Atomic-resolution characterization of the effects of CdCl2 treatment on poly-crystalline CdTe thin films
Poly-crystalline CdTe thin films on glass are used in commercial solar-cell superstrate devices. It is well known that post-deposition annealing of the CdTe thin films in a CdCl2 environment significantly increases the device performance, but a fundamental understanding of the effects of such anneal...
Gespeichert in:
| Veröffentlicht in: | Applied physics letters 2014-08, Vol.105 (7) |
|---|---|
| Hauptverfasser: | , , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | 7 |
| container_start_page | |
| container_title | Applied physics letters |
| container_volume | 105 |
| creator | Paulauskas, T Buurma, C Colegrove, E Guo, Z Sivananthan, S Chan M K Y Klie, R F |
| description | Poly-crystalline CdTe thin films on glass are used in commercial solar-cell superstrate devices. It is well known that post-deposition annealing of the CdTe thin films in a CdCl2 environment significantly increases the device performance, but a fundamental understanding of the effects of such annealing has not been achieved. In this Letter, we report a change in the stoichiometry across twin boundaries in CdTe and propose that native point defects alone cannot account for this variation. Upon annealing in CdCl2, we find that the stoichiometry is restored. Our experimental measurements using atomic-resolution high-angle annular dark field imaging, electron energy-loss spectroscopy, and energy dispersive X-ray spectroscopy in a scanning transmission electron microscope are supported by first-principles density functional theory calculations. |
| doi_str_mv | 10.1063/1.4893727 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_journals_2126567959</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2126567959</sourcerecordid><originalsourceid>FETCH-LOGICAL-p183t-a6bcfd5062e82657a91462c2f027ea9e5b8b039f095a3f745ffd464fd420b36c3</originalsourceid><addsrcrecordid>eNotTUtrAyEYlNJCt2kP_QcLPZv6WHU9hqUvCPSSnoNrPonBrKm6h_TX1z4uM8wwD4TuKVlSIvkjXXa95oqpC9RQohTmlPaXqCGEcCy1oNfoJudDlYJx3qD9qsSjtzhBjmEuPk6t3ZtkbIHkv8yvEV1b9tCCc2BL_pHDbgisLQlMOcJU2ho6xXDGNp1zMSH4CWpmA7Xnp9b5cMy36MqZkOHunxfo4_lpM7zi9fvL27Ba4xPtecFGjtbtBJEMeiaFMpp2klnmCFNgNIixHwnXjmhhuFOdcG7Xya4CIyOXli_Qw9_uKcXPGXLZHuKcpnq5ZbQuSqWF5t8_vVia</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2126567959</pqid></control><display><type>article</type><title>Atomic-resolution characterization of the effects of CdCl2 treatment on poly-crystalline CdTe thin films</title><source>AIP Journals Complete</source><source>Alma/SFX Local Collection</source><creator>Paulauskas, T ; Buurma, C ; Colegrove, E ; Guo, Z ; Sivananthan, S ; Chan M K Y ; Klie, R F</creator><creatorcontrib>Paulauskas, T ; Buurma, C ; Colegrove, E ; Guo, Z ; Sivananthan, S ; Chan M K Y ; Klie, R F</creatorcontrib><description>Poly-crystalline CdTe thin films on glass are used in commercial solar-cell superstrate devices. It is well known that post-deposition annealing of the CdTe thin films in a CdCl2 environment significantly increases the device performance, but a fundamental understanding of the effects of such annealing has not been achieved. In this Letter, we report a change in the stoichiometry across twin boundaries in CdTe and propose that native point defects alone cannot account for this variation. Upon annealing in CdCl2, we find that the stoichiometry is restored. Our experimental measurements using atomic-resolution high-angle annular dark field imaging, electron energy-loss spectroscopy, and energy dispersive X-ray spectroscopy in a scanning transmission electron microscope are supported by first-principles density functional theory calculations.