Electron Probe Technique for Measuring the Iron Oxidation State of Silicate Glasses

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Microscopy and microanalysis 2018-08, Vol.24 (S1), p.2068-2069
Hauptverfasser: Hughes, Ery C, Ben Buse, Kearns, Stuart L, Blundy, Jon D
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 2069
container_issue S1
container_start_page 2068
container_title Microscopy and microanalysis
container_volume 24
creator Hughes, Ery C
Ben Buse
Kearns, Stuart L
Blundy, Jon D
description
doi_str_mv 10.1017/S1431927618010826
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2117237277</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><cupid>10_1017_S1431927618010826</cupid><sourcerecordid>2117237277</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1576-dac7c88b77307c3607f5497c63d4b7550e944f1f4aab59b8ec6d763b951379873</originalsourceid><addsrcrecordid>eNp1UNFKwzAUDaLgnH6AbwGfq7lNk9s-ypjbYDKh87kkabpldO1MOtC_t3UDH8Sne7j3nHMPh5B7YI_AAJ9ySDhkMUpIGbA0lhdk1K9ElAKIyx8M0XC_Jjch7BhjnKEckXxaW9P5tqFvvtWWrq3ZNu7jaGnVevpqVTh612xot7V0MdBWn65UnetR3qnO0raiuaudGfCsViHYcEuuKlUHe3eeY_L-Ml1P5tFyNVtMnpeRAYEyKpVBk6YasY9iuGRYiSRDI3mZaBSC2SxJKqgSpbTIdGqNLFFynQngmKXIx-Th5HvwbZ84dMWuPfqmf1nEABhzjHFgwYllfBuCt1Vx8G6v_FcBrBi6K_5012v4WaP22rtyY3-t_1d9A5fJbyw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2117237277</pqid></control><display><type>article</type><title>Electron Probe Technique for Measuring the Iron Oxidation State of Silicate Glasses</title><source>Cambridge University Press Journals Complete</source><creator>Hughes, Ery C ; Ben Buse ; Kearns, Stuart L ; Blundy, Jon D</creator><creatorcontrib>Hughes, Ery C ; Ben Buse ; Kearns, Stuart L ; Blundy, Jon D</creatorcontrib><identifier>ISSN: 1431-9276</identifier><identifier>EISSN: 1435-8115</identifier><identifier>DOI: 10.1017/S1431927618010826</identifier><language>eng</language><publisher>New York, USA: Cambridge University Press</publisher><subject>Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Earth Materials ; Electron probe ; Electron probes ; Oxidation ; Physical Science Symposia ; Valence</subject><ispartof>Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.2068-2069</ispartof><rights>Microscopy Society of America 2018</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c1576-dac7c88b77307c3607f5497c63d4b7550e944f1f4aab59b8ec6d763b951379873</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.cambridge.org/core/product/identifier/S1431927618010826/type/journal_article$$EHTML$$P50$$Gcambridge$$H</linktohtml><link.rule.ids>164,314,780,784,27924,27925,55628</link.rule.ids></links><search><creatorcontrib>Hughes, Ery C</creatorcontrib><creatorcontrib>Ben Buse</creatorcontrib><creatorcontrib>Kearns, Stuart L</creatorcontrib><creatorcontrib>Blundy, Jon D</creatorcontrib><title>Electron Probe Technique for Measuring the Iron Oxidation State of Silicate Glasses</title><title>Microscopy and microanalysis</title><addtitle>Microsc Microanal</addtitle><subject>Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Earth Materials</subject><subject>Electron probe</subject><subject>Electron probes</subject><subject>Oxidation</subject><subject>Physical Science Symposia</subject><subject>Valence</subject><issn>1431-9276</issn><issn>1435-8115</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNp1UNFKwzAUDaLgnH6AbwGfq7lNk9s-ypjbYDKh87kkabpldO1MOtC_t3UDH8Sne7j3nHMPh5B7YI_AAJ9ySDhkMUpIGbA0lhdk1K9ElAKIyx8M0XC_Jjch7BhjnKEckXxaW9P5tqFvvtWWrq3ZNu7jaGnVevpqVTh612xot7V0MdBWn65UnetR3qnO0raiuaudGfCsViHYcEuuKlUHe3eeY_L-Ml1P5tFyNVtMnpeRAYEyKpVBk6YasY9iuGRYiSRDI3mZaBSC2SxJKqgSpbTIdGqNLFFynQngmKXIx-Th5HvwbZ84dMWuPfqmf1nEABhzjHFgwYllfBuCt1Vx8G6v_FcBrBi6K_5012v4WaP22rtyY3-t_1d9A5fJbyw</recordid><startdate>201808</startdate><enddate>201808</enddate><creator>Hughes, Ery C</creator><creator>Ben Buse</creator><creator>Kearns, Stuart L</creator><creator>Blundy, Jon D</creator><general>Cambridge University Press</general><general>Oxford University Press</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7QO</scope><scope>7RV</scope><scope>7TK</scope><scope>7X7</scope><scope>7XB</scope><scope>88E</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FH</scope><scope>8FI</scope><scope>8FJ</scope><scope>8FK</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BBNVY</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>BHPHI</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FR3</scope><scope>FYUFA</scope><scope>GHDGH</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>K9.