Blind Calibration Method for Two-Channel Time-Interleaved Analog-to-Digital Converters Based on FFT
Time-interleaved analog-to-digital(TIADC) is an effective way to improve the sampling rate of an analog-to-digital converter(ADC) system. However, the unavoidable timing mismatch, gain mismatch and offset mismatch significantly degrade the performance of TIADC. In this paper, a blind calibration alg...
Gespeichert in:
| Veröffentlicht in: | Journal of electronic testing 2018-12, Vol.34 (6), p.643-650 |
|---|---|
| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 650 |
|---|---|
| container_issue | 6 |
| container_start_page | 643 |
| container_title | Journal of electronic testing |
| container_volume | 34 |
| creator | Bai, Xu Hu, Hui Li, Wanjun Liu, Fulu |
| description | Time-interleaved analog-to-digital(TIADC) is an effective way to improve the sampling rate of an analog-to-digital converter(ADC) system. However, the unavoidable timing mismatch, gain mismatch and offset mismatch significantly degrade the performance of TIADC. In this paper, a blind calibration algorithm based on Fast Fourier Transform Algorithm(FFT) is proposed for the gain, offset and timing mismatches in a two-channel TIADC system. The explicit amplitude relationships between the input signal and the spurs caused by mismatches are derived in the frequency domain. With the explicit amplitude relationships, the frequency component of the input signal, which has the maximal energy, is used to estimate the gain and timing mismatches. The amplitude spectrum of the spur caused by offset mismatch is used to estimate the offset mismatch. The proposed algorithm needs no extra circuits and no training signal and can dynamically track the changes of the mismatches. Simulations show that the estimation errors are no more than 4%. Finally, a two-channel TIADC prototype is used to verify and demonstrate the proposed algorithm. |
| doi_str_mv | 10.1007/s10836-018-5758-1 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2126731940</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2126731940</sourcerecordid><originalsourceid>FETCH-LOGICAL-c316t-4f326449176360ba246c4481bceda11e6aa36e348e04904a213fc7e6d1ab521f3</originalsourceid><addsrcrecordid>eNp1kLFOwzAURS0EEqXwAWyWmA1-tmMnYxsoIBWxhNlyEqdNldrFTov4e1wViYnpLedcPR2EboHeA6XqIQLNuSQUcpKpLCdwhiaQKU6oYuocTWjBOMlBiUt0FeOGJodlcoKa-dC7Fpdm6Otgxt47_GbHtW9x5wOuvjwp18Y5O-Cq31ry6kYbBmsOtsUzZwa_IqMnj_2qH82AS-8ONiQi4rmJCUlri0V1jS46M0R783un6GPxVJUvZPn-_FrOlqThIEciOs6kEAUoySWtDROyESKHurGtAbDSGC4tF7mloqDCMOBdo6xswdQZg45P0d1pdxf8597GUW_8PqQvo2bApOJQCJooOFFN8DEG2-ld6LcmfGug-thSn1rq1FIfW2pIDjs5MbFuZcPf8v_SD0IKdaE</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2126731940</pqid></control><display><type>article</type><title>Blind Calibration Method for Two-Channel Time-Interleaved Analog-to-Digital Converters Based on FFT</title><source>SpringerLink Journals - AutoHoldings</source><creator>Bai, Xu ; Hu, Hui ; Li, Wanjun ; Liu, Fulu</creator><creatorcontrib>Bai, Xu ; Hu, Hui ; Li, Wanjun ; Liu, Fulu</creatorcontrib><description>Time-interleaved analog-to-digital(TIADC) is an effective way to improve the sampling rate of an analog-to-digital converter(ADC) system. However, the unavoidable timing mismatch, gain mismatch and offset mismatch significantly degrade the performance of TIADC. In this paper, a blind calibration algorithm based on Fast Fourier Transform Algorithm(FFT) is proposed for the gain, offset and timing mismatches in a two-channel TIADC system. The explicit amplitude relationships between the input signal and the spurs caused by mismatches are derived in the frequency domain. With the explicit amplitude relationships, the frequency component of the input signal, which has the maximal energy, is used to estimate the gain and timing mismatches. The amplitude spectrum of the spur caused by offset mismatch is used to estimate the offset mismatch. The proposed algorithm needs no extra circuits and no training signal and can dynamically track the changes of the mismatches. Simulations show that the estimation errors are no more than 4%. Finally, a two-channel TIADC prototype is used to verify and demonstrate the proposed algorithm.</description><identifier>ISSN: 0923-8174</identifier><identifier>EISSN: 1573-0727</identifier><identifier>DOI: 10.1007/s10836-018-5758-1</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Algorithms ; Amplitudes ; Analog to digital conversion ; Analog to digital converters ; CAE) and Design ; Calibration ; Circuits and Systems ; Computer simulation ; Computer-Aided Engineering (CAD ; Electrical Engineering ; Engineering ; Fast Fourier transformations ; Fourier transforms ; Performance degradation</subject><ispartof>Journal of electronic testing, 2018-12, Vol.34 (6), p.643-650</ispartof><rights>Springer Science+Business Media, LLC, part of Springer Nature 2018</rights><rights>Journal of Electronic Testing is a copyright of Springer, (2018). All Rights Reserved.