Novel system for simultaneously measuring the thickness and refractive index of a transparent plate with two optical paths
This study designs and characterizes a novel optical system for simultaneously measuring the thickness (> 1 mm) and refractive index of a transparent plate with two optical paths. The proposed optical system is based on triangulation methods. In contrast to exiting optical system based on triangu...
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| Veröffentlicht in: | Applied physics. B, Lasers and optics Lasers and optics, 2018-09, Vol.124 (9), p.1-10, Article 180 |
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| container_title | Applied physics. B, Lasers and optics |
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| creator | Liu, Chien-Sheng Wang, Tse-Yen Chen, Yu-Ta |
| description | This study designs and characterizes a novel optical system for simultaneously measuring the thickness (> 1 mm) and refractive index of a transparent plate with two optical paths. The proposed optical system is based on triangulation methods. In contrast to exiting optical system based on triangulation methods for simultaneous measurements of thickness and refractive index of a transparent plate, the proposed optical system can measure a greater thickness with a simpler structure and lower cost. The two optical paths are combined using a self-written measurement processing algorithm to simultaneously calculate the thickness and refractive index. The principle and measurement methodology of the proposed optical system are analyzed and explained. The performance of the proposed optical system is then verified and evaluated experimentally using a laboratory-built prototype. The experimental results show that the measured thicknesses and refractive indexes for Sample B (the thickness > 1 mm) are in good agreement with those determined by a commercial instrument with the maximum deviation of 0.019% for the thickness
d
and 0.007% for the refractive index
n
, respectively. |
| doi_str_mv | 10.1007/s00340-018-7052-4 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2097639448</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2097639448</sourcerecordid><originalsourceid>FETCH-LOGICAL-c316t-60d83e0d31aaff28e27acbc423d22f729458e697c763f5907e51079b34856f1e3</originalsourceid><addsrcrecordid>eNp1kE1LxDAQhoMouH78AG8Bz9XJR5v2KOIXLHrRc8i2E7drt6mZVF1_vV1W8OTAMJf3mWEexs4EXAgAc0kASkMGoswM5DLTe2wmtJIZFLraZzOodJFJYcQhOyJawVRFWc7Y92P4wI7ThhKuuQ-RU7seu-R6DCN1G75GR2Ns-1eeljh1W7_1SMRd3_CIPro6tR_I277BLx48dzxF19PgIvaJD51LyD_btOTpM_AwpLZ2HR9cWtIJO_CuIzz9ncfs5fbm-fo-mz_dPVxfzbNaiSJlBTSlQmiUcM57WaI0rl7UWqpGSm9kpfMSi8rUplA-r8BgLsBUC6XLvPAC1TE73-0dYngfkZJdhTH200kroZqoSutySoldqo6BaPrMDrFdu7ixAuxWsd0ptpNiu1Vs9cTIHUPD1hDGv83_Qz9C_4B5</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2097639448</pqid></control><display><type>article</type><title>Novel system for simultaneously measuring the thickness and refractive index of a transparent plate with two optical paths</title><source>SpringerLink Journals - AutoHoldings</source><creator>Liu, Chien-Sheng ; Wang, Tse-Yen ; Chen, Yu-Ta</creator><creatorcontrib>Liu, Chien-Sheng ; Wang, Tse-Yen ; Chen, Yu-Ta</creatorcontrib><description>This study designs and characterizes a novel optical system for simultaneously measuring the thickness (> 1 mm) and refractive index of a transparent plate with two optical paths. The proposed optical system is based on triangulation methods. In contrast to exiting optical system based on triangulation methods for simultaneous measurements of thickness and refractive index of a transparent plate, the proposed optical system can measure a greater thickness with a simpler structure and lower cost. The two optical paths are combined using a self-written measurement processing algorithm to simultaneously calculate the thickness and refractive index. The principle and measurement methodology of the proposed optical system are analyzed and explained. The performance of the proposed optical system is then verified and evaluated experimentally using a laboratory-built prototype. The experimental results show that the measured thicknesses and refractive indexes for Sample B (the thickness > 1 mm) are in good agreement with those determined by a commercial instrument with the maximum deviation of 0.019% for the thickness
d
and 0.007% for the refractive index
n