</scope><scope>KB0</scope><scope>LK8</scope><scope>M0S</scope><scope>M1P</scope><scope>M7P</scope><scope>NAPCQ</scope><scope>P5Z</scope><scope>P62</scope><scope>P64</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope></search><sort><creationdate>201808</creationdate><title>Electron Probe Technique for Measuring the Iron Oxidation State of Silicate Glasses</title><author>Hughes, Ery C ; Ben Buse ; Kearns, Stuart L ; Blundy, Jon D</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1576-dac7c88b77307c3607f5497c63d4b7550e944f1f4aab59b8ec6d763b951379873</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Earth Materials</topic><topic>Electron probe</topic><topic>Electron probes</topic><topic>Oxidation</topic><topic>Physical Science Symposia</topic><topic>Valence</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Hughes, Ery C</creatorcontrib><creatorcontrib>Ben Buse</creatorcontrib><creatorcontrib>Kearns, Stuart L</creatorcontrib><creatorcontrib>Blundy, Jon D</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Biotechnology Research Abstracts</collection><collection>Nursing &amp; Allied Health Database</collection><collection>Neurosciences Abstracts</collection><collection>Health &amp; Medical Collection</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Medical Database (Alumni Edition)</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>Hospital Premium Collection</collection><collection>Hospital Premium Collection (Alumni Edition)</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>Biological Science Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>Natural Science Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Engineering Research Database</collection><collection>Health Research Premium Collection</collection><collection>Health Research Premium Collection (Alumni)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Health &amp; Medical Complete (Alumni)</collection><collection>Nursing &amp; Allied Health Database (Alumni Edition)</collection><collection>ProQuest Biological Science Collection</collection><collection>Health &amp; Medical Collection (Alumni Edition)</collection><collection>Medical Database</collection><collection>Biological Science Database</collection><collection>Nursing &amp; Allied Health Premium</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Biotechnology and BioEngineering Abstracts</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><jtitle>Microscopy and microanalysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hughes, Ery C</au><au>Ben Buse</au><au>Kearns, Stuart L</au><au>Blundy, Jon D</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electron Probe Technique for Measuring the Iron Oxidation State of Silicate Glasses</atitle><jtitle>Microscopy and microanalysis</jtitle><addtitle>Microsc Microanal</addtitle><date>2018-08</date><risdate>2018</risdate><volume>24</volume><issue>S1</issue><spage>2068</spage><epage>2069</epage><pages>2068-2069</pages><issn>1431-9276</issn><eissn>1435-8115</eissn><cop>New York, USA</cop><pub>Cambridge University Press</pub><doi>10.1017/S1431927618010826</doi><tpages>2</tpages><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 1431-9276
ispartof Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.2068-2069
issn 1431-9276
1435-8115
language eng
recordid cdi_proquest_journals_2117237277
source Cambridge University Press Journals Complete
subjects Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Earth Materials
Electron probe
Electron probes
Oxidation
Physical Science Symposia
Valence
title Electron Probe Technique for Measuring the Iron Oxidation State of Silicate Glasses
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T06%3A58%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Electron%20Probe%20Technique%20for%20Measuring%20the%20Iron%20Oxidation%20State%20of%20Silicate%20Glasses&rft.jtitle=Microscopy%20and%20microanalysis&rft.au=Hughes,%20Ery%20C&rft.date=2018-08&rft.volume=24&rft.issue=S1&rft.spage=2068&rft.epage=2069&rft.pages=2068-2069&rft.issn=1431-9276&rft.eissn=1435-8115&rft_id=info:doi/10.1017/S1431927618010826&rft_dat=%3Cproquest_cross%3E2117237277%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2117237277&rft_id=info:pmid/&rft_cupid=10_1017_S1431927618010826&rfr_iscdi=true