Photon-assisted electron-hole shot noise in multi-terminal conductors
Motivated by a recent experiment by L.-H. Reydellet et al., Phys. Rev. Lett. 90, 176803 (2003), we discuss an interpretation of photon-assisted shot noise in mesoscopic multiprobe conductors in terms of electron-hole pair excitations. AC-voltages are applied to the contacts of the sample. Of interes...
Gespeichert in:
Veröffentlicht in: | arXiv.org 2005-10 |
---|---|
Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | arXiv.org |
container_volume | |
creator | Rychkov, Valentin S Polianski, M L Buttiker, M |
description | Motivated by a recent experiment by L.-H. Reydellet et al., Phys. Rev. Lett. 90, 176803 (2003), we discuss an interpretation of photon-assisted shot noise in mesoscopic multiprobe conductors in terms of electron-hole pair excitations. AC-voltages are applied to the contacts of the sample. Of interest are correlations resulting from the fact that electrons and holes are generated in pairs. We show that with two out-of-phase ac-potentials of equal magnitude and frequency, applied to different contacts, it is possible to trace out the Hanbury Brown Twiss exchange interference correlations in a four probe conductor. We calculate the distribution of Hanbury Brown Twiss phases for a four-probe single channel chaotic dot. |
doi_str_mv | 10.48550/arxiv.0507276 |
format | Article |
fullrecord | <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_journals_2091099481</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2091099481</sourcerecordid><originalsourceid>FETCH-proquest_journals_20910994813</originalsourceid><addsrcrecordid>eNqNi70KwjAURoMgWLSrc8A59TZt-jNLxdHBXUIbaUqaaG4iPr4dfACnD845HyH7HLKyEQKO0n_0OwMBNa-rFUl4UeSsKTnfkBRxAgBe1VyIIiHddXTBWSYRNQY1UGVUH_xCRmcUxcVS6zQqqi2dowmaBeVnbaWhvbND7IPzuCPrhzSo0t9uyeHc3U4X9vTuFRWG--SiXz5459Dm0LZlkxf_VV9ZPEFe</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2091099481</pqid></control><display><type>article</type><title>Photon-assisted electron-hole shot noise in multi-terminal conductors</title><source>Free E- Journals</source><creator>Rychkov, Valentin S ; Polianski, M L ; Buttiker, M</creator><creatorcontrib>Rychkov, Valentin S ; Polianski, M L ; Buttiker, M</creatorcontrib><description>Motivated by a recent experiment by L.-H. Reydellet et al., Phys. Rev. Lett. 90, 176803 (2003), we discuss an interpretation of photon-assisted shot noise in mesoscopic multiprobe conductors in terms of electron-hole pair excitations. AC-voltages are applied to the contacts of the sample. Of interest are correlations resulting from the fact that electrons and holes are generated in pairs. We show that with two out-of-phase ac-potentials of equal magnitude and frequency, applied to different contacts, it is possible to trace out the Hanbury Brown Twiss exchange interference correlations in a four probe conductor. We calculate the distribution of Hanbury Brown Twiss phases for a four-probe single channel chaotic dot.</description><identifier>EISSN: 2331-8422</identifier><identifier>DOI: 10.48550/arxiv.0507276</identifier><language>eng</language><publisher>Ithaca: Cornell University Library, arXiv.org</publisher><subject>Conductors ; Holes (electron deficiencies) ; Shot noise</subject><ispartof>arXiv.org, 2005-10</ispartof><rights>Notwithstanding the ProQuest Terms and conditions, you may use this content in accordance with the associated terms available at http://arxiv.org/abs/cond-mat/0507276.</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>776,780,27904</link.rule.ids></links><search><creatorcontrib>Rychkov, Valentin S</creatorcontrib><creatorcontrib>Polianski, M L</creatorcontrib><creatorcontrib>Buttiker, M</creatorcontrib><title>Photon-assisted electron-hole shot noise in multi-terminal conductors</title><title>arXiv.org</title><description>Motivated by a recent experiment by L.