Anisotropy of Seebeck coefficient in Si/Ge composite quantum dots

In this report, Si5Ge5 alloy and Si/Ge composite quantum dots (CQDs) layers were grown on Si substrates. Seebeck coefficient (S) of Si and Ge wafers, as well as these two samples, were patterned and measured from 60 to 180 °C in [110] and [010] directions. For Si, Ge, and Si5Ge5, the S of each is a...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Applied physics letters 2016-08, Vol.109 (8)
Hauptverfasser: Hsin, Cheng-Lun, Tsai, Yue-Yun, Lee, Sheng-Wei
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue 8
container_start_page
container_title Applied physics letters
container_volume 109
creator Hsin, Cheng-Lun
Tsai, Yue-Yun
Lee, Sheng-Wei
description In this report, Si5Ge5 alloy and Si/Ge composite quantum dots (CQDs) layers were grown on Si substrates. Seebeck coefficient (S) of Si and Ge wafers, as well as these two samples, were patterned and measured from 60 to 180 °C in [110] and [010] directions. For Si, Ge, and Si5Ge5, the S of each is a constant in this temperature range. However, the S of the CQDs at 60–80 °C is anomalous and much higher than the others. The behavior of the voltage difference is linear to the temperature difference even as large as 50 °C, except for CQDs at 60–80 °C. This result indicates that a narrow distribution of carriers energy with a sharp change in density of state near Fermi-level and selective carrier scattering in the miniband at Si/Ge interface make the discrepancy of charge transport enhanced. The CQDs can be a good candidate for temperature sensing and thermoelectric applications due to their high S and low thermal conductivity near room temperature.
doi_str_mv 10.1063/1.4961535
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2121695169</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2121695169</sourcerecordid><originalsourceid>FETCH-LOGICAL-c355t-14470a007ab93ae219add2555273f1d6e59e481ab3c9b4acb3204b16fec6dc593</originalsourceid><addsrcrecordid>eNp9kMFKAzEQhoMoWKsH32DBk8K2mWSz2xxL0SoUPFTPIZtNMNUm2yQr9O3dpcUeBE_DDB___HwI3QKeAC7pFCYFL4FRdoZGgKsqpwCzczTCGNO85Awu0VWMm35lhNIRms-djT4F3-4zb7K11rVWn5ny2hirrHYpsy5b2-lS98dt66NNOtt10qVumzU-xWt0YeRX1DfHOUbvT49vi-d89bp8WcxXuaKMpRyKosIS40rWnEpNgMumIYwxUlEDTakZ18UMZE0VrwupakpwUUNptCobxTgdo7tDro_Jiqj6HupDeee0SoIQxjGj5Ylqg991Oiax8V1wfTFBgMBgoByy7g-UCj7GoI1og93KsBeAxeBRgDh67NmHAzu8lMl69wt_-3ACRduY_-C_yT8n3n8j</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2121695169</pqid></control><display><type>article</type><title>Anisotropy of Seebeck coefficient in Si/Ge composite quantum dots</title><source>AIP Journals Complete</source><source>Alma/SFX Local Collection</source><creator>Hsin, Cheng-Lun ; Tsai, Yue-Yun ; Lee, Sheng-Wei</creator><creatorcontrib>Hsin, Cheng-Lun ; Tsai, Yue-Yun ; Lee, Sheng-Wei</creatorcontrib><description>In this report, Si5Ge5 alloy and Si/Ge composite quantum dots (CQDs) layers were grown on Si substrates. Seebeck coefficient (S) of Si and Ge wafers, as well as these two samples, were patterned and measured from 60 to 180 °C in [110] and [010] directions. For Si, Ge, and Si5Ge5, the S of each is a constant in this temperature range. However, the S of the CQDs at 60–80 °C is anomalous and much higher than the others. The behavior of the voltage difference is linear to the temperature difference even as large as 50 °C, except for CQDs at 60–80 °C. This result indicates that a narrow distribution of carriers energy with a sharp change in density of state near Fermi-level and selective carrier scattering in the miniband at Si/Ge interface make the discrepancy of charge transport enhanced. The CQDs can be a good candidate for temperature sensing and thermoelectric applications due to their high S and low thermal conductivity near room temperature.