Structural, morphological, optical and gas sensing properties of pure and Ce doped SnO2 thin films prepared by jet nebulizer spray pyrolysis (JNSP) technique
Pure and cerium (Ce) doped tin oxide (SnO 2 ) thin films are prepared on glass substrates by jet nebulizer spray pyrolysis technique at 450 °C. The synthesized films are characterized by X-ray diffraction (XRD), scanning electron microscopy, energy dispersive analysis X-ray, ultra violet visible spe...
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| Veröffentlicht in: | Journal of materials science. Materials in electronics 2017-03, Vol.28 (6), p.4577-4585 |
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| creator | Sankar, C. Ponnuswamy, V. Manickam, M. Suresh, R. Mariappan, R. Vinod, P. S. |
| description | Pure and cerium (Ce) doped tin oxide (SnO
2
) thin films are prepared on glass substrates by jet nebulizer spray pyrolysis technique at 450 °C. The synthesized films are characterized by X-ray diffraction (XRD), scanning electron microscopy, energy dispersive analysis X-ray, ultra violet visible spectrometer (UV–Vis) and stylus profilometer. Crystalline structure, crystallite size, lattice parameters, texture coefficient and stacking fault of the SnO
2
thin films have been determined using X-ray diffractometer. The XRD results indicate that the films are grown with (110) plane preferred orientation. The surface morphology, elemental analysis and film thickness of the SnO
2
films are analyzed and discussed. Optical band gap energy are calculated with transmittance data obtained from UV–Visible spectra. Optical characterization reveals that the band gap energy is found decreased from 3.49 to 2.68 eV. Pure and Ce doped SnO
2
thin film gas sensors are fabricated and their gas sensing properties are tested for various gases maintained at different temperature between 150 and 250 °C. The 10 wt% Ce doped SnO
2
sensor shows good selectivity towards ethanol (at operating temperature 250 °C). The influence of Ce concentration and operating temperature on the sensor performance is discussed. The better sensing ability for ethanol is observed compared with methanol, acetone, ammonia, and 2-methoxy ethanol gases. |
| doi_str_mv | 10.1007/s10854-016-6094-9 |
| format | Article |
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2
) thin films are prepared on glass substrates by jet nebulizer spray pyrolysis technique at 450 °C. The synthesized films are characterized by X-ray diffraction (XRD), scanning electron microscopy, energy dispersive analysis X-ray, ultra violet visible spectrometer (UV–Vis) and stylus profilometer. Crystalline structure, crystallite size, lattice parameters, texture coefficient and stacking fault of the SnO
2
thin films have been determined using X-ray diffractometer. The XRD results indicate that the films are grown with (110) plane preferred orientation. The surface morphology, elemental analysis and film thickness of the SnO
2
films are analyzed and discussed. Optical band gap energy are calculated with transmittance data obtained from UV–Visible spectra. Optical characterization reveals that the band gap energy is found decreased from 3.49 to 2.68 eV. Pure and Ce doped SnO
2
thin film gas sensors are fabricated and their gas sensing properties are tested for various gases maintained at different temperature between 150 and 250 °C. The 10 wt% Ce doped SnO
2
sensor shows good selectivity towards ethanol (at operating temperature 250 °C). The influence of Ce concentration and operating temperature on the sensor performance is discussed. The better sensing ability for ethanol is observed compared with methanol, acetone, ammonia, and 2-methoxy ethanol gases.</description><identifier>ISSN: 0957-4522</identifier><identifier>EISSN: 1573-482X</identifier><identifier>DOI: 10.1007/s10854-016-6094-9</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Acetone ; Ammonia ; Band gap ; Cerium ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Detection ; Energy gap ; Ethanol ; Film thickness ; Gas sensors ; Gases ; Glass substrates ; Lattice parameters ; Materials Science ; Mathematical analysis ; Morphology ; Operating temperature ; Optical and Electronic Materials ; Optical properties ; Preferred orientation ; Scanning electron microscopy ; Spray pyrolysis ; Stacking faults ; Styli ; Thin films ; Tin dioxide ; Tin oxides ; X-ray diffraction</subject><ispartof>Journal of materials science. Materials in electronics, 2017-03, Vol.28 (6), p.4577-4585</ispartof><rights>Springer Science+Business Media New York 2016</rights><rights>Journal of Materials Science: Materials in Electronics is a copyright of Springer, (2016). All Rights Reserved.