Resolving amorphous solid-liquid interfaces by atomic force microscopy

Recent advancements in liquid atomic force microscopy make it an ideal technique for probing the structure of solid-liquid interfaces. Here, we present a structural study of a two-dimensional amorphous silica bilayer immersed in an aqueous solution utilizing liquid atomic force microscopy with sub-n...

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Veröffentlicht in:	Applied physics letters 2016-05, Vol.108 (20)
Hauptverfasser:	Burson, Kristen M., Gura, Leonard, Kell, Burkhard, Büchner, Christin, Lewandowski, Adrian L., Heyde, Markus, Freund, Hans-Joachim
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied physics AQUEOUS SOLUTIONS ATOMIC FORCE MICROSCOPY Bilayers CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS High vacuum Histograms INTERFACES LAYERS Liquid-solid interfaces LIQUIDS Microscopes ORIGIN PEAKS RESOLUTION SCANNING TUNNELING MICROSCOPY Silicon dioxide SOLIDS STABILITY Structural stability TUNNEL EFFECT TWO-DIMENSIONAL SYSTEMS
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