus, A ; Balakauskas, S ; Venckevičius, R ; Kašalynas, I ; Šimkienė, I ; Valušis, G ; Tamošiūnas, V</creatorcontrib><description>Rapid development in fabrication of solar cells requires innovations in characterization of the layers. Particular attention deserves structural imperfections which cannot be directly investigated by optical methods in a visible range. In this paper, we present two terahertz (THz) imaging approaches - Terahertz-Time Domain spectroscopy (THz-TDS)-based and continuous wave (CW) -based THz imaging - which can successfully serve as powerful experimental tool for versatile characterization of the solar cells.</description><identifier>ISSN: 0094-243X</identifier><identifier>EISSN: 1551-7616</identifier><identifier>DOI: 10.1063/1.4848442</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Continuous radiation ; Imaging ; Optics ; Photovoltaic cells ; Solar cells</subject><ispartof>AIP Conference Proceedings, 2013, Vol.1566 (1), p.376</ispartof><rights>2013 AIP Publishing LLC.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,310,780,784,789,790,23930,23931,25140,27925</link.rule.ids></links><search><creatorcontrib>Minkevičius, L</creatorcontrib><creatorcontrib>Suzanovičienė, R</creatorcontrib><creatorcontrib>Molis, G</creatorcontrib><creatorcontrib>Krotkus, A</creatorcontrib><creatorcontrib>Balakauskas, S</creatorcontrib><creatorcontrib>Venckevičius, R</creatorcontrib><creatorcontrib>Kašalynas, I</creatorcontrib><creatorcontrib>Šimkienė, I</creatorcontrib><creatorcontrib>Valušis, G</creatorcontrib><creatorcontrib>Tamošiūnas, V</creatorcontrib><title>Terahertz techniques for solar cell imaging</title><title>AIP Conference Proceedings</title><description>Rapid development in fabrication of solar cells requires innovations in characterization of the layers. Particular attention deserves structural imperfections which cannot be directly investigated by optical methods in a visible range. In this paper, we present two terahertz (THz) imaging approaches - Terahertz-Time Domain spectroscopy (THz-TDS)-based and continuous wave (CW) -based THz imaging - which can successfully serve as powerful experimental tool for versatile characterization of the solar cells.</description><subject>Continuous radiation</subject><subject>Imaging</subject><subject>Optics</subject><subject>Photovoltaic cells</subject><subject>Solar cells</subject><issn>0094-243X</issn><issn>1551-7616</issn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2013</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNotj09LAzEUxIMouFYPfoMFj5L6krzk7R6l-A8KXlrorSTxbbtl3a3J9uKnd0UZmLn9ZkaIWwVzBc48qDlWk1CfiUJZqyQ55c5FAVCj1Gg2l-Iq5wOAromqQtyvOPk9p_G7HDnu-_brxLlshlTmofOpjNx1Zfvpd22_uxYXje8y3_znTKyfn1aLV7l8f3lbPC7lUVVmlGgUUmUYfCSwXqGjCB7ZBc_ROIPafkAMQeNkjuoaAhKHyLW32ERtZuLuj3tMw--ccXsYTqmfKrdaaSJX0XT1B7tjQnE</recordid><startdate>20131204</startdate><enddate>20131204</enddate><creator>Minkevičius, L</creator><creator>Suzanovičienė, R</creator><creator>Molis, G</creator><creator>Krotkus, A</creator><creator>Balakauskas, S</creator><creator>Venckevičius, R</creator><creator>Kašalynas, I</creator><creator>Šimkienė, I</creator><creator>Valušis, G</creator><creator>Tamošiūnas, V</creator><general>American Institute of Physics</general><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20131204</creationdate><title>Terahertz techniques for solar cell imaging</title><author>Minkevičius, L ; Suzanovičienė, R ; Molis, G ; Krotkus, A ; Balakauskas, S ; Venckevičius, R ; Kašalynas, I ; Šimkienė, I ; Valušis, G ; Tamošiūnas, V</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p183t-4314783e0ac705a1467c0a4e6baec363425d0cbb24cbb67990b47ebce9a54fc23</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Continuous radiation</topic><topic>Imaging</topic><topic>Optics</topic><topic>Photovoltaic cells</topic><topic>Solar cells</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Minkevičius, L</creatorcontrib><creatorcontrib>Suzanovičienė, R</creatorcontrib><creatorcontrib>Molis, G</creatorcontrib><creatorcontrib>Krotkus, A</creatorcontrib><creatorcontrib>Balakauskas, S</creatorcontrib><creatorcontrib>Venckevičius, R</creatorcontrib><creatorcontrib>Kašalynas, I</creatorcontrib><creatorcontrib>Šimkienė, I</creatorcontrib><creatorcontrib>Valušis, G</creatorcontrib><creatorcontrib>Tamošiūnas, V</creatorcontrib><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Minkevičius, L</au><au>Suzanovičienė, R</au><au>Molis, G</au><au>Krotkus, A</au><au>Balakauskas, S</au><au>Venckevičius, R</au><au>Kašalynas, I</au><au>Šimkienė, I</au><au>Valušis, G</au><au>Tamošiūnas, V</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Terahertz techniques for solar cell imaging</atitle><btitle>AIP Conference Proceedings</btitle><date>2013-12-04</date><risdate>2013</risdate><volume>1566</volume><issue>1</issue><epage>376</epage><issn>0094-243X</issn><eissn>1551-7616</eissn><abstract>Rapid development in fabrication of solar cells requires innovations in characterization of the layers. Particular attention deserves structural imperfections which cannot be directly investigated by optical methods in a visible range. In this paper, we present two terahertz (THz) imaging approaches - Terahertz-Time Domain spectroscopy (THz-TDS)-based and continuous wave (CW) -based THz imaging - which can successfully serve as powerful experimental tool for versatile characterization of the solar cells.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/1.4848442</doi></addata></record>
fulltext fulltext
identifier ISSN: 0094-243X
ispartof AIP Conference Proceedings, 2013, Vol.1566 (1), p.376
issn 0094-243X
1551-7616
language eng
recordid cdi_proquest_journals_2127768706
source AIP Journals Complete
subjects Continuous radiation
Imaging
Optics
Photovoltaic cells
Solar cells
title Terahertz techniques for solar cell imaging
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-03T08%3A57%3A19IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Terahertz%20techniques%20for%20solar%20cell%20imaging&rft.btitle=AIP%20Conference%20Proceedings&rft.au=Minkevi%C4%8Dius,%20L&rft.date=2013-12-04&rft.volume=1566&rft.issue=1&rft.epage=376&rft.issn=0094-243X&rft.eissn=1551-7616&rft_id=info:doi/10.1063/1.4848442&rft_dat=%3Cproquest%3E2127768706%3C/proquest%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2127768706&rft_id=info:pmid/&rfr_iscdi=true