The origin and properties of the wetting layer and early evolution of epitaxially strained thin films

We showed that a wetting layer in epitaxially strained thin films which decreases with increasing lattice mismatch strain arises due to the variation of nonlinear elastic free energy with film thickness. We calculated how and at what thickness a flat film becomes unstable to perturbations of varying...

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Veröffentlicht in:	arXiv.org 2002-01
1. Verfasser:	Helen R Eisenberg Daniel Kandel
Format:	Artikel
Sprache:	eng
Schlagworte:	Anisotropy Epitaxial growth Evolution Film growth Film thickness Free energy Scaling Strain Surface tension Thin films Wetting
Online-Zugang:	Volltext
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