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c316t-4f326449176360ba246c4481bceda11e6aa36e348e04904a213fc7e6d1ab521f3</citedby><cites>FETCH-LOGICAL-c316t-4f326449176360ba246c4481bceda11e6aa36e348e04904a213fc7e6d1ab521f3</cites><orcidid>0000-0002-2853-9361</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10836-018-5758-1$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10836-018-5758-1$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,41488,42557,51319</link.rule.ids></links><search><creatorcontrib>Bai, Xu</creatorcontrib><creatorcontrib>Hu, Hui</creatorcontrib><creatorcontrib>Li, Wanjun</creatorcontrib><creatorcontrib>Liu, Fulu</creatorcontrib><title>Blind Calibration Method for Two-Channel Time-Interleaved Analog-to-Digital Converters Based on FFT</title><title>Journal of electronic testing</title><addtitle>J Electron Test</addtitle><description>Time-interleaved analog-to-digital(TIADC) is an effective way to improve the sampling rate of an analog-to-digital converter(ADC) system. However, the unavoidable timing mismatch, gain mismatch and offset mismatch significantly degrade the performance of TIADC. In this paper, a blind calibration algorithm based on Fast Fourier Transform Algorithm(FFT) is proposed for the gain, offset and timing mismatches in a two-channel TIADC system. The explicit amplitude relationships between the input signal and the spurs caused by mismatches are derived in the frequency domain. With the explicit amplitude relationships, the frequency component of the input signal, which has the maximal energy, is used to estimate the gain and timing mismatches. The amplitude spectrum of the spur caused by offset mismatch is used to estimate the offset mismatch. The proposed algorithm needs no extra circuits and no training signal and can dynamically track the changes of the mismatches. Simulations show that the estimation errors are no more than 4%. Finally, a two-channel TIADC prototype is used to verify and demonstrate the proposed algorithm.</description><subject>Algorithms</subject><subject>Amplitudes</subject><subject>Analog to digital conversion</subject><subject>Analog to digital converters</subject><subject>CAE) and Design</subject><subject>Calibration</subject><subject>Circuits and Systems</subject><subject>Computer simulation</subject><subject>Computer-Aided Engineering (CAD</subject><subject>Electrical Engineering</subject><subject>Engineering</subject><subject>Fast Fourier transformations</subject><subject>Fourier transforms</subject><subject>Performance degradation</subject><issn>0923-8174</issn><issn>1573-0727</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNp1kLFOwzAURS0EEqXwAWyWmA1-tmMnYxsoIBWxhNlyEqdNldrFTov4e1wViYnpLedcPR2EboHeA6XqIQLNuSQUcpKpLCdwhiaQKU6oYuocTWjBOMlBiUt0FeOGJodlcoKa-dC7Fpdm6Otgxt47_GbHtW9x5wOuvjwp18Y5O-Cq31ry6kYbBmsOtsUzZwa_IqMnj_2qH82AS-8ONiQi4rmJCUlri0V1jS46M0R783un6GPxVJUvZPn-_FrOlqThIEciOs6kEAUoySWtDROyESKHurGtAbDSGC4tF7mloqDCMOBdo6xswdQZg45P0d1pdxf8597GUW_8PqQvo2bApOJQCJooOFFN8DEG2-ld6LcmfGug-thSn1rq1FIfW2pIDjs5MbFuZcPf8v_SD0IKdaE</recordid><startdate>20181201</startdate><enddate>20181201</enddate><creator>Bai, Xu</creator><creator>Hu, Hui</creator><creator>Li, Wanjun</creator><creator>Liu, Fulu</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7QF</scope><scope>7QQ</scope><scope>7SC</scope><scope>7SE</scope><scope>7SP</scope><scope>7SR</scope><scope>7TA</scope><scope>7TB</scope><scope>7U5</scope><scope>7XB</scope><scope>88I</scope><scope>88K</scope><scope>8AO</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>F28</scope><scope>FR3</scope><scope>GNUQQ</scope><scope>H8D</scope><scope>H8G</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>JQ2</scope><scope>KR7</scope><scope>L6V</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>M2P</scope><scope>M2T</scope><scope>M7S</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>Q9U</scope><scope>S0W</scope><orcidid>https://orcid.org/0000-0002-2853-9361</orcidid></search><sort><creationdate>20181201</creationdate><title>Blind Calibration Method for Two-Channel Time-Interleaved Analog-to-Digital Converters Based on FFT</title><author>Bai, Xu ; Hu, Hui ; Li, Wanjun ; Liu, Fulu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c316t-4f326449176360ba246c4481bceda11e6aa36e348e04904a213fc7e6d1ab521f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Algorithms</topic><topic>Amplitudes</topic><topic>Analog to digital conversion</topic><topic>Analog to digital converters</topic><topic>CAE) and Design</topic><topic>Calibration</topic><topic>Circuits