Residual stress induced crystalline to amorphous phase transformation in Nb2O5 quantum dots

Nb2O5 quantum dots (QDs) were grown using a simple technique of vacuum thermal evaporation. QDs were found to be crystalline in nature by selected area electron diffraction (SAED) in TEM. Samples with thickness up to 20 nm did not show any significant residual strain. Residual stress effect on band...

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Veröffentlicht in:	Journal of applied physics 2014-07, Vol.116 (4)
Hauptverfasser:	Dhawan, Sahil, Dhawan, Tanuj, Vedeshwar, Agnikumar G.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied physics Crystal structure Crystallinity Dependence Electron diffraction Energy gap Film thickness Niobium oxides Phase transitions Quantum dots Residual stress Strain Vacuum thermal evaporation X ray powder diffraction X-ray diffraction
Online-Zugang:	Volltext
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