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.4893727</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Annealing ; Applied physics ; Cadmium chloride ; Cadmium tellurides ; Crystal defects ; Crystal structure ; Crystallinity ; Defect annealing ; Density functional theory ; Electron energy ; Electron energy loss spectroscopy ; Energy dispersive X ray spectroscopy ; Energy transmission ; First principles ; Point defects ; Spectrum analysis ; Stoichiometry ; Thin films ; Twin boundaries ; X ray spectra</subject><ispartof>Applied physics letters, 2014-08, Vol.105 (7)</ispartof><rights>2014 AIP Publishing LLC.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids></links><search><creatorcontrib>Paulauskas, T</creatorcontrib><creatorcontrib>Buurma, C</creatorcontrib><creatorcontrib>Colegrove, E</creatorcontrib><creatorcontrib>Guo, Z</creatorcontrib><creatorcontrib>Sivananthan, S</creatorcontrib><creatorcontrib>Chan M K Y</creatorcontrib><creatorcontrib>Klie, R F</creatorcontrib><title>Atomic-resolution characterization of the effects of CdCl2 treatment on poly-crystalline CdTe thin films</title><title>Applied physics letters</title><description>Poly-crystalline CdTe thin films on glass are used in commercial solar-cell superstrate devices. It is well known that post-deposition annealing of the CdTe thin films in a CdCl2 environment significantly increases the device performance, but a fundamental understanding of the effects of such annealing has not been achieved. In this Letter, we report a change in the stoichiometry across twin boundaries in CdTe and propose that native point defects alone cannot account for this variation. Upon annealing in CdCl2, we find that the stoichiometry is restored. Our experimental measurements using atomic-resolution high-angle annular dark field imaging, electron energy-loss spectroscopy, and energy dispersive X-ray spectroscopy in a scanning transmission electron microscope are supported by first-principles density functional theory calculations.</description><subject>Annealing</subject><subject>Applied physics</subject><subject>Cadmium chloride</subject><subject>Cadmium tellurides</subject><subject>Crystal defects</subject><subject>Crystal structure</subject><subject>Crystallinity</subject><subject>Defect annealing</subject><subject>Density functional theory</subject><subject>Electron energy</subject><subject>Electron energy loss spectroscopy</subject><subject>Energy dispersive X ray spectroscopy</subject><subject>Energy transmission</subject><subject>First principles</subject><subject>Point defects</subject><subject>Spectrum analysis</subject><subject>Stoichiometry</subject><subject>Thin films</subject><subject>Twin boundaries</subject><subject>X ray spectra</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNotTUtrAyEYlNJCt2kP_QcLPZv6WHU9hqUvCPSSnoNrPonBrKm6h_TX1z4uM8wwD4TuKVlSIvkjXXa95oqpC9RQohTmlPaXqCGEcCy1oNfoJudDlYJx3qD9qsSjtzhBjmEuPk6t3ZtkbIHkv8yvEV1b9tCCc2BL_pHDbgisLQlMOcJU2ho6xXDGNp1zMSH4CWpmA7Xnp9b5cMy36MqZkOHunxfo4_lpM7zi9fvL27Ba4xPtecFGjtbtBJEMeiaFMpp2klnmCFNgNIixHwnXjmhhuFOdcG7Xya4CIyOXli_Qw9_uKcXPGXLZHuKcpnq5ZbQuSqWF5t8_vVia</recordid><startdate>20140818</startdate><enddate>20140818</enddate><creator>Paulauskas, T</creator><creator>Buurma, C</creator><creator>Colegrove, E</creator><creator>Guo, Z</creator><creator>Sivananthan, S</creator><creator>Chan M K Y</creator><creator>Klie, R F</creator><general>American Institute of Physics</general><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20140818</creationdate><title>Atomic-resolution characterization of the effects of CdCl2 treatment on poly-crystalline CdTe thin films</title><author>Paulauskas, T ; Buurma, C ; Colegrove, E ; Guo, Z ; Sivananthan, S ; Chan M K Y ; Klie, R F</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p183t-a6bcfd5062e82657a91462c2f027ea9e5b8b039f095a3f745ffd464fd420b36c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Annealing</topic><topic>Applied