and Systems</topic><topic>Computer simulation</topic><topic>Computer-Aided Engineering (CAD</topic><topic>Electrical Engineering</topic><topic>Engineering</topic><topic>Fast Fourier transformations</topic><topic>Fourier transforms</topic><topic>Performance degradation</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Bai, Xu</creatorcontrib><creatorcontrib>Hu, Hui</creatorcontrib><creatorcontrib>Li, Wanjun</creatorcontrib><creatorcontrib>Liu, Fulu</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Aluminium Industry Abstracts</collection><collection>Ceramic Abstracts</collection><collection>Computer and Information Systems Abstracts</collection><collection>Corrosion Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Materials Business File</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Science Database (Alumni Edition)</collection><collection>Telecommunications (Alumni Edition)</collection><collection>ProQuest Pharma Collection</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>ProQuest Central Student</collection><collection>Aerospace Database</collection><collection>Copper Technical Reference Library</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Civil Engineering Abstracts</collection><collection>ProQuest Engineering Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Science Database</collection><collection>Telecommunications Database</collection><collection>Engineering Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>ProQuest Central Basic</collection><collection>DELNET Engineering & Technology Collection</collection><jtitle>Journal of electronic testing</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Bai, Xu</au><au>Hu, Hui</au><au>Li, Wanjun</au><au>Liu, Fulu</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Blind Calibration Method for Two-Channel Time-Interleaved Analog-to-Digital Converters Based on FFT</atitle><jtitle>Journal of electronic testing</jtitle><stitle>J Electron Test</stitle><date>2018-12-01</date><risdate>2018</risdate><volume>34</volume><issue>6</issue><spage>643</spage><epage>650</epage><pages>643-650</pages><issn>0923-8174</issn><eissn>1573-0727</eissn><abstract>Time-interleaved analog-to-digital(TIADC) is an effective way to improve the sampling rate of an analog-to-digital converter(ADC) system. However, the unavoidable timing mismatch, gain mismatch and offset mismatch significantly degrade the performance of TIADC. In this paper, a blind calibration algorithm based on Fast Fourier Transform Algorithm(FFT) is proposed for the gain, offset and timing mismatches in a two-channel TIADC system. The explicit amplitude relationships between the input signal and the spurs caused by mismatches are derived in the frequency domain. With the explicit amplitude relationships, the frequency component of the input signal, which has the maximal energy, is used to estimate the gain and timing mismatches. The amplitude spectrum of the spur caused by offset mismatch is used to estimate the offset mismatch. The proposed algorithm needs no extra circuits and no training signal and can dynamically track the changes of the mismatches. Simulations show that the estimation errors are no more than 4%. Finally, a two-channel TIADC prototype is used to verify and demonstrate the proposed algorithm.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10836-018-5758-1</doi><tpages>8</tpages><orcidid>https://orcid.org/0000-0002-2853-9361</orcidid></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0923-8174 |
| ispartof | Journal of electronic testing, 2018-12, Vol.34 (6), p.643-650 |
| issn | 0923-8174 1573-0727 |
| language | eng |
| recordid | cdi_proquest_journals_2126731940 |
| source | SpringerLink Journals - AutoHoldings |
| subjects | Algorithms Amplitudes Analog to digital conversion Analog to digital converters CAE) and Design Calibration Circuits and Systems Computer simulation Computer-Aided Engineering (CAD Electrical Engineering Engineering Fast Fourier transformations Fourier transforms Performance degradation |
| title | Blind Calibration Method for Two-Channel Time-Interleaved Analog-to-Digital Converters Based on FFT |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T19%3A34%3A26IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Blind%20Calibration%20Method%20for%20Two-Channel%20Time-Interleaved%20Analog-to-Digital%20Converters%20Based%20on%20FFT&rft.jtitle=Journal%20of%20electronic%20testing&rft.au=Bai,%20Xu&rft.date=2018-12-01&rft.volume=34&rft.issue=6&rft.spage=643&rft.epage=650&rft.pages=643-650&rft.issn=0923-8174&rft.eissn=1573-0727&rft_id=info:doi/10.1007/s10836-018-5758-1&rft_dat=%3Cproquest_cross%3E2126731940%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2126731940&rft_id=info:pmid/&rfr_iscdi=true |