Calibration of a Chromatic Confocal Microscope for Measuring a Colored Specimen
In this paper, a color correction method is proposed to improve measurement accuracy for chromatic confocal microscopy (CCM) when measuring a colored specimen. Characteristic curve shifting due to selective reflection from color surfaces was analyzed based on a laboratory CCM system developed by the...
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Veröffentlicht in: | IEEE photonics journal 2018-12, Vol.10 (6), p.1-9 |
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description | In this paper, a color correction method is proposed to improve measurement accuracy for chromatic confocal microscopy (CCM) when measuring a colored specimen. Characteristic curve shifting due to selective reflection from color surfaces was analyzed based on a laboratory CCM system developed by the authors' team. Theoretically, when the color of the targeted surface is different from that represented by the central wavelength of the light source, the characteristic curve of CCM would have a notable deviation from that of an achromatic surface. In this study, this conclusion was verified through both simulation and experiments. Using a set of standard color calibration pieces, a color correction method was proposed accordingly to quantify the characteristic curve shifting. To validate the proposed method, a laser scanning confocal microscope Carl Zeiss LSM700 was used as the referencing system. Experimental data showed that with the color correction method, measurement errors can be controlled within 10 nm. Compared with the measurement without color correction, the measurement accuracy is significantly improved. |
doi_str_mv | 10.1109/JPHOT.2018.2875562 |
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Characteristic curve shifting due to selective reflection from color surfaces was analyzed based on a laboratory CCM system developed by the authors' team. Theoretically, when the color of the targeted surface is different from that represented by the central wavelength of the light source, the characteristic curve of CCM would have a notable deviation from that of an achromatic surface. In this study, this conclusion was verified through both simulation and experiments. Using a set of standard color calibration pieces, a color correction method was proposed accordingly to quantify the characteristic curve shifting. To validate the proposed method, a laser scanning confocal microscope Carl Zeiss LSM700 was used as the referencing system. Experimental data showed that with the color correction method, measurement errors can be controlled within 10 nm. 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(IEEE) 2018</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c405t-d59c772cc492f40cfc361158d159382e41227990a93b8ebb747732d8ebd303fc3</citedby><cites>FETCH-LOGICAL-c405t-d59c772cc492f40cfc361158d159382e41227990a93b8ebb747732d8ebd303fc3</cites><orcidid>0000-0001-8767-3889 ; 0000-0002-9378-5905</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/8496869$$EHTML$$P50$$Gieee$$Hfree_for_read</linktohtml><link.rule.ids>314,776,780,860,2096,27610,27901,27902,54908</link.rule.ids></links><search><creatorcontrib>Yu, Qing</creatorcontrib><creatorcontrib>Zhang, Kun</creatorcontrib><creatorcontrib>Zhou, Ruilan</creatorcontrib><creatorcontrib>Cui, Changcai</creatorcontrib><creatorcontrib>Cheng, Fang</creatorcontrib><creatorcontrib>Shiwei Fu</creatorcontrib><creatorcontrib>Ye, Ruifang</creatorcontrib><title>Calibration of a Chromatic Confocal Microscope for Measuring a Colored Specimen</title><title>IEEE photonics journal</title><addtitle>JPHOT</addtitle><description>In this paper, a color correction method is proposed to improve measurement accuracy for chromatic confocal microscopy (CCM) when measuring a colored specimen. Characteristic curve shifting due to selective reflection from color surfaces was analyzed based on a laboratory CCM system developed by the authors' team. Theoretically, when the color of the targeted surface is different from that represented by the central wavelength of the light source, the characteristic curve of CCM would have a notable deviation from that of an achromatic surface. In this study, this conclusion was verified through both simulation and experiments. Using a set of standard color calibration pieces, a color correction method was proposed accordingly to quantify the characteristic curve shifting. To validate the proposed method, a laser scanning confocal microscope Carl Zeiss LSM700 was used as the referencing system. Experimental data showed that with the color correction method, measurement errors can be controlled within 10 nm. Compared with the measurement without color correction, the measurement accuracy is significantly improved.</description><subject>Calibration</subject><subject>characteristic curve shifting</subject><subject>Chromatic confocal microscopy</subject><subject>Color</subject><subject>colour correction curve</subject><subject>colour specimen</subject><subject>Current measurement</subject><subject>Image color analysis</subject><subject>Light sources</subject><subject>Microscopes</subject><subject>Microscopy</subject><subject>spectral information</subject><subject>Surface waves</subject><subject>Wavelength measurement</subject><issn>1943-0655</issn><issn>1943-0647</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><sourceid>ESBDL</sourceid><sourceid>RIE</sourceid><sourceid>DOA</sourceid><recordid>eNo9kc9PwyAcxYnRxDn9B_RC4rmT35SjadTNbJmJ80wopZOlK5VuB_976Wp24gt578ODB8A9RjOMkXp6_5ivNzOCcD4jueRckAswwYrRDAkmL88z59fgpu93CAmFuZqAdWEaX0Zz8KGFoYYGFt8x7NPewiK0dbCmgStvY-ht6BysQ4QrZ_pj9O12UIcmRFfBz85Zv3ftLbiqTdO7u_91Cr5eXzbFPFuu3xbF8zKzDPFDVnFlpSTWMkVqhmxtqcCY51UKRXPiGCZEKoWMomXuylIyKSmp0lhRRJN6ChYjtwpmp7vo9yb-6mC8Ph2EuNUmpkc0TlMqFE8wmchMVcLUEjGSY4mJMsLQxHocWV0MP0fXH_QuHGOb4muCiWCCCqqSioyq4S_66OrzrRjpoQR9KkEPJej_EpLpYTR559zZkGKIXCj6ByGegHA</recordid><startdate>20181201</startdate><enddate>20181201</enddate><creator>Yu, Qing</creator><creator>Zhang, Kun</creator><creator>Zhou, Ruilan</creator><creator>Cui, Changcai</creator><creator>Cheng, Fang</creator><creator>Shiwei Fu</creator><creator>Ye, Ruifang</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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Characteristic curve shifting due to selective reflection from color surfaces was analyzed based on a laboratory CCM system developed by the authors' team. Theoretically, when the color of the targeted surface is different from that represented by the central wavelength of the light source, the characteristic curve of CCM would have a notable deviation from that of an achromatic surface. In this study, this conclusion was verified through both simulation and experiments. Using a set of standard color calibration pieces, a color correction method was proposed accordingly to quantify the characteristic curve shifting. To validate the proposed method, a laser scanning confocal microscope Carl Zeiss LSM700 was used as the referencing system. Experimental data showed that with the color correction method, measurement errors can be controlled within 10 nm. 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subjects | Calibration characteristic curve shifting Chromatic confocal microscopy Color colour correction curve colour specimen Current measurement Image color analysis Light sources Microscopes Microscopy spectral information Surface waves Wavelength measurement |
title | Calibration of a Chromatic Confocal Microscope for Measuring a Colored Specimen |
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