A Detailed Study on Light-Induced Degradation of Cz-Si PERC-Type Solar Cells: Evidence of Rear Surface-Related Degradation
A light-induced degradation phenomenon of unknown origin in p-type Cz-Si passivated emitter and rear cell (PERC)-type solar cells is thoroughly investigated by collating results from different measurement techniques and predictions from various simulations. The observed degradation manifests in slig...
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| Veröffentlicht in: | IEEE journal of photovoltaics 2018-09, Vol.8 (5), p.1190-1201 |
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| creator | Herguth, Axel Derricks, Christian Sperber, David |
| description | A light-induced degradation phenomenon of unknown origin in p-type Cz-Si passivated emitter and rear cell (PERC)-type solar cells is thoroughly investigated by collating results from different measurement techniques and predictions from various simulations. The observed degradation manifests in slight losses in j sc , strong losses in V oc , and devastating losses in FF, and thus massively impacts efficiency. It is found that the series resistance degrades significantly due to a degradation of front contact resistance. This, however, does not explain losses in V oc and j sc , which are attributed to the degradation of a different cell component. Neither a degradation by defect formation in the space charge region, nor the emitter, nor the bulk is found to consistently explain the observations. Only a rear surface-related degradation mechanism explains consistently all experimental findings. |
| doi_str_mv | 10.1109/JPHOTOV.2018.2850521 |
| format | Article |
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The observed degradation manifests in slight losses in j sc , strong losses in V oc , and devastating losses in FF, and thus massively impacts efficiency. It is found that the series resistance degrades significantly due to a degradation of front contact resistance. This, however, does not explain losses in V oc and j sc , which are attributed to the degradation of a different cell component. Neither a degradation by defect formation in the space charge region, nor the emitter, nor the bulk is found to consistently explain the observations. 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The observed degradation manifests in slight losses in j sc , strong losses in V oc , and devastating losses in FF, and thus massively impacts efficiency. It is found that the series resistance degrades significantly due to a degradation of front contact resistance. This, however, does not explain losses in V oc and j sc , which are attributed to the degradation of a different cell component. Neither a degradation by defect formation in the space charge region, nor the emitter, nor the bulk is found to consistently explain the observations. Only a rear surface-related degradation mechanism explains consistently all experimental findings.</description><subject>Collating</subject><subject>Contact resistance</subject><subject>Degradation</subject><subject>Elemental semiconductors</subject><subject>Emitters</subject><subject>Light-induced degradation (LID)</subject><subject>Measurement techniques</subject><subject>passivated emitter and rear cell (PERC) silicon solar cells</subject><subject>Passivation</subject><subject>Photodegradation</subject><subject>Photovoltaic cells</subject><subject>Silicon</subject><subject>Simulation</subject><subject>Solar cells</subject><subject>Space charge</subject><subject>surface-related degradation (SRD)</subject><issn>2156-3381</issn><issn>2156-3403</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpVkE9PwkAQxTdGE4nyCfSwiefi_ulut95IQcGQQCh63Wx3p1hSKW5bE_j0loAmzmUmM--9SX4I3VMyoJTEj6-LyXw1fx8wQtWAKUEEoxeox6iQAQ8Jv_yduaLXqF_XG9KVJELKsIcOQzyCxhQlOJw2rdvjaotnxfqjCaZb19puPYK1N840RXepcpwcgrTAi_EyCVb7HeC0Ko3HCZRl_YTH34WDrYWjcAndPm19biwESyhN8z_sFl3lpqyhf-436O15vEomwWz-Mk2Gs8CyOG4CAzyXRuZZKKkSjhFFbcZ5nAkiWaysYdKEOc9CFRFhI6msMBFzOZcmtszF_AY9nHJ3vvpqoW70pmr9tnupGaURDSMhSacKTyrrq7r2kOudLz6N32tK9BG0PoPWR9D6DLqz3Z1sBQD8WVRIGROS_wDWdni_</recordid><startdate>20180901</startdate><enddate>20180901</enddate><creator>Herguth, Axel</creator><creator>Derricks, Christian</creator><creator>Sperber, David</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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| source | IEEE Electronic Library (IEL) |
| subjects | Collating Contact resistance Degradation Elemental semiconductors Emitters Light-induced degradation (LID) Measurement techniques passivated emitter and rear cell (PERC) silicon solar cells Passivation Photodegradation Photovoltaic cells Silicon Simulation Solar cells Space charge surface-related degradation (SRD) |
| title | A Detailed Study on Light-Induced Degradation of Cz-Si PERC-Type Solar Cells: Evidence of Rear Surface-Related Degradation |
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