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.4961535</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>ALLOYS ; ANISOTROPY ; Applied physics ; CHARGE TRANSPORT ; CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS ; DENSITY OF STATES ; DISTRIBUTION ; ELECTRIC POTENTIAL ; Energy distribution ; FERMI LEVEL ; Germanium ; INTERFACES ; LAYERS ; QUANTUM DOTS ; SCATTERING ; Seebeck effect ; Silicon substrates ; SUBSTRATES ; Temperature gradients ; TEMPERATURE RANGE 0273-0400 K ; THERMAL CONDUCTIVITY</subject><ispartof>Applied physics letters, 2016-08, Vol.109 (8)</ispartof><rights>Author(s)</rights><rights>2016 Author(s). Published by AIP Publishing.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c355t-14470a007ab93ae219add2555273f1d6e59e481ab3c9b4acb3204b16fec6dc593</citedby><cites>FETCH-LOGICAL-c355t-14470a007ab93ae219add2555273f1d6e59e481ab3c9b4acb3204b16fec6dc593</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/apl/article-lookup/doi/10.1063/1.4961535$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>230,314,776,780,790,881,4498,27901,27902,76126</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/22590536$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Hsin, Cheng-Lun</creatorcontrib><creatorcontrib>Tsai, Yue-Yun</creatorcontrib><creatorcontrib>Lee, Sheng-Wei</creatorcontrib><title>Anisotropy of Seebeck coefficient in Si/Ge composite quantum dots</title><title>Applied physics letters</title><description>In this report, Si5Ge5 alloy and Si/Ge composite quantum dots (CQDs) layers were grown on Si substrates. Seebeck coefficient (S) of Si and Ge wafers, as well as these two samples, were patterned and measured from 60 to 180 °C in [110] and [010] directions. For Si, Ge, and Si5Ge5, the S of each is a constant in this temperature range. However, the S of the CQDs at 60–80 °C is anomalous and much higher than the others. The behavior of the voltage difference is linear to the temperature difference even as large as 50 °C, except for CQDs at 60–80 °C. This result indicates that a narrow distribution of carriers energy with a sharp change in density of state near Fermi-level and selective carrier scattering in the miniband at Si/Ge interface make the discrepancy of charge transport enhanced. The CQDs can be a good candidate for temperature sensing and thermoelectric applications due to their high S and low thermal conductivity near room temperature.</description><subject>ALLOYS</subject><subject>ANISOTROPY</subject><subject>Applied physics</subject><subject>CHARGE TRANSPORT</subject><subject>CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS</subject><subject>DENSITY OF STATES</subject><subject>DISTRIBUTION</subject><subject>ELECTRIC POTENTIAL</subject><subject>Energy distribution</subject><subject>FERMI LEVEL</subject><subject>Germanium</subject><subject>INTERFACES</subject><subject>LAYERS</subject><subject>QUANTUM DOTS</subject><subject>SCATTERING</subject><subject>Seebeck effect</subject><subject>Silicon substrates</subject><subject>SUBSTRATES</subject><subject>Temperature gradients</subject><subject>TEMPERATURE RANGE 0273-0400 K</subject><subject>THERMAL CONDUCTIVITY</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><recordid>eNp9kMFKAzEQhoMoWKsH32DBk8K2mWSz2xxL0SoUPFTPIZtNMNUm2yQr9O3dpcUeBE_DDB___HwI3QKeAC7pFCYFL4FRdoZGgKsqpwCzczTCGNO85Awu0VWMm35lhNIRms-djT4F3-4zb7K11rVWn5ny2hirrHYpsy5b2-lS98dt66NNOtt10qVumzU-xWt0YeRX1DfHOUbvT49vi-d89bp8WcxXuaKMpRyKosIS40rWnEpNgMumIYwxUlEDTakZ18UMZE0VrwupakpwUUNptCobxTgdo7tDro_Jiqj6HupDeee0SoIQxjGj5Ylqg991Oiax8V1wfTFBgMBgoByy7g-UCj7GoI1og93KsBeAxeBRgDh67NmHAzu8lMl69wt_-3ACRduY_-C_yT8n3n8j</recordid><startdate>20160822</startdate><enddate>20160822</enddate><creator>Hsin, Cheng-Lun</creator><creator>Tsai, Yue-Yun</creator><creator>Lee, Sheng-Wei</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>OTOTI</scope></search><sort><creationdate>20160822</creationdate><title>Anisotropy