Contact resonance force microscopy with higher-eigenmode for nanoscale viscoelasticity measurements

Nanoscale viscoelastic properties are essential for polymeric materials in their wide applications in nanotechnology. Here we proposed a contact resonance force microscopy (CRFM) method for viscoelasticity measurements by utilizing a cantilever's higher-eigenmode (n > 3). Numerical analysis...

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Veröffentlicht in:	Journal of applied physics 2014-07, Vol.116 (3)
Hauptverfasser:	Zhou, Xilong, Fu, Ji, Miao, Hongchen, Li, Faxin
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied physics Damping Microscopy Nanotechnology Numerical analysis Polymethyl methacrylate Polystyrene resins Stiffness Thin films Viscoelasticity
Online-Zugang:	Volltext
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