, respectively.</description><identifier>ISSN: 0946-2171</identifier><identifier>EISSN: 1432-0649</identifier><identifier>DOI: 10.1007/s00340-018-7052-4</identifier><language>eng</language><publisher>Berlin/Heidelberg: Springer Berlin Heidelberg</publisher><subject>Applied physics ; Engineering ; Lasers ; Measurement methods ; Microscopes ; Optical Devices ; Optical paths ; Optics ; Performance indices ; Photonics ; Physical Chemistry ; Physics ; Physics and Astronomy ; Plates (structural members) ; Quantum Optics ; Refractivity ; Thickness measurement ; Triangulation</subject><ispartof>Applied physics. B, Lasers and optics, 2018-09, Vol.124 (9), p.1-10, Article 180</ispartof><rights>Springer-Verlag GmbH Germany, part of Springer Nature 2018</rights><rights>Copyright Springer Science & Business Media 2018</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c316t-60d83e0d31aaff28e27acbc423d22f729458e697c763f5907e51079b34856f1e3</citedby><cites>FETCH-LOGICAL-c316t-60d83e0d31aaff28e27acbc423d22f729458e697c763f5907e51079b34856f1e3</cites><orcidid>0000-0002-3537-5828</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s00340-018-7052-4$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s00340-018-7052-4$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27901,27902,41464,42533,51294</link.rule.ids></links><search><creatorcontrib>Liu, Chien-Sheng</creatorcontrib><creatorcontrib>Wang, Tse-Yen</creatorcontrib><creatorcontrib>Chen, Yu-Ta</creatorcontrib><title>Novel system for simultaneously measuring the thickness and refractive index of a transparent plate with two optical paths</title><title>Applied physics. B, Lasers and optics</title><addtitle>Appl. Phys. B</addtitle><description>This study designs and characterizes a novel optical system for simultaneously measuring the thickness (> 1 mm) and refractive index of a transparent plate with two optical paths. The proposed optical system is based on triangulation methods. In contrast to exiting optical system based on triangulation methods for simultaneous measurements of thickness and refractive index of a transparent plate, the proposed optical system can measure a greater thickness with a simpler structure and lower cost. The two optical paths are combined using a self-written measurement processing algorithm to simultaneously calculate the thickness and refractive index. The principle and measurement methodology of the proposed optical system are analyzed and explained. The performance of the proposed optical system is then verified and evaluated experimentally using a laboratory-built prototype. The experimental results show that the measured thicknesses and refractive indexes for Sample B (the thickness > 1 mm) are in good agreement with those determined by a commercial instrument with the maximum deviation of 0.019% for the thickness
d
and 0.007% for the refractive index
n
, respectively.</description><subject>Applied physics</subject><subject>Engineering</subject><subject>Lasers</subject><subject>Measurement methods</subject><subject>Microscopes</subject><subject>Optical Devices</subject><subject>Optical paths</subject><subject>Optics</subject><subject>Performance indices</subject><subject>Photonics</subject><subject>Physical Chemistry</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Plates (structural members)</subject><subject>Quantum Optics</subject><subject>Refractivity</subject><subject>Thickness measurement</subject><subject>Triangulation</subject><issn>0946-2171</issn><issn>1432-0649</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><recordid>eNp1kE1LxDAQhoMouH78AG8Bz9XJR5v2KOIXLHrRc8i2E7drt6mZVF1_vV1W8OTAMJf3mWEexs4EXAgAc0kASkMGoswM5DLTe2wmtJIZFLraZzOodJFJYcQhOyJawVRFWc7Y92P4wI7ThhKuuQ-RU7seu-R6DCN1G75GR2Ns-1eeljh1W7_1SMRd3_CIPro6tR_I277BLx48dzxF19PgIvaJD51LyD_btOTpM_AwpLZ2HR9cWtIJO_CuIzz9ncfs5fbm-fo-mz_dPVxfzbNaiSJlBTSlQmiUcM57WaI0rl7UWqpGSm9kpfMSi8rUplA-r8BgLsBUC6XLvPAC1TE73-0dYngfkZJdhTH200kroZqoSutySoldqo6BaPrMDrFdu7ixAuxWsd0ptpNiu1Vs9cTIHUPD1hDGv83_Qz9C_4B5</recordid><startdate>20180901</startdate><enddate>20180901</enddate><creator>Liu, Chien-Sheng</creator><creator>Wang, Tse-Yen</creator><creator>Chen, Yu-Ta</creator><general>Springer Berlin Heidelberg</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><orcidid>https://orcid.org/0000-0002-3537-5828</orcidid></search><sort><creationdate>20180901</creationdate><title>Novel system for simultaneously measuring the thickness and