High quality factor platinum silicide microwave kinetic inductance detectors
We report on the development of microwave kinetic inductance detectors (MKIDs) using platinum silicide as the sensor material. MKIDs are an emerging superconducting detector technology, capable of measuring the arrival times of single photons to better than two microseconds and their energies to aro...
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| Veröffentlicht in: | Applied physics letters 2016-10, Vol.109 (15) |
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| container_title | Applied physics letters |
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| creator | Szypryt, P. Mazin, B. A. Ulbricht, G. Bumble, B. Meeker, S. R. Bockstiegel, C. Walter, A. B. |
| description | We report on the development of microwave kinetic inductance detectors (MKIDs) using platinum silicide as the sensor material. MKIDs are an emerging superconducting detector technology, capable of measuring the arrival times of single photons to better than two microseconds and their energies to around ten percent. Previously, MKIDs have been fabricated using either sub-stoichiometric titanium nitride or aluminum, but TiN suffers from the spatial inhomogeneities in the superconducting critical temperature and Al has a low kinetic inductance fraction, causing low detector sensitivity. To address these issues, we have instead fabricated the PtSi microresonators with the superconducting critical temperatures of 944 ± 12 mK and high internal quality factors (
Q
i
≳
10
6
). These devices show typical quasiparticle lifetimes of
τ
q
p
≈
30
–
40
μ
s and spectral resolution,
R
=
λ
/
Δ
λ
, of 8 at 406.6 nm. We compare PtSi MKIDs to those fabricated with TiN and detail the substantial advantages that PtSi MKIDs have to offer. |
| doi_str_mv | 10.1063/1.4964665 |
| format | Article |
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Q
i
≳
10
6
). These devices show typical quasiparticle lifetimes of
τ
q
p
≈
30
–
40
μ
s and spectral resolution,
R
=
λ
/
Δ
λ
, of 8 at 406.6 nm. We compare PtSi MKIDs to those fabricated with TiN and detail the substantial advantages that PtSi MKIDs have to offer.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.4964665</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Aluminum ; Applied physics ; Critical temperature ; Detectors ; Inductance ; Intermetallic compounds ; Photons ; Platinum ; Q factors ; Silicides ; Spectral resolution ; Superconductivity ; Titanium nitride</subject><ispartof>Applied physics letters, 2016-10, Vol.109 (15)</ispartof><rights>Author(s)</rights><rights>2016 Author(s). Published by AIP Publishing.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c428t-7d7687110a90238de72ced1b9805c1e81793928ab3f7fe0e5148cd1db378dd6c3</citedby><cites>FETCH-LOGICAL-c428t-7d7687110a90238de72ced1b9805c1e81793928ab3f7fe0e5148cd1db378dd6c3</cites><orcidid>0000-0002-6497-3763</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/apl/article-lookup/doi/10.1063/1.4964665$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,776,780,790,4497,27903,27904,76130</link.rule.ids></links><search><creatorcontrib>Szypryt, P.</creatorcontrib><creatorcontrib>Mazin, B. A.</creatorcontrib><creatorcontrib>Ulbricht, G.</creatorcontrib><creatorcontrib>Bumble, B.</creatorcontrib><creatorcontrib>Meeker, S. R.</creatorcontrib><creatorcontrib>Bockstiegel, C.</creatorcontrib><creatorcontrib>Walter, A. B.</creatorcontrib><title>High quality factor platinum silicide microwave kinetic inductance detectors</title><title>Applied physics letters</title><description>We report on the development of microwave kinetic inductance detectors (MKIDs) using platinum silicide as the sensor material. MKIDs are an emerging superconducting detector technology, capable of measuring the arrival times of single photons to better than two microseconds and their energies to around ten percent. Previously, MKIDs have been fabricated using either sub-stoichiometric titanium nitride or aluminum, but TiN suffers from the spatial inhomogeneities in the superconducting critical temperature and Al has a low kinetic inductance fraction, causing low detector sensitivity. To address these issues, we have instead fabricated the PtSi microresonators with the superconducting critical temperatures of 944 ± 12 mK and high internal quality factors (
Q
i
≳
10
6
). These devices show typical quasiparticle lifetimes of
τ
q
p
≈
30
–
40
μ
s and spectral resolution,
R
=
λ
/
Δ
λ