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c353t-53dec9ecbafc3a6e3d821cec8f1ee070303454ff961405b8584cb8a7bea1fd0d3</citedby><cites>FETCH-LOGICAL-c353t-53dec9ecbafc3a6e3d821cec8f1ee070303454ff961405b8584cb8a7bea1fd0d3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10854-016-6094-9$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10854-016-6094-9$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27901,27902,41464,42533,51294</link.rule.ids></links><search><creatorcontrib>Sankar, C.</creatorcontrib><creatorcontrib>Ponnuswamy, V.</creatorcontrib><creatorcontrib>Manickam, M.</creatorcontrib><creatorcontrib>Suresh, R.</creatorcontrib><creatorcontrib>Mariappan, R.</creatorcontrib><creatorcontrib>Vinod, P. S.</creatorcontrib><title>Structural, morphological, optical and gas sensing properties of pure and Ce doped SnO2 thin films prepared by jet nebulizer spray pyrolysis (JNSP) technique</title><title>Journal of materials science. Materials in electronics</title><addtitle>J Mater Sci: Mater Electron</addtitle><description>Pure and cerium (Ce) doped tin oxide (SnO
2
) thin films are prepared on glass substrates by jet nebulizer spray pyrolysis technique at 450 °C. The synthesized films are characterized by X-ray diffraction (XRD), scanning electron microscopy, energy dispersive analysis X-ray, ultra violet visible spectrometer (UV–Vis) and stylus profilometer. Crystalline structure, crystallite size, lattice parameters, texture coefficient and stacking fault of the SnO
2
thin films have been determined using X-ray diffractometer. The XRD results indicate that the films are grown with (110) plane preferred orientation. The surface morphology, elemental analysis and film thickness of the SnO
2
films are analyzed and discussed. Optical band gap energy are calculated with transmittance data obtained from UV–Visible spectra. Optical characterization reveals that the band gap energy is found decreased from 3.49 to 2.68 eV. Pure and Ce doped SnO
2
thin film gas sensors are fabricated and their gas sensing properties are tested for various gases maintained at different temperature between 150 and 250 °C. The 10 wt% Ce doped SnO
2
sensor shows good selectivity towards ethanol (at operating temperature 250 °C). The influence of Ce concentration and operating temperature on the sensor performance is discussed. The better sensing ability for ethanol is observed compared with methanol, acetone, ammonia, and 2-methoxy ethanol gases.</description><subject>Acetone</subject><subject>Ammonia</subject><subject>Band gap</subject><subject>Cerium</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Detection</subject><subject>Energy gap</subject><subject>Ethanol</subject><subject>Film thickness</subject><subject>Gas sensors</subject><subject>Gases</subject><subject>Glass substrates</subject><subject>Lattice parameters</subject><subject>Materials Science</subject><subject>Mathematical analysis</subject><subject>Morphology</subject><subject>Operating temperature</subject><subject>Optical and Electronic Materials</subject><subject>Optical properties</subject><subject>Preferred orientation</subject><subject>Scanning electron microscopy</subject><subject>Spray pyrolysis</subject><subject>Stacking faults</subject><subject>Styli</subject><subject>Thin films</subject><subject>Tin dioxide</subject><subject>Tin oxides</subject><subject>X-ray diffraction</subject><issn>0957-4522</issn><issn>1573-482X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><sourceid>BENPR</sourceid><recordid>eNp1UU2LFDEQDeKC464_wFuBFwXbTTpJfxxl8JNlVxgFbyGdrsxk6OnEJH1o_4v_1YwjePJUVdR79aj3CHnO6BtGaXubGO2kqChrqob2ouofkQ2TLa9EV39_TDa0l20lZF0_IU9TOlJKG8G7Dfm1y3ExeYl6eg0nH8PBT37vzHn0IZ8b0PMIe50g4ZzcvIcQfcCYHSbwFsIS8Q9kizCWxQi7-aGGfHAzWDedUsFj0LEshhWOmGHGYZncT4yQQtQrhDX6aU0uwcvP97svryCjOczux4I35MrqKeGzv_WafHv_7uv2Y3X38OHT9u1dZbjkuZJ8RNOjGbQ1XDfIx65mBk1nGSJtKadcSGFt3zBB5dDJTpih0-2AmtmRjvyavLjcLa8V2ZTV0S9xLpKqLr42bbGyKSh2QZnoU4poVYjupOOqGFXnFNQlBVVSUOcUVF849YVTXi3eYfx3-f-k3wqCja0</recordid><startdate>20170301</startdate><enddate>20170301</enddate><creator>Sankar, C.</creator><creator>Ponnuswamy, V.</creator><creator>Manickam, M.</creator><creator>Suresh, R.</creator><creator>Mariappan, R.</creator><creator>Vinod, P. S.</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>F28</scope><scope>FR3</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>KB.