refractive index of a transparent plate with two optical paths</title><author>Liu, Chien-Sheng ; Wang, Tse-Yen ; Chen, Yu-Ta</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c316t-60d83e0d31aaff28e27acbc423d22f729458e697c763f5907e51079b34856f1e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Applied physics</topic><topic>Engineering</topic><topic>Lasers</topic><topic>Measurement methods</topic><topic>Microscopes</topic><topic>Optical Devices</topic><topic>Optical paths</topic><topic>Optics</topic><topic>Performance indices</topic><topic>Photonics</topic><topic>Physical Chemistry</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Plates (structural members)</topic><topic>Quantum Optics</topic><topic>Refractivity</topic><topic>Thickness measurement</topic><topic>Triangulation</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Liu, Chien-Sheng</creatorcontrib><creatorcontrib>Wang, Tse-Yen</creatorcontrib><creatorcontrib>Chen, Yu-Ta</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics. B, Lasers and optics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Liu, Chien-Sheng</au><au>Wang, Tse-Yen</au><au>Chen, Yu-Ta</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Novel system for simultaneously measuring the thickness and refractive index of a transparent plate with two optical paths</atitle><jtitle>Applied physics. B, Lasers and optics</jtitle><stitle>Appl. Phys. B</stitle><date>2018-09-01</date><risdate>2018</risdate><volume>124</volume><issue>9</issue><spage>1</spage><epage>10</epage><pages>1-10</pages><artnum>180</artnum><issn>0946-2171</issn><eissn>1432-0649</eissn><abstract>This study designs and characterizes a novel optical system for simultaneously measuring the thickness (> 1 mm) and refractive index of a transparent plate with two optical paths. The proposed optical system is based on triangulation methods. In contrast to exiting optical system based on triangulation methods for simultaneous measurements of thickness and refractive index of a transparent plate, the proposed optical system can measure a greater thickness with a simpler structure and lower cost. The two optical paths are combined using a self-written measurement processing algorithm to simultaneously calculate the thickness and refractive index. The principle and measurement methodology of the proposed optical system are analyzed and explained. The performance of the proposed optical system is then verified and evaluated experimentally using a laboratory-built prototype. The experimental results show that the measured thicknesses and refractive indexes for Sample B (the thickness > 1 mm) are in good agreement with those determined by a commercial instrument with the maximum deviation of 0.019% for the thickness
d
and 0.007% for the refractive index
n
, respectively.</abstract><cop>Berlin/Heidelberg</cop><pub>Springer Berlin Heidelberg</pub><doi>10.1007/s00340-018-7052-4</doi><tpages>10</tpages><orcidid>https://orcid.org/0000-0002-3537-5828</orcidid></addata></record> |
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| ispartof | Applied physics. B, Lasers and optics, 2018-09, Vol.124 (9), p.1-10, Article 180 |
| issn | 0946-2171 1432-0649 |
| language | eng |
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| source | SpringerLink Journals - AutoHoldings |
| subjects | Applied physics Engineering Lasers Measurement methods Microscopes Optical Devices Optical paths Optics Performance indices Photonics Physical Chemistry Physics Physics and Astronomy Plates (structural members) Quantum Optics Refractivity Thickness measurement Triangulation |
| title | Novel system for simultaneously measuring the thickness and refractive index of a transparent plate with two optical paths |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-05T00%3A52%3A36IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Novel%20system%20for%20simultaneously%20measuring%20the%20thickness%20and%20refractive%20index%20of%20a%20transparent%20plate%20with%20two%20optical%20paths&rft.jtitle=Applied%20physics.%20B,%20Lasers%20and%20optics&rft.au=Liu,%20Chien-Sheng&rft.date=2018-09-01&rft.volume=124&rft.issue=9&rft.spage=1&rft.epage=10&rft.pages=1-10&rft.artnum=180&rft.issn=0946-2171&rft.eissn=1432-0649&rft_id=info:doi/10.1007/s00340-018-7052-4&rft_dat=%3Cproquest_cross%3E2097639448%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2097639448&rft_id=info:pmid/&rfr_iscdi=true |