physics</topic><topic>Cadmium chloride</topic><topic>Cadmium tellurides</topic><topic>Crystal defects</topic><topic>Crystal structure</topic><topic>Crystallinity</topic><topic>Defect annealing</topic><topic>Density functional theory</topic><topic>Electron energy</topic><topic>Electron energy loss spectroscopy</topic><topic>Energy dispersive X ray spectroscopy</topic><topic>Energy transmission</topic><topic>First principles</topic><topic>Point defects</topic><topic>Spectrum analysis</topic><topic>Stoichiometry</topic><topic>Thin films</topic><topic>Twin boundaries</topic><topic>X ray spectra</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Paulauskas, T</creatorcontrib><creatorcontrib>Buurma, C</creatorcontrib><creatorcontrib>Colegrove, E</creatorcontrib><creatorcontrib>Guo, Z</creatorcontrib><creatorcontrib>Sivananthan, S</creatorcontrib><creatorcontrib>Chan M K Y</creatorcontrib><creatorcontrib>Klie, R F</creatorcontrib><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Paulauskas, T</au><au>Buurma, C</au><au>Colegrove, E</au><au>Guo, Z</au><au>Sivananthan, S</au><au>Chan M K Y</au><au>Klie, R F</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Atomic-resolution characterization of the effects of CdCl2 treatment on poly-crystalline CdTe thin films</atitle><jtitle>Applied physics letters</jtitle><date>2014-08-18</date><risdate>2014</risdate><volume>105</volume><issue>7</issue><issn>0003-6951</issn><eissn>1077-3118</eissn><abstract>Poly-crystalline CdTe thin films on glass are used in commercial solar-cell superstrate devices. It is well known that post-deposition annealing of the CdTe thin films in a CdCl2 environment significantly increases the device performance, but a fundamental understanding of the effects of such annealing has not been achieved. In this Letter, we report a change in the stoichiometry across twin boundaries in CdTe and propose that native point defects alone cannot account for this variation. Upon annealing in CdCl2, we find that the stoichiometry is restored. Our experimental measurements using atomic-resolution high-angle annular dark field imaging, electron energy-loss spectroscopy, and energy dispersive X-ray spectroscopy in a scanning transmission electron microscope are supported by first-principles density functional theory calculations.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/1.4893727</doi></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0003-6951 |
| ispartof | Applied physics letters, 2014-08, Vol.105 (7) |
| issn | 0003-6951 1077-3118 |
| language | eng |
| recordid | cdi_proquest_journals_2126567959 |
| source | AIP Journals Complete; Alma/SFX Local Collection |
| subjects | Annealing Applied physics Cadmium chloride Cadmium tellurides Crystal defects Crystal structure Crystallinity Defect annealing Density functional theory Electron energy Electron energy loss spectroscopy Energy dispersive X ray spectroscopy Energy transmission First principles Point defects Spectrum analysis Stoichiometry Thin films Twin boundaries X ray spectra |
| title | Atomic-resolution characterization of the effects of CdCl2 treatment on poly-crystalline CdTe thin films |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-16T00%3A13%3A24IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Atomic-resolution%20characterization%20of%20the%20effects%20of%20CdCl2%20treatment%20on%20poly-crystalline%20CdTe%20thin%20films&rft.jtitle=Applied%20physics%20letters&rft.au=Paulauskas,%20T&rft.date=2014-08-18&rft.volume=105&rft.issue=7&rft.issn=0003-6951&rft.eissn=1077-3118&rft_id=info:doi/10.1063/1.4893727&rft_dat=%3Cproquest%3E2126567959%3C/proquest%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2126567959&rft_id=info:pmid/&rfr_iscdi=true |