</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>S0W</scope></search><sort><creationdate>20170301</creationdate><title>Structural, morphological, optical and gas sensing properties of pure and Ce doped SnO2 thin films prepared by jet nebulizer spray pyrolysis (JNSP) technique</title><author>Sankar, C. ; Ponnuswamy, V. ; Manickam, M. ; Suresh, R. ; Mariappan, R. ; Vinod, P. S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c353t-53dec9ecbafc3a6e3d821cec8f1ee070303454ff961405b8584cb8a7bea1fd0d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Acetone</topic><topic>Ammonia</topic><topic>Band gap</topic><topic>Cerium</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Detection</topic><topic>Energy gap</topic><topic>Ethanol</topic><topic>Film thickness</topic><topic>Gas sensors</topic><topic>Gases</topic><topic>Glass substrates</topic><topic>Lattice parameters</topic><topic>Materials Science</topic><topic>Mathematical analysis</topic><topic>Morphology</topic><topic>Operating temperature</topic><topic>Optical and Electronic Materials</topic><topic>Optical properties</topic><topic>Preferred orientation</topic><topic>Scanning electron microscopy</topic><topic>Spray pyrolysis</topic><topic>Stacking faults</topic><topic>Styli</topic><topic>Thin films</topic><topic>Tin dioxide</topic><topic>Tin oxides</topic><topic>X-ray diffraction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Sankar, C.</creatorcontrib><creatorcontrib>Ponnuswamy, V.</creatorcontrib><creatorcontrib>Manickam, M.</creatorcontrib><creatorcontrib>Suresh, R.</creatorcontrib><creatorcontrib>Mariappan, R.</creatorcontrib><creatorcontrib>Vinod, P. 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Materials in electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Sankar, C.</au><au>Ponnuswamy, V.</au><au>Manickam, M.</au><au>Suresh, R.</au><au>Mariappan, R.</au><au>Vinod, P. S.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Structural, morphological, optical and gas sensing properties of pure and Ce doped SnO2 thin films prepared by jet nebulizer spray pyrolysis (JNSP) technique</atitle><jtitle>Journal of materials science. Materials in electronics</jtitle><stitle>J Mater Sci: Mater Electron</stitle><date>2017-03-01</date><risdate>2017</risdate><volume>28</volume><issue>6</issue><spage>4577</spage><epage>4585</epage><pages>4577-4585</pages><issn>0957-4522</issn><eissn>1573-482X</eissn><abstract>Pure and cerium (Ce) doped tin oxide (SnO
2
) thin films are prepared on glass substrates by jet nebulizer spray pyrolysis technique at 450 °C. The synthesized films are characterized by X-ray diffraction (XRD), scanning electron microscopy, energy dispersive analysis X-ray, ultra violet visible spectrometer (UV–Vis) and stylus profilometer. Crystalline structure, crystallite size, lattice parameters, texture coefficient and stacking fault of the SnO
2
thin films have been determined using X-ray diffractometer. The XRD results indicate that the films are grown with (110) plane preferred orientation. The surface morphology, elemental analysis and film thickness of the SnO
2
films are analyzed and discussed. Optical band gap energy are calculated with transmittance data obtained from UV–Visible spectra. Optical characterization reveals that the band gap energy is found decreased from 3.49 to 2.68 eV. Pure and Ce doped SnO
2
thin film gas sensors are fabricated and their gas sensing properties are tested for various gases maintained at different temperature between 150 and 250 °C. The 10 wt% Ce doped SnO
2
sensor shows good selectivity towards ethanol (at operating temperature 250 °C). The influence of Ce concentration and operating temperature on the sensor performance is discussed. The better sensing ability for ethanol is observed compared with methanol, acetone, ammonia, and 2-methoxy ethanol gases.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10854-016-6094-9</doi><tpages>9</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0957-4522 |
| ispartof | Journal of materials science. Materials in electronics, 2017-03, Vol.28 (6), p.4577-4585 |
| issn | 0957-4522 1573-482X |
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| source | SpringerLink Journals |
| subjects | Acetone Ammonia Band gap Cerium Characterization and Evaluation of Materials Chemistry and Materials Science Detection Energy gap Ethanol Film thickness Gas sensors Gases Glass substrates Lattice parameters Materials Science Mathematical analysis Morphology Operating temperature Optical and Electronic Materials Optical properties Preferred orientation Scanning electron microscopy Spray pyrolysis Stacking faults Styli Thin films Tin dioxide Tin oxides X-ray diffraction |
| title | Structural, morphological, optical and gas sensing properties of pure and Ce doped SnO2 thin films prepared by jet nebulizer spray pyrolysis (JNSP) technique |
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