Dark current analysis in high-speed germanium p-i-n waveguide photodetectors

We present a dark current analysis in waveguide-coupled germanium vertical p-i-n photodetectors. In the analysis, a surface leakage current and a bulk leakage current were separated, and their activation energies were extracted. The surface leakage current originating from the minority carrier gener...

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Veröffentlicht in:	Journal of applied physics 2016-06, Vol.119 (21)
Hauptverfasser:	Chen, H., Verheyen, P., De Heyn, P., Lepage, G., De Coster, J., Balakrishnan, S., Absil, P., Roelkens, G., Van Campenhout, J.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied physics Dark current Germanium Leakage current Minority carriers Photodiodes Photometers
Online-Zugang:	Volltext
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