of Seebeck coefficient in Si/Ge composite quantum dots</title><author>Hsin, Cheng-Lun ; Tsai, Yue-Yun ; Lee, Sheng-Wei</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c355t-14470a007ab93ae219add2555273f1d6e59e481ab3c9b4acb3204b16fec6dc593</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>ALLOYS</topic><topic>ANISOTROPY</topic><topic>Applied physics</topic><topic>CHARGE TRANSPORT</topic><topic>CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS</topic><topic>DENSITY OF STATES</topic><topic>DISTRIBUTION</topic><topic>ELECTRIC POTENTIAL</topic><topic>Energy distribution</topic><topic>FERMI LEVEL</topic><topic>Germanium</topic><topic>INTERFACES</topic><topic>LAYERS</topic><topic>QUANTUM DOTS</topic><topic>SCATTERING</topic><topic>Seebeck effect</topic><topic>Silicon substrates</topic><topic>SUBSTRATES</topic><topic>Temperature gradients</topic><topic>TEMPERATURE RANGE 0273-0400 K</topic><topic>THERMAL CONDUCTIVITY</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Hsin, Cheng-Lun</creatorcontrib><creatorcontrib>Tsai, Yue-Yun</creatorcontrib><creatorcontrib>Lee, Sheng-Wei</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>OSTI.GOV</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hsin, Cheng-Lun</au><au>Tsai, Yue-Yun</au><au>Lee, Sheng-Wei</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Anisotropy of Seebeck coefficient in Si/Ge composite quantum dots</atitle><jtitle>Applied physics letters</jtitle><date>2016-08-22</date><risdate>2016</risdate><volume>109</volume><issue>8</issue><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>In this report, Si5Ge5 alloy and Si/Ge composite quantum dots (CQDs) layers were grown on Si substrates. Seebeck coefficient (S) of Si and Ge wafers, as well as these two samples, were patterned and measured from 60 to 180 °C in [110] and [010] directions. For Si, Ge, and Si5Ge5, the S of each is a constant in this temperature range. However, the S of the CQDs at 60–80 °C is anomalous and much higher than the others. The behavior of the voltage difference is linear to the temperature difference even as large as 50 °C, except for CQDs at 60–80 °C. This result indicates that a narrow distribution of carriers energy with a sharp change in density of state near Fermi-level and selective carrier scattering in the miniband at Si/Ge interface make the discrepancy of charge transport enhanced. The CQDs can be a good candidate for temperature sensing and thermoelectric applications due to their high S and low thermal conductivity near room temperature.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/1.4961535</doi><tpages>3</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0003-6951
ispartof Applied physics letters, 2016-08, Vol.109 (8)
issn 0003-6951
1077-3118
language eng
recordid cdi_proquest_journals_2121695169
source AIP Journals Complete; Alma/SFX Local Collection
subjects ALLOYS
ANISOTROPY
Applied physics
CHARGE TRANSPORT
CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
DENSITY OF STATES
DISTRIBUTION
ELECTRIC POTENTIAL
Energy distribution
FERMI LEVEL
Germanium
INTERFACES
LAYERS
QUANTUM DOTS
SCATTERING
Seebeck effect
Silicon substrates
SUBSTRATES
Temperature gradients
TEMPERATURE RANGE 0273-0400 K
THERMAL CONDUCTIVITY
title Anisotropy of Seebeck coefficient in Si/Ge composite quantum dots
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-13T02%3A23%3A48IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Anisotropy%20of%20Seebeck%20coefficient%20in%20Si/Ge%20composite%20quantum%20dots&rft.jtitle=Applied%20physics%20letters&rft.au=Hsin,%20Cheng-Lun&rft.date=2016-08-22&rft.volume=109&rft.issue=8&rft.issn=0003-6951&rft.eissn=1077-3118&rft.coden=APPLAB&rft_id=info:doi/10.1063/1.4961535&rft_dat=%3Cproquest_cross%3E2121695169%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2121695169&rft_id=info:pmid/&rfr_iscdi=true