Microstructure of highly strained BiFeO3 thin films: Transmission electron microscopy and electron-energy loss spectroscopy studies

Microstructure and electronic structure of highly strained bismuth ferrite (BiFeO3) thin films grown on lanthanum aluminate substrates are studied using high-resolution transmission and scanning transmission electron microscopies and electron energy loss spectroscopy (EELS). Monoclinic and tetragona...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Journal of applied physics 2014-01, Vol.115 (4)
Hauptverfasser:	Heon Kim, Young, Bhatnagar, Akash, Pippel, Eckhard, Alexe, Marin, Hesse, Dietrich
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied physics Bismuth ferrite Electron energy loss spectroscopy Electronic structure Electrons Energy dissipation Energy transmission First principles Iron Lanthanum Microstructure Phases Spectrum analysis Substrates Thin films Transmission electron microscopy
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Schreiben Sie den ersten Kommentar!