, of 8 at 406.6 nm. We compare PtSi MKIDs to those fabricated with TiN and detail the substantial advantages that PtSi MKIDs have to offer.</description><subject>Aluminum</subject><subject>Applied physics</subject><subject>Critical temperature</subject><subject>Detectors</subject><subject>Inductance</subject><subject>Intermetallic compounds</subject><subject>Photons</subject><subject>Platinum</subject><subject>Q factors</subject><subject>Silicides</subject><subject>Spectral resolution</subject><subject>Superconductivity</subject><subject>Titanium nitride</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><recordid>eNqdkEFLAzEQhYMoWKsH_0HAk8LWTLKbZI9S1AoFL3oOaZLV1O3uNslW-u9NqeDd0zDwzXvzHkLXQGZAOLuHWVnzkvPqBE2ACFEwAHmKJoQQVvC6gnN0EeM6rxVlbIKWC__xibejbn3a40ab1Ac8tDr5btzg6FtvvHV4403ov_XO4S_fueQN9p0dTdKdcdi65A538RKdNbqN7up3TtH70-PbfFEsX59f5g_LwpRUpkJYwaUAILomlEnrBDXOwqqWpDLgJIia1VTqFWtE44iroJTGgl0xIa3lhk3RzVF3CP12dDGpdT-GLlsqChQ4sCybqdsjlV-PMbhGDcFvdNgrIOpQlgL1W1Zm745sND7l8H33P3jXhz9QDbZhP9y7eDY</recordid><startdate>20161010</startdate><enddate>20161010</enddate><creator>Szypryt, P.</creator><creator>Mazin, B. A.</creator><creator>Ulbricht, G.</creator><creator>Bumble, B.</creator><creator>Meeker, S. R.</creator><creator>Bockstiegel, C.</creator><creator>Walter, A. B.</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-6497-3763</orcidid></search><sort><creationdate>20161010</creationdate><title>High quality factor platinum silicide microwave kinetic inductance detectors</title><author>Szypryt, P. ; Mazin, B. A. ; Ulbricht, G. ; Bumble, B. ; Meeker, S. R. ; Bockstiegel, C. ; Walter, A. B.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c428t-7d7687110a90238de72ced1b9805c1e81793928ab3f7fe0e5148cd1db378dd6c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Aluminum</topic><topic>Applied physics</topic><topic>Critical temperature</topic><topic>Detectors</topic><topic>Inductance</topic><topic>Intermetallic compounds</topic><topic>Photons</topic><topic>Platinum</topic><topic>Q factors</topic><topic>Silicides</topic><topic>Spectral resolution</topic><topic>Superconductivity</topic><topic>Titanium nitride</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Szypryt, P.</creatorcontrib><creatorcontrib>Mazin, B. A.</creatorcontrib><creatorcontrib>Ulbricht, G.</creatorcontrib><creatorcontrib>Bumble, B.</creatorcontrib><creatorcontrib>Meeker, S. R.</creatorcontrib><creatorcontrib>Bockstiegel, C.</creatorcontrib><creatorcontrib>Walter, A. B.</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Szypryt, P.</au><au>Mazin, B. A.</au><au>Ulbricht, G.</au><au>Bumble, B.</au><au>Meeker, S. R.</au><au>Bockstiegel, C.</au><au>Walter, A. B.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>High quality factor platinum silicide microwave kinetic inductance detectors</atitle><jtitle>Applied physics letters</jtitle><date>2016-10-10</date><risdate>2016</risdate><volume>109</volume><issue>15</issue><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>We report on the development of microwave kinetic inductance detectors (MKIDs) using platinum silicide as the sensor material. MKIDs are an emerging superconducting detector technology, capable of measuring the arrival times of single photons to better than two microseconds and their energies to around ten percent. Previously, MKIDs have been fabricated using either sub-stoichiometric titanium nitride or aluminum, but TiN suffers from the spatial inhomogeneities in the superconducting critical temperature and Al has a low kinetic inductance fraction, causing low detector sensitivity. To address these issues, we have instead fabricated the PtSi microresonators with the superconducting critical temperatures of 944 ± 12 mK and high internal quality factors (
Q
i
≳
10
6
). These devices show typical quasiparticle lifetimes of
τ
q
p
≈
30
–
40
μ
s and spectral resolution,
R
=
λ
/
Δ
λ
, of 8 at 406.6 nm. We compare PtSi MKIDs to those fabricated with TiN and detail the substantial advantages that PtSi MKIDs have to offer.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/1.4964665</doi><tpages>4</tpages><orcidid>https://orcid.org/0000-0002-6497-3763</orcidid><oa>free_for_read</oa></addata></record> |
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| language | eng |
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| source | AIP Journals Complete; Alma/SFX Local Collection |
| subjects | Aluminum Applied physics Critical temperature Detectors Inductance Intermetallic compounds Photons Platinum Q factors Silicides Spectral resolution Superconductivity Titanium nitride |
| title | High quality factor platinum silicide microwave kinetic inductance detectors |
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