Addressing Detector Non-Uniformity in Scanning Transmission Electron Microscopy

Addressing Detector Non-Uniformity in Scanning Transmission Electron Microscopy

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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Veröffentlicht in:Microscopy and microanalysis 2013-08, Vol.19 (S2), p.600-601
Hauptverfasser: LeBeau, J.M., Findlay, S.D.
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Sprache:eng
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A05.03 Revisiting Resolution for STEM and TEM
Instrumentation Sciences
Scanning electron microscopy
Scanning transmission electron microscopy
Transmission electron microscopy
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container_title Microscopy and microanalysis
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creator LeBeau, J.M.
Findlay, S.D.
description Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
doi_str_mv 10.1017/S1431927613004996
format Article
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subjects A05.03 Revisiting Resolution for STEM and TEM
Instrumentation Sciences
Scanning electron microscopy
Scanning transmission electron microscopy
Transmission electron microscopy
title Addressing Detector Non-Uniformity in Scanning Transmission Electron Microscopy
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