Photoexcited carrier trapping and recombination at Fe centers in GaN

Fe doped GaN was studied by time-resolved photoluminescence (PL) spectroscopy. The shape of PL transients at different temperatures and excitation powers allowed discrimination between electron and hole capture to Fe3+ and Fe2+ centers, respectively. Analysis of the internal structure of Fe ions and...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of applied physics 2016-06, Vol.119 (21)
Hauptverfasser: Uždavinys, T. K., Marcinkevičius, S., Leach, J. H., Evans, K. R., Look, D. C.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!