Degradation of CH3NH3PbI3 perovskite due to soft x-ray irradiation as analyzed by an x-ray photoelectron spectroscopy time-dependent measurement method
The effects of soft X-ray exposure on structures of CH3NH3PbI3 perovskite were investigated using an X-ray photoelectron spectroscopy (XPS) time-dependent measurement method. A crystalline sample was fabricated with the inverse-temperature crystallization method. The time evolutions of the core-leve...
Gespeichert in:
| Veröffentlicht in: | Journal of applied physics 2017-02, Vol.121 (8) |
|---|---|
| Hauptverfasser: | , , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | 8 |
| container_start_page | |
| container_title | Journal of applied physics |
| container_volume | 121 |
| creator | Motoki, Keisuke Miyazawa, Yu Kobayashi, Daisuke Ikegami, Masashi Miyasaka, Tsutomu Yamamoto, Tomoyuki Hirose, Kazuyuki |
| description | The effects of soft X-ray exposure on structures of CH3NH3PbI3 perovskite were investigated using an X-ray photoelectron spectroscopy (XPS) time-dependent measurement method. A crystalline sample was fabricated with the inverse-temperature crystallization method. The time evolutions of the core-level and valence-band spectra were recorded to determine the compositional ratios and valence band electronic structure of the sample, respectively. In addition, first-principles calculations were conducted to evaluate the valence band XPS spectra. The in situ XPS analysis combined with theoretical calculations demonstrated a degradation of the surface of CH3NH3PbI3 perovskite into PbI2 owing to the evaporation of methylammonium iodide. |
| doi_str_mv | 10.1063/1.4977238 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_scita</sourceid><recordid>TN_cdi_proquest_journals_2124543018</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2124543018</sourcerecordid><originalsourceid>FETCH-LOGICAL-c437t-f3fde7d987329f936a006c93659648ec7d27b7ddc52414a4e5cfc9d1a1eeafdb3</originalsourceid><addsrcrecordid>eNp9kL1OwzAcxC0EEqUw8AaWmEBKseMkjkdUPlqpAgaYI8f-m6a0dbCdivAivC6hqWBAYrobfnfSHUKnlIwoydglHSWC85jle2hASS4inqZkHw0IiWmUCy4O0ZH3C0IozZkYoM9reHFSy1DZNbYGjyfsfsIeyynDNTi78a9VAKwbwMFib03A75GTLa5cl6r6mPRYruWy_QCNy7bzO6ae22BhCSq4jvL11nhl6xaHagWRhhrWGtYBr0D6xsGq92Fu9TE6MHLp4WSnQ_R8e_M0nkSzh7vp-GoWqYTxEBlmNHAtcs5iYQTLJCGZ6jQVWZKD4jrmJddapXFCE5lAqowSmkoKII0u2RCd9b21s28N-FAsbOO6Nb6IaZykCSPdUUN03lOqG-AdmKJ21Uq6tqCk-P69oMXu94696FmvqrA96AfeWPcLFrU2_8F_m78AKP2UUg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2124543018</pqid></control><display><type>article</type><title>Degradation of CH3NH3PbI3 perovskite due to soft x-ray irradiation as analyzed by an x-ray photoelectron spectroscopy time-dependent measurement method</title><source>AIP Journals Complete</source><source>Alma/SFX Local Collection</source><creator>Motoki, Keisuke ; Miyazawa, Yu ; Kobayashi, Daisuke ; Ikegami, Masashi ; Miyasaka, Tsutomu ; Yamamoto, Tomoyuki ; Hirose, Kazuyuki</creator><creatorcontrib>Motoki, Keisuke ; Miyazawa, Yu ; Kobayashi, Daisuke ; Ikegami, Masashi ; Miyasaka, Tsutomu ; Yamamoto, Tomoyuki ; Hirose, Kazuyuki</creatorcontrib><description>The effects of soft X-ray exposure on structures of CH3NH3PbI3 perovskite were investigated using an X-ray photoelectron spectroscopy (XPS) time-dependent measurement method. A crystalline sample was fabricated with the inverse-temperature crystallization method. The time evolutions of the core-level and valence-band spectra were recorded to determine the compositional ratios and valence band electronic structure of the sample, respectively. In addition, first-principles calculations were conducted to evaluate the valence band XPS spectra. The in situ XPS analysis combined with theoretical calculations demonstrated a degradation of the surface of CH3NH3PbI3 perovskite into PbI2 owing to the evaporation of methylammonium iodide.