SRAM Circuits for True Random Number Generation Using Intrinsic Bit Instability

This paper describes a novel approach to a true random number generator (TRNG) using SRAM circuits. The principles of operation are described in the context of past work on integrated circuit TRNGs. The required modifications to standard SRAM arrays are minor and have little impact on the area. Expe...

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Veröffentlicht in:	IEEE transactions on very large scale integration (VLSI) systems 2018-10, Vol.26 (10), p.2027-2037
Hauptverfasser:	Clark, Lawrence T., Medapuram, Sai Bharadwaj, Kadiyala, Divya Kiran
Format:	Artikel
Sprache:	eng
Schlagworte:	Entropy Integrated circuits NIST Physically unclonable functions (PUFs) Random access memory Random numbers random telegraph noise (RTN) randomness Stability static random access memory Strings Transistors true random number generation (TRNG) Very large scale integration
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