Applications and limitations for using ACPD in crack depth measurements
Alternating current potential drop (ACPD) testing has been established as a viable means of measuring crack depth. This paper presents experiences in using a commercially available version of this tool to generate results under flaw constraints encountered in industrial usage. Sample geometries with...
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description | Alternating current potential drop (ACPD) testing has been established as a viable means of measuring crack depth. This paper presents experiences in using a commercially available version of this tool to generate results under flaw constraints encountered in industrial usage. Sample geometries with simulated cracks were studied to examine crack depth as a percentage of through-wall thickness and with varying width of contact area adjacent to cracks. A variety of real cracks were also examined, illustrating cracking conditions that may be adequately measured using ACPD, as well as situations where crack depth may be under- or oversized. |
doi_str_mv | 10.1063/1.4940543 |
format | Conference Proceeding |
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This paper presents experiences in using a commercially available version of this tool to generate results under flaw constraints encountered in industrial usage. Sample geometries with simulated cracks were studied to examine crack depth as a percentage of through-wall thickness and with varying width of contact area adjacent to cracks. A variety of real cracks were also examined, illustrating cracking conditions that may be adequately measured using ACPD, as well as situations where crack depth may be under- or oversized.</description><identifier>ISSN: 0094-243X</identifier><identifier>EISSN: 1551-7616</identifier><identifier>DOI: 10.1063/1.4940543</identifier><identifier>CODEN: APCPCS</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Cracks ; Industrial applications ; Voltage drop ; Wall thickness</subject><ispartof>AIP conference proceedings, 2016, Vol.1706 (1)</ispartof><rights>AIP Publishing LLC</rights><rights>2016 AIP Publishing LLC.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/acp/article-lookup/doi/10.1063/1.4940543$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>310,311,315,781,785,790,791,795,4513,23934,23935,25144,27928,27929,76388</link.rule.ids></links><search><contributor>Chimenti, Dale E.</contributor><contributor>Bond, Leonard J.</contributor><creatorcontrib>Utrata, David</creatorcontrib><creatorcontrib>Enyart, Darrel A.</creatorcontrib><title>Applications and limitations for using ACPD in crack depth measurements</title><title>AIP conference proceedings</title><description>Alternating current potential drop (ACPD) testing has been established as a viable means of measuring crack depth. This paper presents experiences in using a commercially available version of this tool to generate results under flaw constraints encountered in industrial usage. Sample geometries with simulated cracks were studied to examine crack depth as a percentage of through-wall thickness and with varying width of contact area adjacent to cracks. A variety of real cracks were also examined, illustrating cracking conditions that may be adequately measured using ACPD, as well as situations where crack depth may be under- or oversized.</description><subject>Cracks</subject><subject>Industrial applications</subject><subject>Voltage drop</subject><subject>Wall thickness</subject><issn>0094-243X</issn><issn>1551-7616</issn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2016</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNp9kEtLAzEAhIMoWKsH_0HAm7A172SPpWoVBD0oeAvZPDS1uxuTXcF_b6UL3jwNAx8zzABwjtECI0Gv8ILVDHFGD8AMc44rKbA4BDOEalYRRl-PwUkpG4RILaWagfUypW20Zoh9V6DpHNzGNg6TD32GY4ndG1yunq5h7KDNxn5A59PwDltvyph967uhnIKjYLbFn006By-3N8-ru-rhcX2_Wj5UiSg1VFzW1hvWEGGCQgEZ1wjpGK69Ctw0QQaGHWVKMkECd7xpiA_Ic6q4VZYJOgcX-9yU-8_Rl0Fv-jF3u0pNMME1poLIHXW5p4qdtuiUY2vyt8ZI_x6lsZ6O-g_-6vMfqJML9AfyJGks</recordid><startdate>20160210</startdate><enddate>20160210</enddate><creator>Utrata, David</creator><creator>Enyart, Darrel A.</creator><general>American Institute of Physics</general><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20160210</creationdate><title>Applications and limitations for using ACPD in crack depth measurements</title><author>Utrata, David ; Enyart, Darrel A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p288t-579cea4b26af80f0adb67d419e8f5abf7f41d3487462f5d5bb2ef0e5385c8c463</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Cracks</topic><topic>Industrial applications</topic><topic>Voltage drop</topic><topic>Wall thickness</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Utrata, David</creatorcontrib><creatorcontrib>Enyart, Darrel A.</creatorcontrib><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Utrata, David</au><au>Enyart, Darrel A.</au><au>Chimenti, Dale E.</au><au>Bond, Leonard J.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Applications and limitations for using ACPD in crack depth measurements</atitle><btitle>AIP conference proceedings</btitle><date>2016-02-10</date><risdate>2016</risdate><volume>1706</volume><issue>1</issue><issn>0094-243X</issn><eissn>1551-7616</eissn><coden>APCPCS</coden><abstract>Alternating current potential drop (ACPD) testing has been established as a viable means of measuring crack depth. This paper presents experiences in using a commercially available version of this tool to generate results under flaw constraints encountered in industrial usage. Sample geometries with simulated cracks were studied to examine crack depth as a percentage of through-wall thickness and with varying width of contact area adjacent to cracks. A variety of real cracks were also examined, illustrating cracking conditions that may be adequately measured using ACPD, as well as situations where crack depth may be under- or oversized.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/1.4940543</doi><tpages>10</tpages><oa>free_for_read</oa></addata></record> |
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subjects | Cracks Industrial applications Voltage drop Wall thickness |
title | Applications and limitations for using ACPD in crack depth measurements |
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