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.4977238</identifier><identifier>CODEN: JAPIAU</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Applied physics ; Crystallization ; Degradation ; Electronic structure ; Electrons ; First principles ; Mathematical analysis ; Perovskites ; Soft x rays ; Spectroscopic analysis ; Spectrum analysis ; Time dependence ; Time measurement ; Valence band ; X ray irradiation ; X ray photoelectron spectroscopy ; X ray spectra</subject><ispartof>Journal of applied physics, 2017-02, Vol.121 (8)</ispartof><rights>Author(s)</rights><rights>2017 Author(s). Published by AIP Publishing.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c437t-f3fde7d987329f936a006c93659648ec7d27b7ddc52414a4e5cfc9d1a1eeafdb3</citedby><cites>FETCH-LOGICAL-c437t-f3fde7d987329f936a006c93659648ec7d27b7ddc52414a4e5cfc9d1a1eeafdb3</cites><orcidid>0000-0002-0140-8820</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/jap/article-lookup/doi/10.1063/1.4977238$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,776,780,790,4498,27903,27904,76130</link.rule.ids></links><search><creatorcontrib>Motoki, Keisuke</creatorcontrib><creatorcontrib>Miyazawa, Yu</creatorcontrib><creatorcontrib>Kobayashi, Daisuke</creatorcontrib><creatorcontrib>Ikegami, Masashi</creatorcontrib><creatorcontrib>Miyasaka, Tsutomu</creatorcontrib><creatorcontrib>Yamamoto, Tomoyuki</creatorcontrib><creatorcontrib>Hirose, Kazuyuki</creatorcontrib><title>Degradation of CH3NH3PbI3 perovskite due to soft x-ray irradiation as analyzed by an x-ray photoelectron spectroscopy time-dependent measurement method</title><title>Journal of applied physics</title><description>The effects of soft X-ray exposure on structures of CH3NH3PbI3 perovskite were investigated using an X-ray photoelectron spectroscopy (XPS) time-dependent measurement method. A crystalline sample was fabricated with the inverse-temperature crystallization method. The time evolutions of the core-level and valence-band spectra were recorded to determine the compositional ratios and valence band electronic structure of the sample, respectively. In addition, first-principles calculations were conducted to evaluate the valence band XPS spectra. The in situ XPS analysis combined with theoretical calculations demonstrated a degradation of the surface of CH3NH3PbI3 perovskite into PbI2 owing to the evaporation of methylammonium iodide.</description><subject>Applied physics</subject><subject>Crystallization</subject><subject>Degradation</subject><subject>Electronic structure</subject><subject>Electrons</subject><subject>First principles</subject><subject>Mathematical analysis</subject><subject>Perovskites</subject><subject>Soft x rays</subject><subject>Spectroscopic analysis</subject><subject>Spectrum analysis</subject><subject>Time dependence</subject><subject>Time measurement</subject><subject>Valence band</subject><subject>X ray irradiation</subject><subject>X ray photoelectron spectroscopy</subject><subject>X ray spectra</subject><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><recordid>eNp9kL1OwzAcxC0EEqUw8AaWmEBKseMkjkdUPlqpAgaYI8f-m6a0dbCdivAivC6hqWBAYrobfnfSHUKnlIwoydglHSWC85jle2hASS4inqZkHw0IiWmUCy4O0ZH3C0IozZkYoM9reHFSy1DZNbYGjyfsfsIeyynDNTi78a9VAKwbwMFib03A75GTLa5cl6r6mPRYruWy_QCNy7bzO6ae22BhCSq4jvL11nhl6xaHagWRhhrWGtYBr0D6xsGq92Fu9TE6MHLp4WSnQ_R8e_M0nkSzh7vp-GoWqYTxEBlmNHAtcs5iYQTLJCGZ6jQVWZKD4jrmJddapXFCE5lAqowSmkoKII0u2RCd9b21s28N-FAsbOO6Nb6IaZykCSPdUUN03lOqG-AdmKJ21Uq6tqCk-P69oMXu94696FmvqrA96AfeWPcLFrU2_8F_m78AKP2UUg</recordid><startdate>20170228</startdate><enddate>20170228</enddate><creator>Motoki, Keisuke</creator><creator>Miyazawa, Yu</creator><creator>Kobayashi, Daisuke</creator><creator>Ikegami, Masashi</creator><creator>Miyasaka, Tsutomu</creator><creator>Yamamoto, Tomoyuki</creator><creator>Hirose, Kazuyuki</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-0140-8820</orcidid></search><sort><creationdate>20170228</creationdate><title>Degradation of CH3NH3PbI3 perovskite due to soft x-ray irradiation as analyzed by an x-ray photoelectron spectroscopy time-dependent measurement method</title><author>Motoki, Keisuke ; Miyazawa, Yu ; Kobayashi, Daisuke ; Ikegami, Masashi ; Miyasaka, Tsutomu ; Yamamoto, Tomoyuki ; Hirose, Kazuyuki</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c437t-f3fde7d987329f936a006c93659648ec7d27b7ddc52414a4e5cfc9d1a1eeafdb3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Applied physics</topic><topic>Crystallization</topic><topic>Degradation</topic><topic>Electronic structure</topic><topic>Electrons</topic><topic>First principles</topic><topic>Mathematical analysis</topic><topic>Perovskites</topic><topic>Soft x rays</topic><topic>Spectroscopic analysis</topic><topic>Spectrum analysis</topic><topic>Time dependence</topic><topic>Time measurement</topic><topic>Valence band</topic><topic>X ray irradiation</topic><topic>X ray photoelectron spectroscopy</topic><topic>X ray spectra</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Motoki, Keisuke</creatorcontrib><creatorcontrib>Miyazawa, Yu</creatorcontrib><creatorcontrib>Kobayashi, Daisuke</creatorcontrib><creatorcontrib>Ikegami, Masashi</creatorcontrib><creatorcontrib>Miyasaka, Tsutomu</creatorcontrib><creatorcontrib>Yamamoto, Tomoyuki</creatorcontrib><creatorcontrib>Hirose, Kazuyuki</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Motoki, Keisuke</au><au>Miyazawa, Yu</au><au>Kobayashi, Daisuke</au><au>Ikegami, Masashi</au><au>Miyasaka, Tsutomu</au><au>Yamamoto, Tomoyuki</au><au>Hirose, Kazuyuki</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Degradation of CH3NH3PbI3 perovskite due to soft x-ray irradiation as analyzed by an x-ray photoelectron spectroscopy time-dependent measurement method</atitle><jtitle>Journal of applied physics</jtitle><date>2017-02-28</date><risdate>2017</risdate><volume>121</volume><issue>8</issue><issn>0021-8979</issn><eissn>1089-7550</eissn><coden>JAPIAU</coden><abstract>The effects of soft X-ray exposure on structures of CH3NH3PbI3 perovskite were investigated using an X-ray photoelectron spectroscopy (XPS) time-dependent measurement method. A crystalline sample was fabricated with the inverse-temperature crystallization method. The time evolutions of the core-level and valence-band spectra were recorded to determine the compositional ratios and valence band electronic structure of the sample, respectively. In addition, first-principles calculations were conducted to evaluate the valence band XPS spectra. The in situ XPS analysis combined with theoretical calculations demonstrated a degradation of the surface of CH3NH3PbI3 perovskite into PbI2 owing to the evaporation of methylammonium iodide.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/1.4977238</doi><tpages>4</tpages><orcidid>https://orcid.org/0000-0002-0140-8820</orcidid></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0021-8979 |
| ispartof | Journal of applied physics, 2017-02, Vol.121 (8) |
| issn | 0021-8979 1089-7550 |
| language | eng |
| recordid | cdi_proquest_journals_2124543018 |
| source | AIP Journals Complete; Alma/SFX Local Collection |
| subjects | Applied physics Crystallization Degradation Electronic structure Electrons First principles Mathematical analysis Perovskites Soft x rays Spectroscopic analysis Spectrum analysis Time dependence Time measurement Valence band X ray irradiation X ray photoelectron spectroscopy X ray spectra |
| title | Degradation of CH3NH3PbI3 perovskite due to soft x-ray irradiation as analyzed by an x-ray photoelectron spectroscopy time-dependent measurement method |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-27T14%3A18%3A30IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_scita&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Degradation%20of%20CH3NH3PbI3%20perovskite%20due%20to%20soft%20x-ray%20irradiation%20as%20analyzed%20by%20an%20x-ray%20photoelectron%20spectroscopy%20time-dependent%20measurement%20method&rft.jtitle=Journal%20of%20applied%20physics&rft.au=Motoki,%20Keisuke&rft.date=2017-02-28&rft.volume=121&rft.issue=8&rft.issn=0021-8979&rft.eissn=1089-7550&rft.coden=JAPIAU&rft_id=info:doi/10.1063/1.4977238&rft_dat=%3Cproquest_scita%3E2124543018%3C/proquest_scita%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2124543018&rft_id=info:pmid/&rfr_iscdi=true |