-H. Reydellet et al., Phys. Rev. Lett. 90, 176803 (2003), we discuss an interpretation of photon-assisted shot noise in mesoscopic multiprobe conductors in terms of electron-hole pair excitations. AC-voltages are applied to the contacts of the sample. Of interest are correlations resulting from the fact that electrons and holes are generated in pairs. We show that with two out-of-phase ac-potentials of equal magnitude and frequency, applied to different contacts, it is possible to trace out the Hanbury Brown Twiss exchange interference correlations in a four probe conductor. We calculate the distribution of Hanbury Brown Twiss phases for a four-probe single channel chaotic dot.</description><subject>Conductors</subject><subject>Holes (electron deficiencies)</subject><subject>Shot noise</subject><issn>2331-8422</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNqNi70KwjAURoMgWLSrc8A59TZt-jNLxdHBXUIbaUqaaG4iPr4dfACnD845HyH7HLKyEQKO0n_0OwMBNa-rFUl4UeSsKTnfkBRxAgBe1VyIIiHddXTBWSYRNQY1UGVUH_xCRmcUxcVS6zQqqi2dowmaBeVnbaWhvbND7IPzuCPrhzSo0t9uyeHc3U4X9vTuFRWG--SiXz5459Dm0LZlkxf_VV9ZPEFe</recordid><startdate>20051028</startdate><enddate>20051028</enddate><creator>Rychkov, Valentin S</creator><creator>Polianski, M L</creator><creator>Buttiker, M</creator><general>Cornell University Library, arXiv.org</general><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>L6V</scope><scope>M7S</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope></search><sort><creationdate>20051028</creationdate><title>Photon-assisted electron-hole shot noise in multi-terminal conductors</title><author>Rychkov, Valentin S ; Polianski, M L ; Buttiker, M</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-proquest_journals_20910994813</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Conductors</topic><topic>Holes (electron deficiencies)</topic><topic>Shot noise</topic><toplevel>online_resources</toplevel><creatorcontrib>Rychkov, Valentin S</creatorcontrib><creatorcontrib>Polianski, M L</creatorcontrib><creatorcontrib>Buttiker, M</creatorcontrib><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Engineering Collection</collection><collection>Engineering Database</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Rychkov, Valentin S</au><au>Polianski, M L</au><au>Buttiker, M</au><format>book</format><genre>document</genre><ristype>GEN</ristype><atitle>Photon-assisted electron-hole shot noise in multi-terminal conductors</atitle><jtitle>arXiv.org</jtitle><date>2005-10-28</date><risdate>2005</risdate><eissn>2331-8422</eissn><abstract>Motivated by a recent experiment by L.-H. Reydellet et al., Phys. Rev. Lett. 90, 176803 (2003), we discuss an interpretation of photon-assisted shot noise in mesoscopic multiprobe conductors in terms of electron-hole pair excitations. AC-voltages are applied to the contacts of the sample. Of interest are correlations resulting from the fact that electrons and holes are generated in pairs. We show that with two out-of-phase ac-potentials of equal magnitude and frequency, applied to different contacts, it is possible to trace out the Hanbury Brown Twiss exchange interference correlations in a four probe conductor. We calculate the distribution of Hanbury Brown Twiss phases for a four-probe single channel chaotic dot.</abstract><cop>Ithaca</cop><pub>Cornell University Library, arXiv.org</pub><doi>10.48550/arxiv.0507276</doi><oa>free_for_read</oa></addata></record> |
fulltext | fulltext |
identifier | EISSN: 2331-8422 |
ispartof | arXiv.org, 2005-10 |
issn | 2331-8422 |
language | eng |
recordid | cdi_proquest_journals_2091099481 |
source | Free E- Journals |
subjects | Conductors Holes (electron deficiencies) Shot noise |
title | Photon-assisted electron-hole shot noise in multi-terminal conductors |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-25T01%3A14%3A26IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=document&rft.atitle=Photon-assisted%20electron-hole%20shot%20noise%20in%20multi-terminal%20conductors&rft.jtitle=arXiv.org&rft.au=Rychkov,%20Valentin%20S&rft.date=2005-10-28&rft.eissn=2331-8422&rft_id=info:doi/10.48550/arxiv.0507276&rft_dat=%3Cproquest%3E2091099481%3C/proquest%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2091099481&rft_id=info:pmid/&rfr_iscdi=true |