Characterization of Mixed Metal Oxide Interfaces Based on TiO2-supported CeO2-x Nanoparticles

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Veröffentlicht in:Microscopy and microanalysis 2018-08, Vol.24 (S1), p.458-459
Hauptverfasser: Haiber, Diane M., Phan, Tu-Uyen, Venkatraman, Kartik, Crozier, Peter A.
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container_title Microscopy and microanalysis
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creator Haiber, Diane M.
Phan, Tu-Uyen
Venkatraman, Kartik
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doi_str_mv 10.1017/S1431927618002787
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subjects Analytical and Instrumentation Science Symposia
Cerium oxides
Interfaces
Nanoparticles
New Advances in Electron Energy Loss Spectroscopy and Allied Techniques
Titanium dioxide
title Characterization of Mixed Metal Oxide Interfaces Based on TiO2-supported CeO2-x Nanoparticles
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