Quasistatics and electrodynamics of near-field microwave microscope
Probe impedance Z = R + iX of a near-field microwave microscope (NFM) is investigated within the electrodynamic (ED) and quasistatic (QS) theories. It is shown that ED and QS resistances R may differ appreciably even if the QS applicability condition is met. This contradiction is inherent in probing...
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description | Probe impedance Z = R + iX of a near-field microwave microscope (NFM) is investigated within the electrodynamic (ED) and quasistatic (QS) theories. It is shown that ED and QS resistances R may differ appreciably even if the QS applicability condition is met. This contradiction is inherent in probing of weakly absorbing or resonating objects. There is also a long-range effect in this case, consisting in that variation of components X, R with a change in the probe-object distance is characterized by two spatial scales hx and hr, with hr ≫ hx. It is also shown that resistance R results from addition of the wave, RW, and quasistatic, RQ, components. The effects under study are of the wave nature, i.e., they are realized given RW > RQ. Component RW is taken into account in the ED, but neglected in the QS theory. On the contrary, for reactance X both theories lead to similar results in all of the considered cases. We also discuss the methods for calculation of the NFM probing depth. It is shown that a correct analysis of this depth should be based on investigation of the NFM response to some object being moved in the near-field zone of the probe. |
doi_str_mv | 10.1063/1.4866324 |
format | Article |
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It is shown that ED and QS resistances R may differ appreciably even if the QS applicability condition is met. This contradiction is inherent in probing of weakly absorbing or resonating objects. There is also a long-range effect in this case, consisting in that variation of components X, R with a change in the probe-object distance is characterized by two spatial scales hx and hr, with hr ≫ hx. It is also shown that resistance R results from addition of the wave, RW, and quasistatic, RQ, components. The effects under study are of the wave nature, i.e., they are realized given RW > RQ. Component RW is taken into account in the ED, but neglected in the QS theory. On the contrary, for reactance X both theories lead to similar results in all of the considered cases. We also discuss the methods for calculation of the NFM probing depth. It is shown that a correct analysis of this depth should be based on investigation of the NFM response to some object being moved in the near-field zone of the probe.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.4866324</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Applied physics ; Electrodynamics ; Reactance</subject><ispartof>Journal of applied physics, 2014-02, Vol.115 (8)</ispartof><rights>2014 AIP Publishing LLC.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c323t-cc480d9ce9f8b54010fde7a9fbff13ad6136ed0fabbd2b159dca7658f1d69ecb3</citedby><cites>FETCH-LOGICAL-c323t-cc480d9ce9f8b54010fde7a9fbff13ad6136ed0fabbd2b159dca7658f1d69ecb3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,778,782,27913,27914</link.rule.ids></links><search><creatorcontrib>Reznik, Alexander N.</creatorcontrib><title>Quasistatics and electrodynamics of near-field microwave microscope</title><title>Journal of applied physics</title><description>Probe impedance Z = R + iX of a near-field microwave microscope (NFM) is investigated within the electrodynamic (ED) and quasistatic (QS) theories. It is shown that ED and QS resistances R may differ appreciably even if the QS applicability condition is met. This contradiction is inherent in probing of weakly absorbing or resonating objects. There is also a long-range effect in this case, consisting in that variation of components X, R with a change in the probe-object distance is characterized by two spatial scales hx and hr, with hr ≫ hx. It is also shown that resistance R results from addition of the wave, RW, and quasistatic, RQ, components. The effects under study are of the wave nature, i.e., they are realized given RW > RQ. Component RW is taken into account in the ED, but neglected in the QS theory. On the contrary, for reactance X both theories lead to similar results in all of the considered cases. We also discuss the methods for calculation of the NFM probing depth. It is shown that a correct analysis of this depth should be based on investigation of the NFM response to some object being moved in the near-field zone of the probe.</description><subject>Applied physics</subject><subject>Electrodynamics</subject><subject>Reactance</subject><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNotUFFLwzAYDKLgnD74Dwo--dD5fUmbJo8ydAoDEfQ5pMkX6OjamXTK_r0t3dMdx3F3HGP3CCsEKZ5wVSgpBS8u2AJB6bwqS7hkCwCOudKVvmY3Ke0AEJXQC7b-PNrUpMEOjUuZ7XxGLbkh9v7U2f2k9SHryMY8NNT6bJRi_2d_aWbJ9Qe6ZVfBtonuzrhk368vX-u3fPuxeV8_b3MnuBhy5woFXjvSQdVlAQjBU2V1qENAYb1EIclDsHXteY2l9s5WslQBvdTkarFkD3PuIfY_R0qD2fXH2I2VhiOvKi5KJUbX4-ya5qVIwRxis7fxZBDM9JFBc_5I_API21o6</recordid><startdate>20140228</startdate><enddate>20140228</enddate><creator>Reznik, Alexander N.</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20140228</creationdate><title>Quasistatics and electrodynamics of near-field microwave microscope</title><author>Reznik, Alexander N.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c323t-cc480d9ce9f8b54010fde7a9fbff13ad6136ed0fabbd2b159dca7658f1d69ecb3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Applied physics</topic><topic>Electrodynamics</topic><topic>Reactance</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Reznik, Alexander N.</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Reznik, Alexander N.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Quasistatics and electrodynamics of near-field microwave microscope</atitle><jtitle>Journal of applied physics</jtitle><date>2014-02-28</date><risdate>2014</risdate><volume>115</volume><issue>8</issue><issn>0021-8979</issn><eissn>1089-7550</eissn><abstract>Probe impedance Z = R + iX of a near-field microwave microscope (NFM) is investigated within the electrodynamic (ED) and quasistatic (QS) theories. It is shown that ED and QS resistances R may differ appreciably even if the QS applicability condition is met. This contradiction is inherent in probing of weakly absorbing or resonating objects. There is also a long-range effect in this case, consisting in that variation of components X, R with a change in the probe-object distance is characterized by two spatial scales hx and hr, with hr ≫ hx. It is also shown that resistance R results from addition of the wave, RW, and quasistatic, RQ, components. The effects under study are of the wave nature, i.e., they are realized given RW > RQ. Component RW is taken into account in the ED, but neglected in the QS theory. On the contrary, for reactance X both theories lead to similar results in all of the considered cases. We also discuss the methods for calculation of the NFM probing depth. It is shown that a correct analysis of this depth should be based on investigation of the NFM response to some object being moved in the near-field zone of the probe.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/1.4866324</doi></addata></record> |
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title | Quasistatics and electrodynamics of near-field microwave microscope |
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